Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Electronics Telecommunications

Displaying records 91 to 100 of 353 records.
Resort by: Date / Title


91. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Electronics & Telecommunications
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

92. In Situ Gas Phase Measurements During Metal Alkylamide Atomic Layer Deposition
Topic: Electronics & Telecommunications
Published: 7/12/2011
Authors: James E Maslar, William Andrew Kimes, Brent A Sperling
Abstract: Metal alkylamide compounds, such as tetrakis(ethylmethylamido) hafnium (TEMAH), represent a technologically important class of metalorganic precursors for the deposition of metal oxides and metal nitrides via atomic layer deposition (ALD) or chemical ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908672

93. Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon
Topic: Electronics & Telecommunications
Published: 6/28/2011
Authors: Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John Henry j Scott
Abstract: In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908006

94. PDH-locked, frequency-stabilized cavity ring-down spectrometer
Topic: Electronics & Telecommunications
Published: 6/16/2011
Authors: Joseph Terence Hodges, A. Cygan, Piotr Maslowski, Katarzyna Ewelina Bielska, S. Wojtewicz, J. Domyslawska, H Abe, R.S. Trawinski, R. Ciurylo
Abstract: We describe a high sensitivity and high spectral resolution laser absorption spectrometer based upon the frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) technique. We used the Pound-Drever-Hall (PDH) method to lock the probe laser to th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907960

95. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Electronics & Telecommunications
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

96. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Electronics & Telecommunications
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

97. Fluid interactions with metafilm/metasurfaces for tuning, sensing, and microwave assisted chemical processes
Topic: Electronics & Telecommunications
Published: 5/25/2011
Authors: Joshua A Gordon, Christopher L Holloway, James C Booth, James R. Baker-Jarvis, David R Novotny, Sung Kim, Yu Y. Wang
Abstract: In this paper we demonstrate tunability of a metafilm, which is the two-dimensional equivalent of a metamaterial, also referred to as a metasurface, by changing the permittivity in a micro-fluidic channel that interacts with the metafilm. Numerical s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907703

98. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Electronics & Telecommunications
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

99. Flip Chip Lamination to electrically contact organic single crystals on flexible substrates
Topic: Electronics & Telecommunications
Published: 4/20/2011
Authors: Oana Jurchescu, Brad Conrad, Christina Ann Hacker, David J Gundlach, Curt A Richter
Abstract: The fabrication of top metal contacts for organic electronics represents a challenge and has important consequences for electrical properties of such systems. We report a low cost and non-destructive printing process, Flip Chip Lamination (FCL), to f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907524

100. Reduced Flammability of Polyurethane Foam Using a Carbon Nanofiber-based Multilayer Nanocoating
Topic: Electronics & Telecommunications
Published: 4/10/2011
Authors: Yeon Seok Kim, Rick D Davis, Jaime C. Grunlan, Amanda A Cain
Abstract: For the first time, Layer-by-layer (LbL) assemblies made with carbon nanofiber (CNFs) are shown to improve the fire performance of polyurethane foam. The (359 ± 36) nm thick four bilayer coating of polyethyleneimine/CNF (cationic layer) and poly(ac ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906819



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series