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You searched on: Topic Area: Electronics Telecommunications

Displaying records 91 to 100 of 325 records.
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Topic: Electronics & Telecommunications
Published: 7/30/2010
Authors: Dazhen Gu, Amanda Cox, Derek Anderson Houtz, David K Walker, James Paul Randa, Robert L. Billinger
Abstract: We report the characterization of blackbody reflections as a part of the recent progress on the development of brightness standards for microwave remote sensing at National Institute of Standards and Technology (NIST).Three blackbody targets at varia ...

92. COMPARISON OF NEAR-FIELD METHODS AT NIST K. MacReynolds, M.H. Francis and D. Tamura
Topic: Electronics & Telecommunications
Published: 7/14/2010
Authors: Katherine MacReynolds, Michael H Francis, Douglas T. Tamura
Abstract: A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band Cassegrain reflector antenna. This paper discusses the measurement results for the ...

93. Calibration service for instruments that measure laser beam diameter
Series: Special Publication (NIST SP)
Report Number: 250-87
Topic: Electronics & Telecommunications
Published: 7/1/2010
Author: Shao Yang
Abstract: This document describes the calibration service for instruments that measure laser beam diameter. An overview of the measurement procedures, measurement system, and uncertainty analysis is presented. A sample measurement report is included in this do ...

94. Automated Parameter Extraction Software for Silicon and High-Voltage Silicon Carbide Power Diodes
Topic: Electronics & Telecommunications
Published: 6/24/2010
Authors: Nanying Yang, Tam Hoang Duong, Jeong-O Jeong, Jose Miguel Ortiz, Allen R Hefner Jr., Kathleen Meehan
Abstract: This paper presents an automated parameter extraction software tool developed for constructing Silicon (Si) and Silicon Carbide (SiC) power diode models, which is called DIode Model Parameter extrACtion Tools (DIMPACT). This software tool extracts th ...

95. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Electronics & Telecommunications
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan

96. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Topic: Electronics & Telecommunications
Published: 6/7/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan

97. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Electronics & Telecommunications
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker

98. Dual-rate linear optical sampling for remote monitoring of complex modulation formats
Topic: Electronics & Telecommunications
Published: 6/2/2010
Authors: Tasshi Dennis, Paul A Williams
Abstract: We demonstrate linear optical sampling using simultaneous pulsed and CW local oscillators to enable phase tracking of a data modulated carrier. The technique enables the direct measurement of remotely received signals with low phase noise.

99. A Low Complexity Interference Cancellation Technique for Multi-User DS-CDMA Communications
Topic: Electronics & Telecommunications
Published: 5/27/2010
Authors: Wen-Bin Yang, Kamran Sayrafian
Abstract: A low complexity Parallel Interference Cancellation (PIC) technique is proposed to suppress Multi-Access Interference (MAI) and minimize near-far effect for multi-user communication using Direct-Sequence Code Division Multiple Access (DS-CDMA). Inter ...

100. A Design Framework for High-Density Wireless Ad Hoc Networks Achieving Cooperative Diversity
Topic: Electronics & Telecommunications
Published: 5/24/2010
Authors: Hamid Gharavi, Bin Hu
Abstract: In this paper, we present a systematic design structure for high-density ad hoc networks aimed at achieving full cooperative diversity, based on which the PHY, MAC and Network layers of the system are specifically tailored. For the latter in particul ...

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Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series