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You searched on: Topic Area: Electronics Telecommunications

Displaying records 91 to 100 of 338 records.
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91. Effects of shape distortions and imperfections on mode frequencies and collective linewidths in nanomagnets
Topic: Electronics & Telecommunications
Published: 3/28/2011
Authors: Hans Toya Nembach, Justin M Shaw, Thomas J Silva, Ward L Johnson, Sudook A. Kim, Robert D McMichael, Pavel Kabos
Abstract: We used Brillouin light scattering to show that shape distortions in Ni80Fe20 nanoelements can have a dramatic effect on the measured linewidth of certain modes. By intentionally introducing an amount of ,egg-likeŠ shape distortion to an ideal ellip ...

92. Nanoelectronics Lithography
Topic: Electronics & Telecommunications
Published: 3/1/2011
Authors: Stephen Knight, Vivek M Prabhu, John H Burnett, James Alexander Liddle, Christopher Soles, Alain C. Diebold
Abstract: This is a compiled chapter that will be included into the Handbook of Nanophysics.

93. A Comparison of Methods for Computing the Residual Resistivity Ratio of High-Purity Niobium
Topic: Electronics & Telecommunications
Published: 2/17/2011
Authors: Jolene D Splett, Dominic F. (Dominic F.) Vecchia, Loren Frederick Goodrich
Abstract: We compare methods for estimating the residual resistivity ratio (RRR) of high-purity niobium samples and investigate the effects of using different functional models on the final value. RRR is typically defined as the ratio of the electrical resista ...

94. Optical performance monitoring of (Q)PSK data channels using artificial neural networks trained with parameters derived from delay-tap asynchronous diagrams
Topic: Electronics & Telecommunications
Published: 2/15/2011
Authors: Jeffrey A Jargon, Xiaoxia Wu, Alan Willner, Loukas Paraschis
Abstract: We demonstrate a technique of using artificial neural networks trained with parameters derived from delay-tap asynchronous diagrams for optical performance monitoring of phase shift keying (PSK) data signals. We show that asynchronous diagrams from b ...

95. Analysis of Three Different Regression Models to Estimate the Ballistic Performance of New and Environmentally Conditioned Body Armor
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 7760
Topic: Electronics & Telecommunications
Published: 2/14/2011
Authors: Diane Mauchant, Michael A Riley, Kirk D Rice, Amanda Lattam Forster, Dennis D Leber, Daniel Victor Samarov
Abstract: The performance standard for ballistic-resistant body armor published by the National Institute of Justice (NIJ), NIJ Standard 0101.06, recommends estimating the perforation performance of body armor by performing a statistical analysis on V50 bal ...

96. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Electronics & Telecommunications
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter

97. GMPs: The Other Pieces of The Puzzle
Topic: Electronics & Telecommunications
Published: 1/1/2011
Authors: Melissa Meaney Phillips, Catherine A Rimmer, Laura J Wood, Paula Brown

98. Recommendation for Password-Based Key Derivation Part I: Storage Applications
Series: Special Publication (NIST SP)
Report Number: 800-132
Topic: Electronics & Telecommunications
Published: 12/22/2010
Authors: Meltem Sonmez Turan, Elaine B Barker, William Edward Burr, Lidong Chen
Abstract: This Recommendation specifies techniques for the derivation of master keys from passwords or passphrases to protect stored electronic data or data protection keys.

99. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Electronics & Telecommunications
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...

100. Conductive Carbon Nanotubes for Semiconductor Metrology
Topic: Electronics & Telecommunications
Published: 8/10/2010
Authors: Joseph J Kopanski, Victor H. Vartanian, Vladimir Mancevski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...

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  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
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