NIST logo

Publications Portal

You searched on:
Topic Area: Electron Physics

Displaying records 71 to 80 of 98 records.
Resort by: Date / Title


71. Third-Order Asymptotic Aberration Coefficients of Electron Lenses. III. Formulas and results for the two-tube electrostatic lens
Topic: Electron Physics
Published: 10/1/1974
Authors: C Kuyatt, D DiChio, S Natali
Abstract: The third-order asymptotic aberration coefficients of round electrostatic electron lenses are formulated, following Hawkes, in a form independent of object and aperture positions. Six quantities are sufficient to specify completely the third-order a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620063

72. Apparent Oscillator Strength Distributions Derived from Electron Energy-Loss Measurements: Methane and n-Hexane
Topic: Electron Physics
Published: 7/24/1974
Authors: R Huebner, C H Fergurson, Robert Celotta, S Mielczarek
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620068

73. Electron Impact Energy Loss Spectra of the 1^u2^B^d2^ - XA^d1^ Transition of NO^d2^
Topic: Electron Physics
Published: 7/15/1974
Authors: Morris Krauss, Robert Celotta, S Mielczarek, C Kuyatt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620062

74. Attenuation Lengths of Low-Energy Electrons in Solids
Topic: Electron Physics
Published: 7/1/1974
Author: Cedric John Powell
Abstract: ^u^ A compilation is presented of measured attenuation lengths of low-energy electrons in solids in the energy range (40 to 2000 eV) normally employed in X-ray photoelectron and Auger-electron spectroscopy. The techniques used to obtain electron atte ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620061

75. Introduction to Electron and Ion Optics
Topic: Electron Physics
Published: 7/1/1974
Author: P Dahl
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620060

76. Focal Properties of the Two-Tube Electrostatic Lens for Large and Near-Unity Voltage Ratios
Topic: Electron Physics
Published: 4/1/1974
Authors: D DiChio, S Natali, C Kuyatt
Abstract: Accurate calculations of focal properties of the two-tube electrostatic lens are extended to cover a range of voltage ratios from 1.1 to 10000. The accuracy of the calculations is discussed in detail. For voltage ratios near 6400 the lens is found t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620059

77. Use of Matrices to Represent Electron Lenses. Matrices for the Two-Tube Electrostatic Lens
Topic: Electron Physics
Published: 4/1/1974
Authors: D DiChio, S Natali, C Kuyatt, A Galejs
Abstract: The use of matrices to represent electron lenses is discussed. It is shown that it is more convenient and natural to represent a lens by a matrix and that the matrix elements show a more regular behavior than do the focal properties. Thus matrices a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620058

78. Determination of Electron Attenuation Lengths in Metals: Transmission Through Thin Adsorbed Films
Topic: Electron Physics
Published: 3/1/1974
Authors: M Sunjic, D Sokcevic, John William Gadzuk
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620070

79. Electron Energy Loss Spectrum of Ozone
Topic: Electron Physics
Published: 2/1/1974
Authors: Robert Celotta, S Mielczarek, C Kuyatt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620053

80. Apparent Oscillator Strengths for Molecular Oxygen
Topic: Electron Physics
Published: 1/1/1974
Authors: R Huebner, Robert Celotta, S Mielczarek, C Kuyatt
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=620087



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series