NIST logo

Publications Portal

You searched on: Topic Area: Condensed Matter Physics

Displaying records 31 to 40 of 44 records.
Resort by: Date / Title


31. Band Structure of ABC-Stacked Graphene Trilayers
Topic: Condensed Matter Physics
Published: 7/9/2010
Authors: Fan Zhang, Bhagawan Sahu, Hongki Min, Allan H. MacDonald
Abstract: The ABC-stacked N-layer-graphene family of two-dimensional electron systems is described at low energies by two remarkably flat bands with Bloch states that have strongly momentum-dependent phase differences between carbon \pi-orbital amplitudes on ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905348

32. Effects of disorder and internal dynamics on vortex wall propagation
Topic: Condensed Matter Physics
Published: 5/26/2010
Authors: Hongki Min, Robert D McMichael, Michael J Donahue, Jacques Miltat, Mark D Stiles
Abstract: Experimental measurements of domain wall propagation are typically interpreted by comparison to ideal models that ignore the effects of extrinsic disorder and the internal dynamics of domain wall structures. Using micromagnetic simulations we study v ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904963

33. Interference of Single Photons from Two Separate Semiconductor Quantum Dots
Topic: Condensed Matter Physics
Published: 4/1/2010
Authors: Edward B. (Edward) Flagg, Andreas Muller, Sergey V Polyakov, Alexander E. Ling, Glenn Scott Solomon
Abstract: We demonstrate and characterize interference between discrete photons emitted by two separate semiconductor quantum dot states in different samples excited by a pulsed laser. Their energies are tuned into resonance using strain. The photons hav ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904921

34. Characterization of Soluble Anthradithiophene Derivatives
Topic: Condensed Matter Physics
Published: 3/18/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, John E Anthony, David J Gundlach
Abstract: We will discuss the growth and electrical measurements of a newly developed, partially fluorinated anthradithiophene (F-ADT) derivative with tert-butyldiphenylsilyl (TBDMS) side groups. Single crystals of the material can be readily grown and device ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905386

35. Spin-transfer dynamics in spin valves with out-of-plane magnetized CoNi free layers
Topic: Condensed Matter Physics
Published: 1/29/2010
Authors: William H Rippard, Alina M Deac, Matthew R Pufall, Justin M Shaw, Mark W Keller, Stephen E Russek, Gerrit E Bauer, Claudio Serpico
Abstract: We have measured spin-transfer-induced dynamics in magnetic nanocontact devices having a perpendicularly magnetized Co/Ni free layer and an in-plane magnetized CoFe fixed layer. The frequencies and powers of the excitations agree well with the predic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903981

36. Effects of magnetism and electric field on the energy gap of bilayer graphene nanoflakes
Topic: Condensed Matter Physics
Published: 1/13/2010
Author: Hongki Min
Abstract: We study the effect of magnetism and perpendicular external electric field strengths on the energy gap of length confined bilayer graphene nanoribbons (or nanobars) using a first principles density functional electronic structure method and a semi-lo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903804

37. Electrical Characterization of Soluble Anthradithiophene Derivatives
Topic: Condensed Matter Physics
Published: 11/19/2009
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, John E Anthony, David J Gundlach
Abstract: Organic semiconductors remain an active subject for device physics and material science because of their varied electrical properties and potential for low-cost, high-throughput roll-to-roll processing. Several high-mobility oligomers, such as pen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905388

38. Origin of Universal Optical Conductivity and Optical Stacking Sequence Identification in Multilayer Graphene
Topic: Condensed Matter Physics
Published: 8/6/2009
Authors: Hongki Min, Allan H. MacDonald
Abstract: We predict that the optical conductivity of normal graphene multilayers is close to {sigma}^duni^=({pi}/2) e^u2^/h per layer over a broad range of frequencies. The origin of this behavior is an emergent chiral symmetry which is present in normal N-l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902107

39. The-Final-State Symmetry of Na 1s Core-shell Excitons in NaCl and NaF
Topic: Condensed Matter Physics
Published: 7/8/2009
Authors: Eric L Shirley, K. P. Nagle, G T Seidler, T. T. Fister, J. A. Bradley, F. C. Brown
Abstract: We report measurements of the Na 1s contribution to the nonresonant inelastic x-ray scattering (NRIXS) from NaCl and NaF. Prior x-ray absorption studies have observed two pre-edge excitons in both materials. The momentum transfer-dependence (q-depe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901581

40. Josephson phase qubit circuit for the evaluation of advanced tunnel barrier materials
Topic: Condensed Matter Physics
Published: 11/21/2008
Authors: Jeffrey S. Kline, Haohua Wang, Seongshik Oh, John M Martinis, David P Pappas
Abstract: We have found that crystalline Josephson junctions have critical current density control problems which decrease circuit yield. We present a qubit circuit designed to accommodate a factor-of-five variation in critical current density for the evaluati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33165



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series