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Displaying records 781 to 789.
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781. Petroleum Analysis: Methodology for the Quantitative and Qualitative Assessment of an Oil Spill
Topic: Chemistry
Published: 12/1/1976
Authors: Harry S Hertz, Willie E May, S. N. Chesler, B.H. Gump
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901255

782. Drop Sampler for Obtaining Fresh and Sea Water Samples for Organic Compound Analysis
Topic: Chemistry
Published: 12/1/1975
Authors: B.H. Gump, Harry S Hertz, Willie E May, S. N. Chesler, S.M. Dyszel, D.P. Enagonio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901253

783. Chromatographic Analysis of Hydrocarbons in Marine Sediments and Sea Water
Topic: Chemistry
Published: 11/1/1975
Authors: Willie E May, S. N. Chesler, S.P. Cram, B.H. Gump, Harry S Hertz, D.P. Enagonio, S.M. Dyszel
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901254

784. Catalyst-free GaN Nanowires as Nanoscale Light Emitters
Topic: Chemistry
Published: Date unknown
Authors: Kristine A Bertness, Norman A Sanford, John B Schlager, Alexana Roshko, Todd E Harvey, Paul Timothy Blanchard, Matthew David Brubaker, Andrew M. Herrero, Aric Warner Sanders
Abstract: Catalyst-free growth of GaN nanowires with molecular beam epitaxy produces material of exceptionally high quality with long minority carrier lifetimes and low surface recombination velocity. The nanowires grow by thermodynamic driving forces that enh ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910889

785. Characterization of Standard Reference Material 2942, Ce-Ion-Doped Glass, Spectral Correction Standard for UV Fluorescence
Topic: Chemistry
Published: Date unknown
Authors: Paul C DeRose, Melody V Smith, Klaus Mielenz, Jeffrey R. Anderson, Gary W Kramer
Abstract: Standard Reference Material (SRM) 2942 is a cuvette-shaped, Ce-ion-doped glass, recommended for use for relative spectral correction of emission and day-to-day performance verification of steady-state fluorescence spectrometers. Properties of this st ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906188

786. Development of Multicolor Flow Cytometry Standards: Assignment of Equivalent Reference Fluorophores (ERF) Unit
Series: Journal of Research (NIST JRES)
Topic: Chemistry
Published: Date unknown
Authors: Lili Wang, Adolfas Kastytis Gaigalas
Abstract: A procedure is described for assigning values of the number of equivalent reference fluorophores (ERF) to microspheres labeled with a fluorophore designed to produce fluorescence in a given channel of a multicolor flow cytometer. There is a different ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906632

787. Impact Energy Dependence of SF^d5^^u+^ Ion Beam Damage of Poly(Methyl Methacrylate) Studied by Time-of-Flight Secondary Ion Mass Spectrometry
Topic: Chemistry
Published: Date unknown
Authors: M S. Wagner, John G Gillen
Abstract: Recent advances in instrumentation for Secondary Ion Mass Spectrometry (SIMS) have focused on the application of polyatomic primary ions for enhancing molecular secondary ion signals of organic materials. A few studies have also noted that some polym ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831310

788. Improvements in the Winkler Titration for Iodide in Iodized Salt
Topic: Chemistry
Published: Date unknown
Authors: Kenneth W Pratt, Karen E Murphy
Abstract: A bromine gas generator, based on bleach, potassium bromide and dilute hydrochloric acid, replaces hazardous pure bromine used in the classical Winkler titration for iodide. This modification eliminates the need to store or use pure bromine. The ga ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914125

789. Measurement of the Electrostatic Edge Effect in Wurtzite GaN Nanowires
Topic: Chemistry
Published: Date unknown
Authors: Alex Henning, Benjamin Klein, Kristine A Bertness, Paul Timothy Blanchard, Norman A Sanford, Yossi Rosenwaks
Abstract: The electrostatic effect of the hexagonal corner on the electronic structure in wurtzite GaN nanowires (NWs) was directly measured using Kelvin probe force microscopy (KPFM). By correlating electrostatic simulations with the measured potential differ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917310



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