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931. Anisotropic Microstructure Development During the Reaction of Mg With GaAs
Topic: Chemistry
Published: 2/18/1998
Author: Steven W Robey
Abstract: Reaction of Mg with GaAs (001) surface occurs at substrate temperatures above 250 K and leads to 3D growth of an epitaxial, cubic reaction phase with a lattice constant of 0.62 + 0.02nm, 9% larger than GaAs. The resulting anistotropic, 3-demiensiona ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831066

932. Environmental Scanning Electron Microscopy Measurements Compared with the Low Vacuum Model
Topic: Chemistry
Published: 2/18/1998
Author: Scott A Wight
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901829

933. Imaging Benzene Molecules and Phenyl Radicals on Cu{111}
Topic: Chemistry
Published: 2/18/1998
Authors: P S Weiss, M M Kamma, Stephan J Stranick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901828

934. Interfacial Reaction Effects in the Growth of MgO on GaAs(001) by Reactive MBE
Topic: Chemistry
Published: 2/18/1998
Author: Steven W Robey
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901805

935. The Analysis of Particles with Energy Dispersive X-Ray Spectrometry (EDS)
Topic: Chemistry
Published: 2/18/1998
Authors: John A Small, J T. Armstrong, David S. Bright, Barbara B. Thorne
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901819

936. Carbon Nanotube Tipped Atomic Force Microscopy for Measurement of <100nm Etch Morphology on Semiconductors
Topic: Chemistry
Published: 2/17/1998
Authors: G Nagy, M Levy, R Scarmozzino, R M Osgood, H Dai, R E Smalley, Chris A Michaels, G W Flynn, G F McLane
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901790

937. Compositional Mapping by Scanning Electron Microscopy with Energy Dispersive X-Ray Spectrometry: Recognizing Facts and Artifacts
Topic: Chemistry
Published: 2/17/1998
Authors: Dale E Newbury, David S. Bright
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901794

938. Energy Calibration of X-Ray Photoelectron Spectrometers: Location of the Zero Point on the Binding Energy Scale
Topic: Chemistry
Published: 2/17/1998
Authors: A C Miller, Cedric John Powell, U Gelius, C R Anderson
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901788

939. Extracting Low Energy X-Ray Peaks from EDS and WDS Spectra
Topic: Chemistry
Published: 2/17/1998
Authors: Robert L. Myklebust, Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901789

940. Standardless Analysis by Electron-Exited Energy Dispersive X-Ray Spectrometry: What is its Proper Role?
Topic: Chemistry
Published: 2/17/1998
Author: Dale E Newbury
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901792