NIST logo

Publications Portal

You searched on:
Topic Area: Chemistry

Your search results exceeded 1,000 records. Please refine your search and try again.
Displaying records 901 to 910 of 1000 records.
Resort by: Date / Title


901. Critical Locus of Aqueous Solutions of Sodium Chloride
Topic: Chemistry
Published: 9/1/1999
Authors: A A Povodyrev, M A Anisimov, J V Sengers, W L Marshall, Jan Vincent Sengers
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100747

902. Graphical Tools for RFLP Measurement Quality Assurance: Laboratory Performance Charts
Topic: Chemistry
Published: 9/1/1999
Authors: David Lee Duewer, K T. Gary, D J Reeder
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100785

903. Graphical Tools for RFLP Measurement Quality Assurance: Single-Locus Charts
Topic: Chemistry
Published: 9/1/1999
Authors: David Lee Duewer, H-K L Liu, D J Reeder
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100581

904. Separation of Carotenoid Isomers by Capillary Electrochromatography with C^d30^ Stationary Phases
Topic: Chemistry
Published: 8/15/1999
Authors: Lane C Sander, M. Pursch, B. Marker, Stephen A Wise
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100820

905. Influence of Secondary Tip Shape on Illumination-Mode Near-Field Scanning Optical Microscopy Images
Topic: Chemistry
Published: 8/1/1999
Authors: Lee J Richter, C EJ Dentinger, Richard R Cavanagh, Garnett W Bryant, A Liu, Stephan J Stranick, C D Keating, M J Natan
Abstract: We report illumination-mode near-field optical microscopy images of individual 80-115 nm diameter Au particles recorded with metal-coated fiber probes. It is found that the images are strongly influenced by the metal-coating thickness. This depend ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831088

906. SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry
Topic: Chemistry
Published: 8/1/1999
Authors: Robert A Fletcher, Jennifer R Verkouteren, Eric S Windsor, David S. Bright, Eric B Steel, John A Small, Walter S Liggett Jr
Abstract: Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831080

907. Si Resonant Interband Tunnel Diodes Grown by Low-Temperature Molecular Beam Epitaxy
Topic: Chemistry
Published: 8/1/1999
Authors: P E Thompson, K D Hobart, M E Twigg, G Jernigan, T E Dillon, S L Rommel, P R Berger, David S Simons, P Chi, R Lake, A C Seabaugh
Abstract: Si resonant interband tunnel diodes that demonstrate negative differential resistance at room temperature are presented. The structures were grown using low temperature (320 C) molecular beam epitaxy followed by a post-growth anneal. After a 650 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831118

908. What Do We Need to Look Out for When Doing Energy Dispersive X-Ray Analysis in the Environmental Scanning Electron Microscope?
Topic: Chemistry
Published: 8/1/1999
Author: Scott A Wight
Abstract: Electron scattering in the environmental scanning electron microscope may contribute x-ray contamination to quantitative analysis. A series of experiments explores at what range and conditions the analyst in the real world needs to be concerned about ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831119

909. An Ultra-Small-Angle Neutron Scattering Study of the Restructuring of Sheared Colloidal Silica Gels
Topic: Chemistry
Published: 7/5/1999
Authors: Chris D Muzny, B D. Butler, H J Hanley, M Agamalian
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100736

910. Sampling Accessories for Infrared Spectrometry
Topic: Chemistry
Published: 7/1/1999
Author: Thomas J Bruno
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100672



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series