NIST logo

Publications Portal

You searched on: Topic Area: Nanostructured Materials Sorted by: date

Displaying records 11 to 20 of 27 records.
Resort by: Date / Title


11. Resonant Microwave Absorption in Thermally Deposited Au Nanoparticle Films Near Percolation Coverage
Topic: Nanostructured Materials
Published: 6/19/2013
Authors: Jan Obrzut, Jack F Douglas, Oleg A Kirillov, Fred Sharifi, James Alexander Liddle
Abstract: We observe a resonant transition in microwave absorption in thin thermally deposited Au nanoparticle films near the geometrical percolation transition pc where the films exhibit a ,fractal‰ heterogeneous geometry. The absorption of incident microwa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912786

12. ,Real-worldŠ precision, bias, and between-laboratory variation for surface area measurement of a titanium dioxide nanomaterial in powder form
Topic: Nanostructured Materials
Published: 6/1/2013
Authors: Vincent A Hackley, Aleksandr B. Stefaniak
Abstract: Accurate characterization of nanomaterial properties is a critical component of any nanotoxicology testing strategy. Data that describes the performance of various laboratories to measure the characteristics of the same nanomaterial is scarce. We c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912937

13. Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters
Topic: Nanostructured Materials
Published: 5/6/2013
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912337

14. Tin Oxide Nanowire Sensor with Integrated Temperature and Gate Control for Multi-Gas Recognition
Topic: Nanostructured Materials
Published: 3/7/2012
Authors: Eric N. (Eric) Dattoli, Albert Davydov, Kurt D Benkstein
Abstract: The selectivity of a chemiresistive gas sensor comprising an aligned array of single-crystalline tin oxide nanowires (NWs) is shown to be greatly enhanced by combined temperature and gate voltage modulation. This dual modulation was effected by utili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909477

15. Development of stabilized zero valent iron nanoparticles
Topic: Nanostructured Materials
Published: 1/31/2012
Authors: Lauren F. Greenlee, Stephanie A Hooker
Abstract: Many organic micropollutants have recently been identified in natural water sources and finished drinking water; many of these compounds are not successfully degraded or removed by current water treatment processes. There is an increasing interes ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906269

16. Effect of AlN Buffer Layer Properties on the Morphology and Polarity of GaN Nanowires Grown by Molecular Beam Epitaxy
Topic: Nanostructured Materials
Published: 9/8/2011
Authors: Matthew David Brubaker, Kristine A Bertness, Norman A Sanford, Albert Davydov, Igor Levin, Devin M. Rourke, Victor M. Bright
Abstract: Low temperature AlN buffer layers grown by plasma-assisted Molecular Beam Epitaxy (MBE) on Si (111) were found to significantly affect the subsequent growth morphology of GaN nanowires. The AlN buffer layers exhibited nanowire-like columnar protrusi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908715

17. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Nanostructured Materials
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

18. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Nanostructured Materials
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

19. Revealing the Interphase in Polymer Nanocomposites
Topic: Nanostructured Materials
Published: 3/16/2011
Authors: Mauro Zammarano, Paul Hutsell Maupin, Li Piin Sung, Jeffrey W Gilman, Douglas Matthew Fox
Abstract: Morphological characterization of polymer nanocomposites is a fundamental challenge that is complicated by multiple length scales. Here, we report a technique for high-throughput monitoring of interphase and dispersion in polymer nanocomposites based ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906284

20. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Nanostructured Materials
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series