NIST logo

Publications Portal

You searched on:
Topic Area: Nanofluidics

Displaying records 11 to 20 of 30 records.
Resort by: Date / Title


11. Three Dimensional Nanofluidic Metrology
Topic: Nanofluidics
Published: 3/17/2011
Author: Samuel M Stavis
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908358

12. Simultaneous Positioning and Orientation of a Single Nano-object by Flow Control: theory and simulations
Topic: Nanofluidics
Published: 1/19/2011
Authors: Pramod Pappachan Mathai, Andrew J. Berglund, James Alexander Liddle, Benjamin Shapiro
Abstract: In this paper we describe a method to simultaneously control both the position and orientation of single nano-objects in fluids by precisely controlling the flow around them. We develop and simulate a control law that uses electro-osmotic flow (EO ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905367

13. Entropophoresis of Single Biomolecules Down a Nanofluidic Staircase
Topic: Nanofluidics
Published: 1/11/2011
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Michael Gaitan, Laurie E Locascio
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908403

14. The Forms and Functions of Complex Nanofluidic Surfaces
Topic: Nanofluidics
Published: 9/14/2010
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Laurie E Locascio, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907053

15. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofluidics
Published: 9/13/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907080

16. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Nanofluidics
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904215

17. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofluidics
Published: 8/1/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907056

18. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofluidics
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

19. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Topic: Nanofluidics
Published: 6/7/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907081

20. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion"
Topic: Nanofluidics
Published: 6/6/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907057



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series