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Topic Area: Nanofabrication, Nanomanufacturing, and Nanoprocessing

Displaying records 41 to 50 of 105 records.
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41. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908430

42. Nanofabrication Techniques for Controlled Drug Released Devices
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 1/1/2011
Authors: Lei Chen, Gerard Henein, Vincent K Luciani
Abstract: New drugs and delivery systems have undergone a rapid development in recent years for treating cancer, HIV aids, diseased organs, damaged nerves to relieve pain, prevent disease and restore health to human beings. The application of nanofabrication i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907280

43. Effect of resist on the transfer of line-edge roughness spatial metrics from mask to wafer
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 11/11/2010
Authors: Patrick P Naulleau, Gregg M. Gallatin
Abstract: Mask contributors to line-edge roughness (LER) have recently been shown to be an issue of concern for both the accuracy of current resist evaluation tests as well the ultimate LER requirements for the 22 nm production node. More recently, it has been ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905544

44. The Forms and Functions of Complex Nanofluidic Surfaces
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 9/14/2010
Authors: Samuel M Stavis, Elizabeth A Strychalski, Jon C Geist, Laurie E Locascio, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907053

45. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 9/13/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907080

46. Quantum Dots Precisely Placed by Controlled Flow
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 8/24/2010
Author: James Alexander Liddle
Abstract: Ropp et al. report on the use of controlled flow to achieve nanometer precision placement of single quantum dots.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906621

47. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904215

48. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 8/1/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907056

49. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

50. Dark pulse quantum dot diode laser
Topic: Nanofabrication, Nanomanufacturing, and Nanoprocessing
Published: 6/7/2010
Authors: Mingming M. Feng, Kevin Lawrence Silverman, Richard P Mirin, Steven T Cundiff
Abstract: We describe an operating regime for passively mode-locked quantum dot diode laser where the output consists of a train of dark pulses, i.e., intensity dips on a continuous background. We show that a dark pulse train is a solution to the master equati ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907918



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