NIST logo

Publications Portal

You searched on:
Topic Area: Nanoelectronics and Nanoscale Electronics
Sorted by: title

Displaying records 11 to 20 of 135 records.
Resort by: Date / Title


11. Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/21/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Christina Ann Hacker, Jan Obrzut, Lee J Richter, Curt A Richter
Abstract: In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908435

12. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Topic: Nanoelectronics and Nanoscale Electronics
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32683

13. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854

14. Controlled Encapsulation of a Hydrophilic Drug Simulant in Nano-Liposomes Using Continuous Flow Microfluidics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/4/2008
Authors: Andreas Jahn, Joseph Earl Reiner, Wyatt N Vreeland, Don DeVoe, Laurie E Locascio, Michael Gaitan
Abstract: A new method to tailor the size and size distribution of nanometer scale liposomes and control loading of liposomes with a model drug in a continuous-flow microfluidic design is presented. Size and size dispersion are determined with tandem Asymmetr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32987

15. Correlation Between Microstructure, Electronic Properties and Ficker Noise in Organic Thin Film Transistors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/31/2008
Authors: Oana Jurchescu, Behrang H Hamadani, Hao Xiong, Sungkyu Park, Sankar Subramanian, Neil M Zimmerman, John E Anthony, Thomas Jackson, David J Gundlach
Abstract: We report on observations of a direct correlation between the microstructure of the organic thin films and their electronic properties when incorporated in field-effect transistors. We present a simple method to induce enhanced grain growth in soluti ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32777

16. Coulomb Blockade of Andreev Reflection in the NSN Single Electron Transistor
Topic: Nanoelectronics and Nanoscale Electronics
Published: 2/1/1994
Authors: Travis M. Eiles, Michel H. Devoret, John M. Martinis
Abstract: We have measured at low temperatures the current through a submicrometer superconducting island connected to nornal metal leads by ultrasmall tunnel junctions. At low bias voltages, the current changes from being e-periodic in the applied gate change ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30780

17. DC SQUID Series Arrays with Intracoil Damping to Reduce Resonance Distortions
Topic: Nanoelectronics and Nanoscale Electronics
Published: 12/31/1997
Authors: Martin Huber, A. M. Corey, K. L. Lumpkins, F. N. Nafe, J. Rantschler, Gene C Hilton, John M. Martinis, A. H. Steinbach
Abstract: We report on low-noise DC SQUID series arrays incorporating intracoil damping, which show smooth DC characteristics. The voltage-flux characteristics of these devices are reproducible upon repeated cooling and do not require multiple heating/cooling ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=31381

18. DESIGN OF TEST STRUCTURE FOR 3D-STACKED INTEGRATED CIRCUITS (3D-SICS) METROLOGY
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/25/2014
Authors: Lin You, Jungjoon Ahn, Joseph J Kopanski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914744

19. Design, Fabrication, and Characterization of High-Performance Silicon Nanowire Transistors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 8/1/2008
Authors: Qiliang Li, Xiaoxiao Zhu, Yang Yang, D. E Ioannou, Hao Xiong, John S Suehle, Curt A Richter
Abstract: We report the fabrication and characterization of double-gated Si nanowire field effect transistors with excellent current-voltage characteristics, low subthreshold slope ~ 85 mV/dec and high on/off current ratio ~ 10^6. The Si nanowire devices a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33199

20. Development of Arrays of TES X-ray Detectors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 12/1/2000
Authors: Steven Deiker, J. A. Chervenak, Gene C Hilton, Martin Huber, Kent D Irwin, John M. Martinis, Sae Woo Nam, David A Wollman
Abstract: Both the x-ray astrophysics and microanalysis communities have a need for large format arrays of high-spectral-resolution x-ray detectors. To meet this need, we are transferring our successful single pixel Transition Edge Sensor (TES) x-ray microcalo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=30772



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series