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Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 71 to 80 of 139 records.
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71. Flexible Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 12/3/2009
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Behrang H Hamadani, David J Gundlach, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905412

72. Fabrication with Flip-Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 11/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907071

73. Metrology to Enable Emerging Nanoelectronics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 11/4/2009
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907127

74. Nanoelectronic Devices and Measurement Science
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/20/2009
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907129

75. Fabrication with Flip-Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907072

76. Temperature dependence of spin-torque-driven self-oscillators
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/15/2009
Authors: William H Rippard, Matthew R Pufall, Thomas Cecil, Thomas J Silva, Stephen E Russek, M. L. Schneider
Abstract: We have measured the temperature dependence of spin-torque-driven self-oscillations in point-contact nanooscillators for both in-plane and out-of-plane applied fields. We find that the linewidth for both field geometries is qualitatively similar. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902997

77. Application of ALD High-k Dielectric Films as Charge Storage Layer and Blocking Oxide in Nonvolatile Memories
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/6/2009
Authors: Xiaoxiao Zhu, H Gu, Qiliang Li, Helmut Baumgart, D. E Ioannou, John S Suehle, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907139

78. Towards Low-Noise Flexible Electronics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/6/2009
Authors: Oana Jurchescu, Hao Xiong, D A Mourey, D Zhao, J Sun, Curt A Richter, John E Anthony, Thomas Jackson, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907142

79. Advanced Capacitance Metrology for Nanoelectronic Device Characterization
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/5/2009
Authors: Curt A Richter, Joseph J Kopanski, Yicheng Wang, Muhammad Yaqub Afridi, Xiaoxiao Zhu, D. E Ioannou, Qiliang Li, Chong Jiang
Abstract: We designed and fabricated a test chip (consisting of an array of metal-oxide-semiconductor (MOS) capacitors and metal-insulator-metal (MIM) capacitors ranging from 0.3 fF to 1.2 pF) for use in evaluating the performance of new measurement approaches ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903268

80. Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/5/2009
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904357



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