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Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 51 to 60 of 136 records.
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51. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

52. Flexible Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/28/2010
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905414

53. Temperature dependence of adiabatic spin transfer torque and current polarization in Ni80Fe20 by spin wave Doppler measurements
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/23/2010
Authors: Meng Zhu, Cindi L Dennis, Robert D McMichael
Abstract: A spin wave Doppler technique is used to measure the temperature dependence of both the magnetization drift velocity and the current polarization in current-carrying Ni^d80^Fe^d20^ wires. For current densities of 10^u11^ A/m2, we obtain magnetizatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904177

54. Characterization of TiO2 Memristors on Flexible Substrates
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/19/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906390

55. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067

56. A Flexible Solution-Processed Memristor
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/14/2010
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905413

57. Challenges and Opportunities of Organic Electronics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

58. Epitaxial Graphenes on Silicon Carbide
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/1/2010
Authors: Joseph A Stroscio, Walt A. de Heer, Phillip First, Claire Berger, Thomas Seyller, Jeong-Sun Moon
Abstract: The materials science of graphene grown epitaxially on the hexagonal basal planes of SiC crystals is reviewed. We show that the growth of epitaxial graphene on Si-terminated SiC is much different than growth on the C-terminated SiC surface, and discu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904592

59. Organic Electronics: Challenges and Opportunities
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

60. Structural analysis of multilayer graphene via atomic moiré interferometry
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/24/2010
Authors: David L. Miller, Kevin Kubista, Gregory M. Rutter, Ming Ruan, Walt A. de Heer, Phillip First, Joseph A Stroscio
Abstract: The rotation of stacked honeycomb lattices produces an observable moir e pattern in the topography of scanning tunneling microscopy images, which have long been observed in highly-oriented pyrolytic graphite due to rotation of the surface layer relat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904601



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