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You searched on: Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 51 to 60 of 142 records.
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51. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/21/2010
Authors: Qin Q. Zhang, Y Lu, Huili Xing, Curt A Richter, Steven J Koester, S O Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907136

52. Edge structure of epitaxial graphene islands
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/7/2010
Authors: Gregory M. Rutter, N Guisinger, Jason Crain, Phillip N. First, Joseph A Stroscio
Abstract: Graphene islands grown epitaxially on 6H-SiC(0001) were studied using scanning tunneling microscopy and spectroscopy. Under specific growth conditions, {approzimately equal}10 nm single-layer graphene islands are observed on top of the SiC buffer lay ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903584

53. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

54. Metrology to Support Innovation in Nanoelectronics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/20/2010
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907133

55. Metrology of Molecular Devices made by Flip Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

56. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391

57. Flexible Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/28/2010
Authors: Nadine Emily Gergel-Hackett, Laurie A. Stephey, Barbara Dunlap, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905414

58. Temperature dependence of adiabatic spin transfer torque and current polarization in Ni80Fe20 by spin wave Doppler measurements
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/23/2010
Authors: Meng Zhu, Cindi L Dennis, Robert D McMichael
Abstract: A spin wave Doppler technique is used to measure the temperature dependence of both the magnetization drift velocity and the current polarization in current-carrying Ni^d80^Fe^d20^ wires. For current densities of 10^u11^ A/m2, we obtain magnetizatio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904177

59. Characterization of TiO2 Memristors on Flexible Substrates
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/19/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906390

60. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067



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