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Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 41 to 50 of 135 records.
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41. Epitaxial Graphene Electronic Structure And Transport
Topic: Nanoelectronics and Nanoscale Electronics
Published: 9/2/2010
Authors: Joseph A Stroscio, Walt A. de Heer, Claire Berger, Xiaosong Wu, Yike Hu, Ming Ruan, Phillip First, Robert Haddon, Benjamin Piot, Clement Faugeras, Marek Potemski
Abstract: Since its inception in 2001, the science and technology of epitaxial graphene on hexagonal silicon carbide has matured into a major international effort and is poised to become the first carbon electronics platform. A historical perspective is pres ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905039

42. Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids
Topic: Nanoelectronics and Nanoscale Electronics
Published: 8/1/2010
Authors: Robert I. MacCuspie, Andrea M Elsen, Steve J Diamanti, Steve T Patton, Igor Altfeder, J. David Jacobs, Andrey A Voevodin, Richard A Vaia
Abstract: Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903692

43. Switching in Flexible Titanium Oxide Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

44. Probing Stress Effects in Single Crystal Organic Transistors by Scanning Kelvin Probe Microscopy
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/23/2010
Authors: LC Teague, Oana Jurchescu, Curt A Richter, Sankar Subramanian, John E Anthony, Thomas Jackson, David J Gundlach, James G. Kushmerick
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907141

45. Graphene Nanoribbon Schottky-barrier FETs for End-of-the-roadmap CMOS: Challenges and Opportunities
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/21/2010
Authors: Qin Zhang, Y Lu, Huili Xing, Curt A Richter, Steven J Koester, S O Koswatta
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907136

46. Edge structure of epitaxial graphene islands
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/7/2010
Authors: Gregory M. Rutter, N Guisinger, Jason Crain, Phillip N. First, Joseph A Stroscio
Abstract: Graphene islands grown epitaxially on 6H-SiC(0001) were studied using scanning tunneling microscopy and spectroscopy. Under specific growth conditions, {approzimately equal}10 nm single-layer graphene islands are observed on top of the SiC buffer lay ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903584

47. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

48. Metrology to Support Innovation in Nanoelectronics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/20/2010
Author: Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907133

49. Metrology of Molecular Devices made by Flip Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

50. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391



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