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You searched on: Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 31 to 40 of 42 records.
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31. Fabrication with Flip-Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 11/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907071

32. Fabrication with Flip-Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907072

33. Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/5/2009
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904357

34. Non-Hydrolytic Synthesis and Electronic Structure of Ligand-Capped CeO2- and CeOCl Nanocrystals
Topic: Nanoelectronics and Nanoscale Electronics
Published: 8/13/2009
Authors: Daniel A Fischer, S. Depner, K. Kort, Cherno Jaye, Sarbajit Banerjee
Abstract: A novel and versatile non-hydrolytic approach is developed for the synthesis of ligand-passivated CeO2-δ and CeOCl nanocrystals soluble in non-polar organic solvents based on the condensation of cerium alkoxides with cerium halides. The alkyl gr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902942

35. Origin of Universal Optical Conductivity and Optical Stacking Sequence Identification in Multilayer Graphene
Topic: Nanoelectronics and Nanoscale Electronics
Published: 8/6/2009
Authors: Hongki Min, Allan H. MacDonald
Abstract: We predict that the optical conductivity of normal graphene multilayers is close to {sigma}^duni^=({pi}/2) e^u2^/h per layer over a broad range of frequencies. The origin of this behavior is an emergent chiral symmetry which is present in normal N-l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902107

36. Uncertainty Analysis for Noise-Parameter Measurements at NIST
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/9/2009
Author: James Paul Randa
Abstract: The uncertainty analysis is presented for NIST measurements of noise parameters of amplifiers and transistors, in both connectorized (coaxial) and on-wafer environments. We treat both the X-parameters, which are based on the wave representation of t ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33026

37. Ultrasmooth Gold as a Top Metal Electrode for Molecular Electronic Devices
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/7/2009
Authors: Mariona Coll Bau, Christina Ann Hacker, Lauren H. Miller, Daniel R. Hines, E. C. Williams, Curt A Richter
Abstract: In the emerging area of molecular electronics, fabrication of reliable metallic contacts remains one of the most critical challenges. Nanotransfer printing (nTP) is an attractive low-cost non-destructive technique to provide contact to organic monola ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900902

38. Inducing analytical orthogonality in tungsten oxide-based microsensors using materials structure and dynamic temperature control
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/4/2009
Authors: Kurt D Benkstein, Baranidharan Raman, David L. Lahr, John E Bonevich, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902372

39. Line Width Roughness and Cross Sectional Measurements of Sub-50 nm Structures with CD-SAXS and CD-SEM
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/24/2008
Authors: Chengqing C. Wang, Ronald Leland Jones, Kwang-Woo Choi, Christopher L Soles, Eric K Lin, Wen-Li Wu, James S Clarke, John S Villarrubia, Benjamin Bunday
Abstract: Critical dimension small angle x-ray scattering (CD-SAXS) is a measurement platform which is capable of measuring the average cross section and sidewall roughness in patterns ranging from (10 to 500) nm in pitch with sub nm precision. These capabili ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853580

40. Ultraviolet Photoemission Spectra of Para-Phenylene-Ethynylene Thiols Chemisorbed on Gold
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/1/2008
Authors: Christopher D Zangmeister, Roger D van Zee, Steven W Robey, N E Gruhn, Yuxing Yao, J M Tour
Abstract: Photoemission spectra of para-phenylene-ethynylene thiols chemisorbed on gold have been measured. Four compounds were studied: 4,4'-bis(phenylethynyl)-benzenethiol, 4 (phenylethynyl)benzenethiol, 4-ethynylbenzenethiol, and benzenethiol. The spectra w ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=830991



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