Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 21 to 30 of 51 records.
Resort by: Date / Title


21. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/1/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
Abstract: Memristors were fabricated on flexible polyethylene terephthalate substrates consisting of an oxide film generated through hydrolysis of a spun-on sol-gel. X-ray photoelectron spectroscopy, spectroscopic ellipsometry, transmission electron microscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907805

22. Fabrication of silicon-based Molecular Electronic Structures Using Flip Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/19/2011
Authors: Christina Ann Hacker, Michael A Walsh, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908430

23. Calibrated nanoscale capacitance measurements using a scanning microwave microscope
Topic: Nanoelectronics and Nanoscale Electronics
Published: 11/2/2010
Authors: H P Hubner, M. Moertelmaier, Pavel Kabos, M. Fenner, C Rankl, Atif A. Imtiaz
Abstract: A scanning microwave microscope (SMM) for spatially resolved capacitance measurements in the attofarad-to-femtofarad regime is presented. The system is based on the combination of an atomic force microscope (AFM) and a performance network analyzer ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905191

24. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Nanoelectronics and Nanoscale Electronics
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854

25. Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids
Topic: Nanoelectronics and Nanoscale Electronics
Published: 8/1/2010
Authors: Robert I. MacCuspie, Andrea M Elsen, Steve J Diamanti, Steve T Patton, Igor Altfeder, J. David Jacobs, Andrey A Voevodin, Richard A Vaia
Abstract: Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903692

26. Switching in Flexible Titanium Oxide Memristors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

27. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Nanoelectronics and Nanoscale Electronics
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

28. Modeling and metrology of metallic nanowires with application to microwave interconnects
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/23/2010
Authors: Kichul Kim, Thomas M Wallis, Paul Rice, Chin J. Chiang, Atif A. Imtiaz, Pavel Kabos, Jintao Zhang
Abstract: Abstract: Broadband characterization of individual metallic nanowires for microwave interconnect applications is discussed. Circuit and method of moments (MoM) modeling are benchmarked using a set of coplanar waveguide (CPW) test devices with microw ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904615

29. Metrology of Molecular Devices made by Flip Chip Lamination
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/30/2010
Authors: Christina Ann Hacker, Mariona Coll Bau, Curt A Richter
Abstract: Scaling of conventional electronics has continued unabated to dimensions approaching fundamental physical limits. As technology continues to evolve there are increasing demands to identify alternate routes of performing electrical functions. One po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904896

30. Advanced Capacitance Metrology for Nanoscale Device Characterization
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/29/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906391



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series