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Topic Area: Nanoelectronics and Nanoscale Electronics

Displaying records 101 to 110 of 139 records.
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101. The Challenge of Measuring Defects in Nanoscale Dielectrics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 5/26/2008
Authors: Kin P Cheung, John S Suehle
Abstract: Defects in nanoscale gate dielectric of MOS devices can exchange charges with the substrate via quantum mechanical tunneling. This characteristic has been utilized in many measurement methods to measure the defects and its spatial distribution. In so ...

102. Measurements for the Reliability and Electrical Characterization of Semiconductor Nanowires
Topic: Nanoelectronics and Nanoscale Electronics
Published: 4/30/2008
Authors: Curt A Richter, Hao Xiong, Xiaoxiao Zhu, Wenyong Wang, Vincent M Stanford, Qiliang Li, D. E Ioannou, Woong-Ki Hong, Takhee Lee
Abstract: Nanoelectronic devices based upon self-assembled semiconductor nanowires are excellent research tools for investigating the behavior of structures with sub-lithographic features as well as a promising basis for future information processing technolog ...

103. Correlation Between Microstructure, Electronic Properties and Ficker Noise in Organic Thin Film Transistors
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/31/2008
Authors: Oana Jurchescu, Behrang H Hamadani, Hao Xiong, Sungkyu Park, Sankar Subramanian, Neil M Zimmerman, John E Anthony, Thomas Jackson, David J Gundlach
Abstract: We report on observations of a direct correlation between the microstructure of the organic thin films and their electronic properties when incorporated in field-effect transistors. We present a simple method to induce enhanced grain growth in soluti ...

104. Line Width Roughness and Cross Sectional Measurements of Sub-50 nm Structures with CD-SAXS and CD-SEM
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/24/2008
Authors: Chengqing C. Wang, Ronald Leland Jones, Kwang-Woo Choi, Christopher L Soles, Eric K Lin, Wen-Li Wu, James S Clarke, John S Villarrubia, Benjamin Bunday
Abstract: Critical dimension small angle x-ray scattering (CD-SAXS) is a measurement platform which is capable of measuring the average cross section and sidewall roughness in patterns ranging from (10 to 500) nm in pitch with sub nm precision. These capabili ...

105. Liposome-Templated Supramolecular Assembly of Responsive Alginate Nanogels
Topic: Nanoelectronics and Nanoscale Electronics
Published: 3/14/2008
Authors: Jennifer S. Hong, Wyatt N Vreeland, Silvia H. De Paoli Lacerda, Laurie E Locascio, Michael Gaitan, Srinivasa R. Raghavan
Abstract: Nanosized gel particles (nanogels) are of interest for a variety of applications, including controlled release of drugs and single-molecule encapsulation. Here, we employ the cores of nanoscale liposomes as reaction vessels to template the assembly o ...

106. Contact Induced Crystallinity for High Performance Soluble Acene-Based TFTs
Topic: Nanoelectronics and Nanoscale Electronics
Published: 2/17/2008
Authors: David J Gundlach, James Royer, Behrang H Hamadani, Lucile C. Teague, Andrew J Moad, Oana Jurchescu, Oleg A Kirillov, Lee J Richter, James G. Kushmerick, Curt A Richter, Sungkyu Park, Thomas Jackson, Sankar Subramanian, John E Anthony
Abstract: Organic electronics present a tremendous opportunity to significantly impact the functionality and pervasiveness of large-area electronics. However, the lack of low-temperature low-cost deposition and patterning techniques limits the potential for th ...

107. Preparation of Nanoparticles by Continuous-Flow Microfluidics
Topic: Nanoelectronics and Nanoscale Electronics
Published: 2/15/2008
Authors: Andreas Jahn, Joseph E. (Joseph E.) Reiner, Wyatt N Vreeland, Don DeVoe, Laurie E Locascio, Michael Gaitan
Abstract: We review a variety of micro- and nanoparticle formulations produced with microfluidic methods. A diverse variety of approaches to generate micro-scale and nano-scale particles have been reported. Here we emphasize the use of microfluidics, specifica ...

108. Probing molecules in integrated solid-state silicon junctions
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/12/2008
Authors: Wenyong Wang, Adina Scott, Nadine Emily Gergel-Hackett, Christina Ann Hacker, David Janes, Curt A Richter
Abstract: In this research work, we fabricate integrated Si-SAMs-metal devices using the ?soft? top metal deposition technique and probe their electronic properties with IETS characterizations. IETS confirmed the existence of molecular species in the device ar ...

109. In Situ Gas Phase Diagnostics for Hafnium Oxide Atomic Layer Deposition
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/1/2008
Authors: James E Maslar, Wilbur Scott Hurst, Donald R Burgess Jr, William Andrew Kimes, Nhan V Nguyen, Elizabeth F Moore, Joseph Terence Hodges
Abstract: Atomic layer deposition (ALD) is an important method for depositing the nanometer-scale, conformal high  dielectric layers required for many nanoelectronics applications.  In situ monitoring of ALD processes has the potential to yield insight ...

110. Ultraviolet Photoemission Spectra of Para-Phenylene-Ethynylene Thiols Chemisorbed on Gold
Topic: Nanoelectronics and Nanoscale Electronics
Published: 1/1/2008
Authors: Christopher D Zangmeister, Roger D van Zee, Steven W Robey, N E Gruhn, Yuxing Yao, J M Tour
Abstract: Photoemission spectra of para-phenylene-ethynylene thiols chemisorbed on gold have been measured. Four compounds were studied: 4,4'-bis(phenylethynyl)-benzenethiol, 4 (phenylethynyl)benzenethiol, 4-ethynylbenzenethiol, and benzenethiol. The spectra w ...

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