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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 31 to 40 of 122 records.
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31. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

32. Fabrication with Flip-Chip Lamination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907071

33. Fabrication with Flip-Chip Lamination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907072

34. First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/19/2009
Authors: Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
Abstract: This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and non-profit organizations on some of the critical issues pertaining to the development of s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902692

35. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Madelaine Herminia Hernandez, Andrew A Herzing, Lee J Richter, Christina Ann Hacker, Joseph J Kopanski, Jan Obrzut, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908437

36. Flexible Memristors: Fabrication and Characterization for Electronics Applications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Jan Obrzut, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908436

37. Flip Chip Lamination Approach to Fabricate Top Metal Contacts on Organic-based Devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: Flip Chip Lamination approach to fabricate top metal contacts on organic-based devices ; M.Coll, O.D. Jurchescu, N. Gergel-Hackett, C.A. Richter, C,A, Hacker, American Physical Society (APS), March 2010, Portland, OR, USA (oral)
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907069

38. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

39. Fractionation and Characterization of Gold Nanoparticles in Aqueous Solution: Asymmetric-Flow Field Flow Fractionation with MALS, DLS and UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/30/2010
Authors: Tae Joon Cho, Vincent A Hackley
Abstract: Asymmetrical-flow field flow fractionation (AFFF) separates constituents based on hydrodynamic size, and is emerging as a powerful tool for obtaining high-resolution information on the size, molecular weight, composition, and stability of nanoscale p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905979

40. General Analysis of Microwave Network Scattering Parameters for Characterization of Thin Film Material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2013
Author: Jan Obrzut
Abstract: A general solution of the linear passive microwave network is presented, for the characterization of thin film materials at high microwave frequencies. The mathematical formulas that correlate scattering parameters S11 and S21 with the distributed ci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910675



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