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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 31 to 40 of 145 records.
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31. Differentiation and characterization of isotopically modified silver nanoparticles in aqueous media using asymmetric-flow field flow fractionation coupled to optical detection and mass spectrometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/10/2012
Authors: Julien Claude Maurice Gigault, Vincent A Hackley
Abstract: The principal objective of this work was to develop and demonstrate a new methodology for silver nanoparticle (AgNP) detection and characterization based on asymmetric-flow field flow fractionation (A4F) coupled to multiple detectors and using stable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912174

32. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/12/2011
Authors: Ravikiran Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909226

33. Direct Measurement of Cantilever Spring Constants and Correction of Cantilever Irregularities Using an Instrumented Indenter
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/22/2007
Authors: Z C. Ying, Mark Reitsma, Richard Swift Gates
Abstract: A method is presented that allows direct measurement of a wide range of spring constants of cantilevers using an indentation instrument with an integrated optical microscope. An accuracy of better than 10% can be achieved for spring constants from 0 ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850970

34. Direct observation of nucleation and early stages of growth of GaN nanowires
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/15/2012
Authors: Rosa E. Diaz, Renu Sharma, Karalee Jarvis, Qinglei Zhang, Subhash Mahajan
Abstract: We report for the first time direct observations of the nucleation and early stages of growth of GaN nanowires. The nanowires were formed by exposing Au + Ga droplets to ammonia. The formation process was observed in situ, and controlled in real time ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906318

35. Disentangling the effects of polymer coatings on silver nanoparticle agglomeration, dissolution, and toxicity to determine mechanisms of nanotoxicity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/1/2012
Authors: Justin M Zook, Melissa Danielle Halter, Danielle Cleveland, Stephen E Long
Abstract: Silver nanoparticles (AgNPs) are frequently coated by a variety of polymers, which may affect various intertwined mechanisms of toxicity, including agglomeration and dissolution rate. Here, we measure how citrate, dextran, poly(ethylene glycol) (PEG ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908497

36. Dispersion Stability of Nanoparticles in Ecotoxicological Investigations: A Comparison of Different Techniques
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/26/2011
Authors: Ratna Tantra, Shingheng Jing, Siva Kaliyappan, Nicholas Walker, James Noble, Vincent A Hackley
Abstract: One of the main challenges in nanoecotoxicological investigations is in the selection of the most suitable measurement methods and protocols for nanoparticle characterisation. Several parameters have been identified as being important as they govern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906180

37. Dynamics and Free Energy of Polymers Partitioning into a Nanoscale Pore
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/1/1997
Authors: S. M. Bezrukov, I Vodyanoy, R A Brutyan, J. J. Kasianowicz
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=100220

38. ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/13/2009
Authors: Vincent A Hackley, Martin Fritts, James F Kelly, Anil K. Patri, Alan F. Rawle
Abstract: A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902370

39. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/18/2010
Authors: Ward L Johnson, Sudook A Kim, Roy Howard Geiss, Colm Flannery, Paul R Heyliger, Christopher L Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Abstract: Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903959

40. Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/14/2009
Authors: Gheorghe Stan, Sean King, Robert Francis Cook
Abstract: Correlated force and contact-resonance versus displacement responses have been resolved using load-dependent contact-resonance atomic force microscopy (AFM) to determine the elastic modulus of low-k dielectric thin films. The measurements consisted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902329