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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 31 to 40 of 199 records.
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31. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854

32. Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/9/2012
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Bin Ming, Michael T Postek
Abstract: The critical dimension atomic force microscope (CD-AFM), which is used as a reference instrument in lithography metrology, has been proposed as a supplemental instrument for contour measurement and verification. However, although data from CD-AFM is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910915

33. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2013
Authors: Ravikiran (Ravikiran) Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353

34. Determination of nanoparticle surface coatings and nanoparticle Purity using microscale thermogravimetric analysis analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2014
Authors: Elisabeth Mansfield, Christopher Michael Poling, Jenifer L. (Jenifer) Blacklock, Katherine M Tyner
Abstract: The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914528

35. Determining Nanoparticle Purity and the Presence of Nanoparticle Surface Coatings through Microscale TGA - Presentation at HiTemp2011
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2012
Author: Elisabeth Mansfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910862

36. Development of a conceptual framework for evaluation of nanomaterials release from nanocomposites: environmental and toxicological implications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/2/2014
Authors: Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin M Gorham, Tinh Nguyen, Alexander Orlov
Abstract: Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lackin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914575

37. Development of quantitative electric force microscopy for surface and subsurface characterization of nanostructures in polymeric coatings
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/1/2009
Author: Minhua Zhao
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902060

38. Dielectric Spectroscopy Investigation of Relaxation in C60-Polyisoprene Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/23/2009
Authors: Yifu Ding, Sebastian Pawlus, Alexei Sokolov, Jack F Douglas, Alamgir Karim, Christopher Soles
Abstract: We investigate the influence of adding C60 nanoparticles on the dielectric relaxation spectra of both unentangled and entangled polyisoprene (PIP). Relaxation modes corresponding to both segmental and chain relaxation were analyzed over a broad tempe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900194

39. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan Daniel Orloff, Jan Obrzut, Christian John Long, Thomas Fung Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

40. Differentiation and characterization of isotopically modified silver nanoparticles in aqueous media using asymmetric-flow field flow fractionation coupled to optical detection and mass spectrometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/10/2012
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: The principal objective of this work was to develop and demonstrate a new methodology for silver nanoparticle (AgNP) detection and characterization based on asymmetric-flow field flow fractionation (A4F) coupled to multiple detectors and using stable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912174



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