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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 11 to 20 of 195 records.
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11. Analysis of Au Nanoparticles by Electrospray Differential Mobility Analysis (ES-DMA)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2010
Author: Rebecca A Zangmeister
Abstract: This document describes a protocol for size analysis of citrate stabilized gold nanoparticles of nominally 10 nm, 30 nm, and 60 nm sizes using electrospray differential mobility analysis (ES-DMA).  Nanoparticles are centrifuged to remove excess ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832212

12. Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/5/2009
Authors: Daniel A Fischer, Saloman Turgman-Cohen, P K Kilpatrick, Jan Genzer
Abstract: The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903788

13. Assembly and evaluation of a pyroelectric detector bonded to vertically aligned multiwalled carbon nanotubes over thin silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/20/2013
Authors: John H Lehman, Evangelos Theocharous, Savva Theocharous
Abstract: A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO^d3^ has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914408

14. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2013
Authors: Norman A Sanford, David R Diercks, Brian Gorman, R Kirchofer, Kristine A Bertness, Matthew David Brubaker
Abstract: The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915760

15. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272

16. CEINT/NIST PROTOCOL for the PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN AN ENVIRONMENTAL MATRIX FOR ECO-TOXICOLOGICAL ASSESSMENT
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910395

17. Calibration of 1 nm SiC Step Height Standards
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Authors: Theodore Vincent Vorburger, Albert M. Hilton, Ronald G Dixson, Ndubuisi George Orji, J. A. Powell, A. J. Trunek, P. G. Neudeck, P. B. Abel
Abstract: We aim to develop and calibrate a set of step height standards to meet the range of steps useful for nanotechnology. Of particular interest to this community is the calibration of atomic force microscopes operating at their highest levels of magnifi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905193

18. Carbon Nanotube Nucleation Driven by Catalyst Morphology Dynamics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/14/2011
Authors: Elena Pigos, Evgeni S Penev, Morgana A Ribas, Renu Sharma, Boris I. Yakobson, Avetik R. Harutyunyan
Abstract: In situ observation of carbon nanotube nucleation process accompanied by catalyst particle dynamic morphology reconstruction is considered within a thermodynamic approach, and reveals the driving force for the liftoff,a crucial event in the nanotube ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908296

19. Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2010
Authors: Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph J Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907033

20. Challenges and Opportunities of Organic Electronics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387



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