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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 121 to 124.
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121. Ultrafast Photoinduced Carrier Dynamics of Organic Semiconductors Measured by Time-Resolved Terahertz Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/28/2010
Authors: Okan Esenturk, Joseph S Melinger, Paul A. Lane, Edwin J Heilweil
Abstract: Intrinsic properties of organic semiconductors are investigated by Time-Resolved Terahertz Spectroscopy (TRTS) to assess their relative mobilities and efficiencies. Our results are well correlated with device measurements, and show the effectiveness ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902516

122. Ultrasonic Dispersion of Nanoparticles for Environmental, Health and Safety Assessment--Issues and Recommendations
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/30/2010
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R. Wiesner
Abstract: A common approach for the study of the environmental and biological interactions of nanomaterials relies on the ultrasonic disruption of powders to obtain nanoparticle suspensions. Yet, the widespread and inconsistent use of ultrasonic treatment acro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905978

123. Use of TSOM for sub-11 nm node pattern defect detection and HAR features
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/30/2013
Authors: Ravikiran Attota, Abraham Arceo, Bunday Benjamin
Abstract: In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913698

124. ,Real-worldŠ precision, bias, and between-laboratory variation for surface area measurement of a titanium dioxide nanomaterial in powder form
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Vincent A Hackley, Aleksandr B. Stefaniak
Abstract: Accurate characterization of nanomaterial properties is a critical component of any nanotoxicology testing strategy. Data that describes the performance of various laboratories to measure the characteristics of the same nanomaterial is scarce. We c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912937



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