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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 171 to 180 of 211 records.
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171. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Bonghwan Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

172. Size Measurement of Nanoparticles using Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

173. Size-independent effects on nanoparticle retention behavior in asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: In this work we highlight the size-independent influence of the material properties of nanoparticles on their retention behavior in asymmetric-flow field-flow fractionation (A4F). The phenomena described here suggest there are limits to the effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913433

174. Spatial Resolution of Electrical Measurements Performed with Scanning Probe Microscope as a Function of Tip Shape
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2010
Authors: Joseph J Kopanski, Ilona Sitnitsky, Vincent LaBella
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905391

175. Spray Deposited Poly-3-hexylthiophene Thin Film Transistors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/11/2009
Authors: Calvin Chan, Lee J Richter, David Germack, Brad Conrad, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905385

176. Statistical Sampling of Carbon Nanotube Populations by Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/25/2013
Authors: Elisabeth Mansfield, Aparna Kar, Chih-Ming Wang, Ann Chiaramonti Chiaramonti Debay
Abstract: Carbon nanotubes are one of the most promising nanomaterials on the market, with applications in electronics devices, sensing, batteries, composites and medical communities. Strict control of the carbon nanotube chemistry and properties is neces ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913801

177. Statistics of Camera-Based Single-Particle Tracking
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/22/2010
Author: Andrew J. Berglund
Abstract: Through analysis of digital images, camera-based single-particle tracking enables quantitative determination of transport properties of nanoparticles and molecules and provides nanoscale information about material properties such as viscosity and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905460

178. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

179. Storage Wars: How citrate capped silver nanoparticle suspensions are affected by not-so-trivial decisions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/21/2014
Authors: Justin M Gorham, Anne B Rohlfing, Katrice A Lippa, Robert I. MacCuspie, Amy Hemmati, Richard D Holbrook
Abstract: A critical but often overlooked component of silver nanoparticle (AgNPs) suspensions involves their behavior following short- and long-term storage. The current study investigates the integrity of citrate-capped AgNP suspensions, nominally 20 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913638

180. Strategies for Nanoscale Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/30/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Michael T Postek
Abstract: Contour metrology is one of the techniques used to verify optical proximity correction (OPC) in lithography models. The use of these methods, which are known as resolution enhancement techniques (RET), are necessitated by the continued decrease in f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909559



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