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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 171 to 180 of 188 records.
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171. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

172. The Limits and Extensibility of Optical Patterned Defect Inspection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/1/2010
Authors: Richard M Silver, Bryan M Barnes, Martin Y Sohn, Richard Quintanilha, Hui Zhou, Chris Deeb, Mark Johnson, Milton Goodwin, Dilip Patel
Abstract: New techniques recently developed at the National Institute of Standards and Technology using bright field optical tools are applied to signal-based defect analysis of features with dimensions well below the measurement wavelength. A key to this app ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905318

173. The Stability and Surface Coverage of Polymer Stabilized Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/2/2010
Authors: Karl B Sebby, Elisabeth Mansfield
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906334

174. Thermoelectric imaging of structural disorder in epitaxial graphene
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/14/2013
Authors: Sanghee Cho, Stephen Dongmin Kang, Wondong Kim, Eui-Sup Lee, Sung-Jae Woo, Ki-Jeong Kong, Ilyou Kim, Hyeong-Do Kim, Tong Zhang, Joseph A Stroscio, Yong-Hyun Kim, Ho-Ki Lyeo
Abstract: Many structural defects and strain fields develop during the preparation of thin films and nanostructures, with their origins being at the atomic level1,2. Sensitively detecting these subtle features with high sensitivity and resolution, and their in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912752

175. Thermogravimetric analysis of NIST's single-wall carbon nanotube reference material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/25/2011
Authors: Elisabeth Mansfield, Stephanie A Hooker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907746

176. Three dimensional aspects of droplet coalescence during dropwise condensation on superhydrophobic surfaces
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/24/2011
Authors: Konrad Rykaczewski, John Henry j Scott, Sukumar Rajauria, W Robert Ashurst, Jeff Chinn, Amy Chinn, Wanda Jones
Abstract: We report formation of nano-to-microscale satellite droplets in the geometrical shadow of high contact angle primary drops during dropwise water condensation on a nanostructured superhydrophobic surface. The primary drops contribute to the heat tran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908846

177. Three-Dimensional Hydrogel Constructs for Dosing Cells with Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/13/2014
Authors: Elisabeth Mansfield, Tammy L. Oreskovic, Nikki Serene Rentz, Kavita M Jeerage
Abstract: In evaluating nanoparticle risks to human health, there is often a disconnect between results obtained from in vitro toxicology studies and in vivo activity, prompting the need for improved methods to rapidly assess the hazards of engineered nanomate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912224

178. Three-dimensional Nanometrology with TSOM Optical Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/10/2011
Author: Ravikiran Attota
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement sensitivity using conventional optical microscopes; measurement sensitivities are comparable to what is typical when using scatterometry ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910045

179. Through-focus Scanning Optical Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/31/2011
Author: Ravikiran Attota
Abstract: Through-focus scanning optical microscopy (TSOM) method provides three-dimensional information (i.e. the size, shape and location) about micro- and nanometer-scale structures. TSOM, based on a conventional optical microscope, achieves this by acquiri ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908493

180. Through-focus Scanning and Scatterfield Optical Methods for Advanced Overlay Target Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/1/2008
Authors: Ravikiran Attota, Michael T. Stocker, Richard M Silver, Nathanael A Heckert, Hui Zhou, Richard J Kasica, Lei Chen, Ronald G Dixson, Ndubuisi George Orji, Bryan M Barnes, Peter Lipscomb
Abstract: In this paper we present overlay measurement techniques that use small overlay targets for advanced semiconductor applications. We employ two different optical methods to measure overlay using modified conventional optical microscope platforms. They ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902294



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