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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 151 to 160 of 211 records.
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151. Radio-microanalytical particle measurements method and application to Fukushima aerosols collected in Japan
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2012
Authors: Cynthia J Zeissler, Lawrence Forsley, Richard Mark Lindstrom, Sean Newsome, Adrean Kirk, P.A. Mosier-Boss
Abstract: A nondestructive analytical method based on autoradiography and gamma spectrometry was developed to perform activity distribution analysis for particulate samples. This was applied to aerosols collected in Fukushima Japan, 40 km north of the Daiich ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911065

152. Raman and electron microscopy analysis of carbon nanotubes exposed to high power laser irradiance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/5/2009
Authors: John H Lehman, Christopher L Cromer, Krishna Ramadurai, Roop Mahajan, Anne Dillon
Abstract: High power laser radiometry requires efficient and damage-resistant detectors. The current study explores the evolving nature of carbon nanotube coatings for such detectors upon their exposure to incrementally increasing laser power levels. Electron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901094

153. Raman spectroscopy based measurements of carrier concentration in n-type GaN nanowires grown by plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: Date unknown
Authors: Lawrence H Robins, Elizabeth Horneber, Norman A Sanford, Kristine A Bertness, John B Schlager
Abstract: The carrier concentration in ensembles of n-type GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy was determined by curve-fitting analysis of Raman spectra, based on modeling of the carrier concentration dependence of the longitudi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915090

154. Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/22/2013
Authors: Sherrie R. Elzey, De-Hao D. Tsai, Lee Lijian Yu, Michael R Winchester, Michael E Kelley, Vincent A Hackley
Abstract: We report the development of a hyphenated instrument with the capacity to quantitatively characterize aqueous suspended gold nanoparticles (AuNPs) based on a combination of gas-phase size separation, particle counting, and elemental analysis. A custo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912171

155. Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/12/2009
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Thomas B Renegar, Xiaoyu A Zheng, Theodore Vincent Vorburger, Albert M. Hilton, Marc J Cangemi, Lei Chen, Michael A. Hernandez, Russell E Hajdaj, Michael R Bishop, Aaron Cordes
Abstract: In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) ‹ a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab ‹ a 1765 m2 (19,000 ft2) cl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902187

156. Relationships between Composition and Density of Tobermorite, Jennite, and Nanoscale CaO-SiO2-H2O
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2010
Authors: Andrew John Allen, Jeffrey Thomas, Hamlin M Jennings
Abstract: Relationships between composition, mass density, and atomic packing density for CaO{SiO2{H2O (C{S{H) gel, the main hydration product of ce- ment, and its mineral analogues tobermorite and jennite, are examined. A phase diagram approach is proposed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903643

157. Renormalization of the graphene dispersion velocity determined from scanning tunneling spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/11/2012
Authors: Joseph A Stroscio, Jungseok Chae, Nikolai B Zhitenev, Suyong Jung, Andrea F. Young, Cory Dean, Yuanda Gao, Kenji Watanabe, Takashi Taniguchi, James Hone, Kenneth L. Shepard, Philip Kim, Lei Wang
Abstract: In most metals, electrons behave as non-interacting quasiparticles with renormalized dynamical properties in the presence of electron interactions. Historically, many measurements are capable to probe the effect of interactions at the Fermi energy. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911329

158. Report on an Interlaboratory Study for the Measurement of BET-Specific Surface Area using an Industrially Relevant TiO2 Nanopowder
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2011
Author: Vincent A Hackley
Abstract: This report summarizes the findings of an interlaboratory study (ILS) conducted in 2009-2010 under the auspices of the Versailles Project on Advanced Materials and Standards (VAMAS) Technical Working Area (TWA) 34 (Nanoparticle Populations). The stat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908638

159. Reporting Guidelines for the Preparation of Aqueous Nanoparticle Dispersions from Dry Materials
Series: Special Publication (NIST SP)
Report Number: 1200-1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910681

160. Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran Attota, Shrawan Singhal, Sreenivasan S.V.
Abstract: Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist undern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910872



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