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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 151 to 160 of 220 records.
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151. Quantifying Dithiothreitol Displacement of Functional Ligands from Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/27/2012
Authors: De-Hao D. Tsai, Frank W DelRio, Sherrie R. Elzey, Suvajyoti S. Guha, Michael Russel Zachariah, Vincent A Hackley, Melanie P Shelton
Abstract: Dithiothreitol (DTT)-based displacement is widely utilized for separating ligands from their gold nanoparticle (AuNP) conjugates, a critical step for differentiating and quantifying surface-bound functional ligands and therefore the effective surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911354

152. Quantitative Analysis of Dendron-Conjugated Cisplatin-Complexed Gold Nanoparticles Using Scanning Particle Mobility Mass Spectrometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/8/2013
Authors: De-Hao D. Tsai, Tae Joon Cho, Sherrie R. Elzey, Julien C. Gigault, Vincent A Hackley
Abstract: We report a high-resolution and traceable method to quantify the drug loading on nanoparticle-based cancer therapeutics, and demonstrate this method using a model cisplatin functionalized dendron-gold nanoparticle (AuNP) conjugate. Electrospray diffe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912782

153. Quantitative Characterization and Applications of A 193 nm Scatterfield Microscope
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/25/2013
Authors: Martin Y Sohn, Bryan M Barnes, Richard M Silver
Abstract: With decreasing feature sizes in semiconductor manufacturing, there is an acute demand for measurements of both critical dimensions (CD) and defects on the nanometer scale that must also be non-destructive measurement and provide high throughput1. Sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912991

154. Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/28/2011
Authors: De-Hao D. Tsai, Melissa Davila-Morris, Frank W DelRio, Suvajyoti S. Guha, Vincent A Hackley, Michael R Zachariah
Abstract: Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907586

155. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C. Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909881

156. Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/20/2010
Authors: Elisabeth Mansfield, Aparna Kar, Stephanie A Hooker
Abstract: A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905333

157. Quasiparticle scattering from topological crystalline insulator SnTe (001) surface states
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/27/2014
Authors: Duming Zhang, Hongwoo Baek, Jeonghoon Ha, Tong Zhang, Jonathan E Wyrick, Albert Davydov, Young Kuk, Joseph A Stroscio
Abstract: Recently, the topological classification of electronic states has been extended to a new class of matter known as topological crystalline insulators. Similar to topological insulators, topological crystalline insulators also have spin-momentum locked ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915976

158. Radio-microanalytical particle measurements method and application to Fukushima aerosols collected in Japan
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2012
Authors: Cynthia J Zeissler, Lawrence Forsley, Richard Mark Lindstrom, Sean Newsome, Adrean Kirk, P.A. Mosier-Boss
Abstract: A nondestructive analytical method based on autoradiography and gamma spectrometry was developed to perform activity distribution analysis for particulate samples. This was applied to aerosols collected in Fukushima Japan, 40 km north of the Daiich ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911065

159. Raman and electron microscopy analysis of carbon nanotubes exposed to high power laser irradiance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/5/2009
Authors: John H Lehman, Christopher L Cromer, Krishna Ramadurai, Roop Mahajan, Anne Dillon
Abstract: High power laser radiometry requires efficient and damage-resistant detectors. The current study explores the evolving nature of carbon nanotube coatings for such detectors upon their exposure to incrementally increasing laser power levels. Electron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901094

160. Raman spectroscopy based measurements of carrier concentration in n-type GaN nanowires grown by plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: Date unknown
Authors: Lawrence H Robins, Elizabeth Horneber, Norman A Sanford, Kristine A Bertness, John B Schlager
Abstract: The carrier concentration in ensembles of n-type GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy was determined by curve-fitting analysis of Raman spectra, based on modeling of the carrier concentration dependence of the longitudi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915090



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