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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 141 to 150 of 199 records.
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141. Raman and electron microscopy analysis of carbon nanotubes exposed to high power laser irradiance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/5/2009
Authors: John H Lehman, Christopher L Cromer, Krishna Ramadurai, Roop Mahajan, Anne Dillon
Abstract: High power laser radiometry requires efficient and damage-resistant detectors. The current study explores the evolving nature of carbon nanotube coatings for such detectors upon their exposure to incrementally increasing laser power levels. Electron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901094

142. Raman spectroscopy based measurements of carrier concentration in n-type GaN nanowires grown by plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: Date unknown
Authors: Lawrence H Robins, Elizabeth Horneber, Norman A Sanford, Kristine A Bertness, John B Schlager
Abstract: The carrier concentration in ensembles of n-type GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy was determined by curve-fitting analysis of Raman spectra, based on modeling of the carrier concentration dependence of the longitudi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915090

143. Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/22/2013
Authors: Sherrie R. Elzey, De-Hao D. Tsai, Lee Lijian Yu, Michael R Winchester, Michael E Kelley, Vincent A Hackley
Abstract: We report the development of a hyphenated instrument with the capacity to quantitatively characterize aqueous suspended gold nanoparticles (AuNPs) based on a combination of gas-phase size separation, particle counting, and elemental analysis. A custo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912171

144. Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/12/2009
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Thomas B Renegar, Xiaoyu A Zheng, Theodore Vincent Vorburger, Albert M. Hilton, Marc J Cangemi, Lei Chen, Michael A. Hernandez, Russell E Hajdaj, Michael R Bishop, Aaron Cordes
Abstract: In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) ‹ a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab ‹ a 1765 m2 (19,000 ft2) cl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902187

145. Relationships between Composition and Density of Tobermorite, Jennite, and Nanoscale CaO-SiO2-H2O
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2010
Authors: Andrew John Allen, Jeffrey Thomas, Hamlin M Jennings
Abstract: Relationships between composition, mass density, and atomic packing density for CaO{SiO2{H2O (C{S{H) gel, the main hydration product of ce- ment, and its mineral analogues tobermorite and jennite, are examined. A phase diagram approach is proposed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903643

146. Renormalization of the graphene dispersion velocity determined from scanning tunneling spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/11/2012
Authors: Joseph A Stroscio, Jungseok Chae, Nikolai B Zhitenev, Suyong Jung, Andrea F. Young, Cory Dean, Yuanda Gao, Kenji Watanabe, Takashi Taniguchi, James Hone, Kenneth L. Shepard, Philip Kim, Lei Wang
Abstract: In most metals, electrons behave as non-interacting quasiparticles with renormalized dynamical properties in the presence of electron interactions. Historically, many measurements are capable to probe the effect of interactions at the Fermi energy. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911329

147. Report on an Interlaboratory Study for the Measurement of BET-Specific Surface Area using an Industrially Relevant TiO2 Nanopowder
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2011
Author: Vincent A Hackley
Abstract: This report summarizes the findings of an interlaboratory study (ILS) conducted in 2009-2010 under the auspices of the Versailles Project on Advanced Materials and Standards (VAMAS) Technical Working Area (TWA) 34 (Nanoparticle Populations). The stat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908638

148. Reporting Guidelines for the Preparation of Aqueous Nanoparticle Dispersions from Dry Materials
Series: Special Publication (NIST SP)
Report Number: 1200-1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910681

149. Residual Layer Thickness Control and Metrology in Jet and Flash Imprint Lithography
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Shrawan Singhal, Sreenivasan S.V.
Abstract: Jet-and-Flash Imprint Lithography (J-FIL) has demonstrated capability of high-resolution patterning at low costs. For accurate pattern transfer using J-FIL, it is imperative to have control of the residual layer thickness (RLT) of cured resist undern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910872

150. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran (Ravikiran) Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543



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