NIST logo

Publications Portal

You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 141 to 150 of 220 records.
Resort by: Date / Title


141. Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683

142. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684

143. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5r1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/3/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913712

144. Preparation of a Nanoscale TiO2 Aqueous Dispersion for Toxicological or Environmental Testing
Series: Special Publication (NIST SP)
Report Number: 1200-3
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910682

145. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao Minh Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

146. Probing the Nanoscale
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/23/2010
Author: Robert Francis Cook
Abstract: Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905145

147. Probing the paramagnetic interactions between the unpaired electronic spins of carbon atoms and the nuclear spins of hydrogen molecules with Raman spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/1/2011
Author: Andrea Centrone
Abstract: Carbon materials typically have a high density of unpaired electronic spins but the exact nature of the defect sites that give rise to their magnetic properties are not yet well understood. In this work, the paramagnetic interactions between the unpa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907299

148. Prototype Cantilevers for SI-Traceable NanoNewton Force Calibration
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/20/2006
Authors: Richard Swift Gates, Jon Robert Pratt
Abstract: A series of extremely uniform prototype reference cantilevers have been created that can be used to calibrate the spring constants of atomic force microscope (AFM) cantilevers and other micromechanical structures. By utilizing optimal combinations o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850947

149. Pseudomagnetic Fields in a Locally Strained Graphene Drumhead
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/25/2014
Authors: Shuze Zhu, Yinjun Huang, Nikolai Nikolayevich Klimov, David B Newell, Nikolai B Zhitenev, Joseph A Stroscio, Santiago de Jesus Solares Rivera, Teng Li
Abstract: Recent experiments reveal that a scanning tunneling microscopy (STM) probe tip can generate a highly localized strain field in a graphene drumhead, which in turn leads to pseudomagnetic fields in the graphene that can spatially confine graphene charg ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915987

150. Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/1/2010
Authors: Robert I. MacCuspie, Andrea M Elsen, Steve J Diamanti, Steve T Patton, Igor Altfeder, J. David Jacobs, Andrey A Voevodin, Richard A Vaia
Abstract: Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903692



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series