NIST logo

Publications Portal

You searched on:
Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
Sorted by: title

Displaying records 131 to 140 of 188 records.
Resort by: Date / Title


131. Quantitative determination of nanoparticle surface coatings using microscale thermogravimetric analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2014
Authors: Elisabeth Mansfield, Christopher Michael Poling, Jenifer Lee Blacklock, Katherine M Tyner
Abstract: The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914528

132. Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/20/2010
Authors: Elisabeth Mansfield, Aparna Kar, Stephanie A Hooker
Abstract: A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905333

133. Radio-microanalytical particle measurements method and application to Fukushima aerosols collected in Japan
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2012
Authors: Cynthia J Zeissler, Lawrence Forsley, Richard Mark Lindstrom, Sean Newsome, Adrean Kirk, P.A. Mosier-Boss
Abstract: A nondestructive analytical method based on autoradiography and gamma spectrometry was developed to perform activity distribution analysis for particulate samples. This was applied to aerosols collected in Fukushima Japan, 40 km north of the Daiich ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911065

134. Raman and electron microscopy analysis of carbon nanotubes exposed to high power laser irradiance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/5/2009
Authors: John H Lehman, Christopher L Cromer, Krishna Ramadurai, Roop Mahajan, Anne Dillon
Abstract: High power laser radiometry requires efficient and damage-resistant detectors. The current study explores the evolving nature of carbon nanotube coatings for such detectors upon their exposure to incrementally increasing laser power levels. Electron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901094

135. Raman spectroscopy based measurements of carrier concentration in n-type GaN nanowires grown by plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: Date unknown
Authors: Lawrence H Robins, Elizabeth Horneber, Norman A Sanford, Kristine A Bertness, John B Schlager
Abstract: The carrier concentration in ensembles of n-type GaN nanowires (NWs) grown by plasma-assisted molecular beam epitaxy was determined by curve-fitting analysis of Raman spectra, based on modeling of the carrier concentration dependence of the longitudi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915090

136. Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/22/2013
Authors: Sherrie R. Elzey, De-Hao D. Tsai, Lee Lijian Yu, Michael R Winchester, Michael E Kelley, Vincent A Hackley
Abstract: We report the development of a hyphenated instrument with the capacity to quantitatively characterize aqueous suspended gold nanoparticles (AuNPs) based on a combination of gas-phase size separation, particle counting, and elemental analysis. A custo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912171

137. Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/12/2009
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Thomas B Renegar, Xiaoyu A Zheng, Theodore Vincent Vorburger, Albert M. Hilton, Marc J Cangemi, Lei Chen, Michael A. Hernandez, Russell E Hajdaj, Michael R Bishop, Aaron Cordes
Abstract: In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) ‹ a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab ‹ a 1765 m2 (19,000 ft2) cl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902187

138. Relationships between Composition and Density of Tobermorite, Jennite, and Nanoscale CaO-SiO2-H2O
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2010
Authors: Andrew John Allen, Jeffrey Thomas, Hamlin M Jennings
Abstract: Relationships between composition, mass density, and atomic packing density for CaO{SiO2{H2O (C{S{H) gel, the main hydration product of ce- ment, and its mineral analogues tobermorite and jennite, are examined. A phase diagram approach is proposed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903643

139. Renormalization of the graphene dispersion velocity determined from scanning tunneling spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/11/2012
Authors: Joseph A Stroscio, Jungseok Chae, Nikolai B Zhitenev, Suyong Jung, Andrea F. Young, Cory Dean, Yuanda Gao, Kenji Watanabe, Takashi Taniguchi, James Hone, Kenneth L. Shepard, Philip Kim, Lei Wang
Abstract: In most metals, electrons behave as non-interacting quasiparticles with renormalized dynamical properties in the presence of electron interactions. Historically, many measurements are capable to probe the effect of interactions at the Fermi energy. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911329

140. Report on an Interlaboratory Study for the Measurement of BET-Specific Surface Area using an Industrially Relevant TiO2 Nanopowder
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2011
Author: Vincent A Hackley
Abstract: This report summarizes the findings of an interlaboratory study (ILS) conducted in 2009-2010 under the auspices of the Versailles Project on Advanced Materials and Standards (VAMAS) Technical Working Area (TWA) 34 (Nanoparticle Populations). The stat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908638



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series