NIST logo

Publications Portal

You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 121 to 130 of 153 records.
Resort by: Date / Title


121. Size Measurement of Nanoparticles using Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

122. Size-independent effects on nanoparticle retention behavior in asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: In this work we highlight the size-independent influence of the material properties of nanoparticles on their retention behavior in asymmetric-flow field-flow fractionation (A4F). The phenomena described here suggest there are limits to the effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913433

123. Spin Dynamics in the Time and Frequency Domain
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/15/2012
Author: Thomas J Silva
Abstract: The current status of experimental approaches to analyze the spin wave dynamics in ferromagnetic nanoscale structures is reviewed. Recent developments in frequency- and field swept spectroscopy to determine the resonant response of nanoscale ferromag ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911698

124. Spray Deposited Poly-3-hexylthiophene Thin Film Transistors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/11/2009
Authors: Calvin Chan, Lee J Richter, David Germack, Brad Conrad, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905385

125. Statistics of Camera-Based Single-Particle Tracking
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/22/2010
Author: Andrew J. Berglund
Abstract: Through analysis of digital images, camera-based single-particle tracking enables quantitative determination of transport properties of nanoparticles and molecules and provides nanoscale information about material properties such as viscosity and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905460

126. Steady State Vapor Bubble in Pool Boiling
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2016
Authors: An Zou, Ashish Chanana, Amit Kumar Agrawal, Peter C. Wayner, Jr., Shalabh C. Maroo
Abstract: Boiling, a dynamic and multiscale process, has been studied for over five decades; however, a comprehensive understanding of the process is still lacking. The bubble ebullition cycle, which involves nucleation, growth and departure, happens over ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918948

127. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/12/2010
Authors: Norman A Sanford, Paul T Blanchard, Kristine A Bertness, Lorelle Mansfield, John B. Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

128. Storage Wars: How citrate capped silver nanoparticle suspensions are affected by not-so-trivial decisions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/21/2014
Authors: Justin M Gorham, Anne B Rohlfing, Katrice A Lippa, Robert I. MacCuspie, Amy Hemmati, Richard D Holbrook
Abstract: A critical but often overlooked component of silver nanoparticle (AgNPs) suspensions involves their behavior following short- and long-term storage. The current study investigates the integrity of citrate-capped AgNP suspensions, nominally 20 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913638

129. Strategies for Nanoscale Contour Metrology using Critical Dimension Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/30/2011
Authors: Ndubuisi George Orji, Ronald G Dixson, Andras Vladar, Michael T Postek
Abstract: Contour metrology is one of the techniques used to verify optical proximity correction (OPC) in lithography models. The use of these methods, which are known as resolution enhancement techniques (RET), are necessitated by the continued decrease in f ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909559

130. Strong Casimir force reduction by metallic surface nanostructuring
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/27/2013
Authors: Francesco Intravaia, Stefan T. Koev, Il Woong Jung, Albert A. Talin, Paul S Davids, Ricardo Decca, Vladimir A Aksyuk, Diego A. R. Dalvit, Daniel Lopez
Abstract: The Casimir force is a quantum-mechanical interaction arising from vacuum fluctuations of the electromagnetic (EM) field and is technologically significant in micro- and nanomechanical systems. Despite rapid progress in nanophotonics, the goal of e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910133



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series