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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 121 to 130 of 204 records.
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121. PEGylated Gold Nanorod Separation and Characterization by Asymmetric Field Flow Fractionation Based on Aspect Ratio with UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/5/2013
Authors: Thao Minh Nguyen, Julien C. Gigault, Vincent A Hackley
Abstract: The development of highly efficient asymmetric-flow field flow fractionation (A4F) methodology for biocompatible PEGylated gold nanorods (GNR) without the need for surfactants in the mobile phase is presented. We report on the potential of A4F for r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914165

122. PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260

123. PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN BIOLOGICAL TEST MEDIA FOR TOXICOLOGICAL ASSESSMENT
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/31/2011
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909844

124. Pattern Transfer of 3D structures into silicon with atomically traceable placement and size control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

125. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran (Ravikiran) Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

126. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

127. Precise AFM Cantilever Spring Constant Calibration Using a Reference Cantilever Array
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/1/2007
Authors: Richard Swift Gates, M G Reitsma
Abstract: A new method of calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using a unique array of uniform microfabricated reference cantilevers. A series of force-distance curves were obtained using a commercial AFM test ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854219

128. Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680

129. Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683

130. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684



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