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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 111 to 120 of 196 records.
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111. Optical microscope angular illumination analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/7/2012
Author: Ravikiran Attota
Abstract: For high precision applications of optical microscopes, it is critical to achieve symmetrical angular illumination intensity at the sample plane, in addition to uniform spatial intensity achieved by Köhler illumination. In this paper, first we dem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910145

112. Optimizing Hybrid Metrology through a Consistent Multi-Tool Parameter Set and Uncertainty Model
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/14/2014
Authors: Richard M Silver, Bryan M Barnes, Nien F Zhang, Hui Zhou, Andras Vladar, John S Villarrubia, Regis J Kline, Daniel Franklin Sunday, Alok Vaid
Abstract: There has been significant interest in hybrid metrology as a novel method for reducing overall measurement uncertainty and optimizing measurement throughput (speed) through rigorous combinations of two or more different measurement techniques into a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915846

113. Optimizing Instrument Operation and Data Processing for Single Particle Inductively Coupled Plasma Mass Spectrometry Measurement of Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/16/2013
Authors: Jingyu Liu, Karen E Murphy, Robert I. MacCuspie, Michael R Winchester
Abstract: Inductively coupled plasma mass spectrometry (ICP-MS) operated in single particle mode is an attractive analytical tool capable of both sizing and counting metal containing nanoparticles in aqueous suspensions. In this study, we have evaluated the pe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913478

114. Organic Electronics: Challenges and Opportunities
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

115. PEGylated Gold Nanorod Separation and Characterization by Asymmetric Field Flow Fractionation Based on Aspect Ratio with UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/5/2013
Authors: Thao Minh Nguyen, Julien C. Gigault, Vincent A Hackley
Abstract: The development of highly efficient asymmetric-flow field flow fractionation (A4F) methodology for biocompatible PEGylated gold nanorods (GNR) without the need for surfactants in the mobile phase is presented. We report on the potential of A4F for r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914165

116. PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260

117. PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN BIOLOGICAL TEST MEDIA FOR TOXICOLOGICAL ASSESSMENT
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/31/2011
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909844

118. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

119. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

120. Precise AFM Cantilever Spring Constant Calibration Using a Reference Cantilever Array
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/1/2007
Authors: Richard Swift Gates, M G Reitsma
Abstract: A new method of calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using a unique array of uniform microfabricated reference cantilevers. A series of force-distance curves were obtained using a commercial AFM test ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854219



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