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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 111 to 120 of 206 records.
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111. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/21/2011
Authors: Ravikiran (Ravikiran) Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

112. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

113. Nanoparticle Size and Shape Evaluation Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2012
Authors: Bradley N Damazo, Ravikiran (Ravikiran) Attota, Premsagar Purushotham Kavuri, Andras Vladar
Abstract: A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911138

114. Nanoscale Measurements With the TSOM Optical Method
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/4/2010
Author: Ravikiran (Ravikiran) Attota
Abstract: A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904673

115. Nanoscale Photoresponse in Blended Organic Photovoltaics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/16/2009
Authors: Behrang H Hamadani, Suyong S. Jung, Nikolai B Zhitenev
Abstract: Organic solar cells, which have attracted considerable interest over the last few years as low-cost, simply-processed alternatives for harvesting the solar energy, have interesting nanoscale properties; a thorough understanding of which is currently ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902275

116. Nanoscale Reference Materials for Environmental, Health, and Safety Measurements: Needs, Gaps, and Opportunities
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/7/2012
Authors: Aleksandr B. Stefaniak, Vincent A Hackley, Gert Roebben, Kensei Ehara, Steve Hankin, Michael T Postek, Iseult Lynch, Wei-En Fu, Thomas P.J. Linsinger, Andreas Th?nemann
Abstract: There is a need to understand and manage potential risks posed to workers, the public, and the environment from exposure to engineered nanomaterials. In response, several organizations have developed lists of relevant nano-objects and of physico-che ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910519

117. Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Jan Obrzut, Nathan Daniel Orloff, Oleg A Kirillov
Abstract: A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914908

118. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

119. Optical microscope angular illumination analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/7/2012
Author: Ravikiran (Ravikiran) Attota
Abstract: For high precision applications of optical microscopes, it is critical to achieve symmetrical angular illumination intensity at the sample plane, in addition to uniform spatial intensity achieved by Köhler illumination. In this paper, first we dem ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910145

120. Optimizing Hybrid Metrology through a Consistent Multi-Tool Parameter Set and Uncertainty Model
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/14/2014
Authors: Richard M Silver, Bryan M Barnes, Nien F Zhang, Hui H. Zhou, Andras Vladar, John S Villarrubia, Regis J Kline, Daniel Franklin Sunday, Alok Vaid
Abstract: There has been significant interest in hybrid metrology as a novel method for reducing overall measurement uncertainty and optimizing measurement throughput (speed) through rigorous combinations of two or more different measurement techniques into a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915846



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