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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 111 to 120 of 209 records.
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111. Nanomechanical Measurements and Tools
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/23/2010
Author: Robert Francis Cook
Abstract: Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications ranging from biomedical implantable actuators to environmental toxin detectors to infrastructur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904862

112. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905416

113. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/21/2011
Authors: Ravikiran (Ravikiran) Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395

114. Nanoparticle Separation and Metrology by Three-Dimensional Nanofluidic Size Exclusion
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/8/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905421

115. Nanoparticle Size and Shape Evaluation Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2012
Authors: Bradley N Damazo, Ravikiran (Ravikiran) Attota, Premsagar Purushotham Kavuri, Andras Vladar
Abstract: A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911138

116. Nanoscale Measurements With the TSOM Optical Method
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/4/2010
Author: Ravikiran (Ravikiran) Attota
Abstract: A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904673

117. Nanoscale Photoresponse in Blended Organic Photovoltaics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/16/2009
Authors: Behrang H Hamadani, Suyong S. Jung, Nikolai B Zhitenev
Abstract: Organic solar cells, which have attracted considerable interest over the last few years as low-cost, simply-processed alternatives for harvesting the solar energy, have interesting nanoscale properties; a thorough understanding of which is currently ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902275

118. Nanoscale Reference Materials for Environmental, Health, and Safety Measurements: Needs, Gaps, and Opportunities
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/7/2012
Authors: Aleksandr B. Stefaniak, Vincent A Hackley, Gert Roebben, Kensei Ehara, Steve Hankin, Michael T Postek, Iseult Lynch, Wei-En Fu, Thomas P.J. Linsinger, Andreas Th?nemann
Abstract: There is a need to understand and manage potential risks posed to workers, the public, and the environment from exposure to engineered nanomaterials. In response, several organizations have developed lists of relevant nano-objects and of physico-che ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910519

119. Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Jan Obrzut, Nathan Daniel Orloff, Oleg A Kirillov
Abstract: A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914908

120. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932



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