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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 91 to 100 of 206 records.
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91. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208

92. Injection-level-dependent internal quantum efficiency and lasing in low-defect GaN nanowires
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/28/2011
Authors: John B Schlager, Norman A Sanford, Kristine A Bertness, Alexana Roshko
Abstract: Measurements of temperature-dependent and time-resolved photoluminescence (PL) on individual GaN nanowires revealed PL lifetimes and values of internal quantum efficiency (IQE) that increased with excitation fluence. With sufficient injection levels, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906136

93. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/8/2013
Authors: Paul Lemaillet, Thomas Avery Germer, Regis J Kline, Daniel Franklin Sunday, Chengqing C. Wang, Wen-Li Wu
Abstract: In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913230

94. Intermittent contact resonance atomic force microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2014
Authors: Gheorghe Stan, Richard Swift Gates
Abstract: The intermittent contact resonance atomic force microscopy (ICR-AFM) mode proposed here is a new frequency modulation technique performed in scanning force controlled AFM modes like force volume or peak force tapping. It consists of tracking the chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914896

95. MEMS Kinematics by Super-Resolution Fluorescence Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/28/2012
Authors: Craig Dyer McGray, Samuel M Stavis, Joshua Giltinan, Eric Eastman, Samara L. Firebaugh, Jenelle Piepmeier, Jon C Geist, Michael Gaitan
Abstract: Super-resolution fluorescence microscopy is used for the first time to study the nanoscale kinematics of a MEMS device in motion across a surface. A device under test is labeled with fluorescent nanoparticles that form a microscale constellation of n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910908

96. Making Batch-Mode Size Measurements of Nanoparticles in Aqueous Media Using Dynamic Light Scattering
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/11/2007
Authors: Vincent A Hackley, Jeffrey D. Clogston
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854412

97. Measurement Uncertainties in MEMS Kinematics by Super-Resolution Fluorescence Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/25/2013
Authors: Craig Dyer McGray, Samuel M Stavis, Jon C Geist
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912891

98. Measuring agglomerate size distribution and dependence of localized surface plasmon resonance absorbance on gold nanoparticle agglomerate size using analytical ultracentrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/3/2011
Authors: Justin M Zook, Vinayak Rastogi, Robert I. MacCuspie, Athena M Keene, Jeffrey A Fagan
Abstract: Nanoparticles frequently agglomerate when dispersed into relevant biological and environmental media, with the resulting change to the effective size distribution dramatically affecting the potential nanotoxicity and the absorbance for biosensor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908878

99. Measuring silver nanoparticle dissolution in complex biological and environmental matrices using UV-Visible absorbance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/2/2011
Authors: Justin M Zook, Stephen E Long, Danielle Cleveland, Carly Lay Geronimo, Robert I. MacCuspie
Abstract: Distinguishing the toxic effects of nanoparticles (NPs) themselves from the well-studied toxic effects of their ions is a critical but challenging measurement for nanotoxicity studies and regulation. This measurement is especially difficult for silv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907804

100. Mechanical properties of one-dimensional nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902063



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