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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 91 to 100 of 195 records.
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91. Measuring silver nanoparticle dissolution in complex biological and environmental matrices using UV-Visible absorbance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/2/2011
Authors: Justin M Zook, Stephen E Long, Danielle Cleveland, Carly Lay Geronimo, Robert I. MacCuspie
Abstract: Distinguishing the toxic effects of nanoparticles (NPs) themselves from the well-studied toxic effects of their ions is a critical but challenging measurement for nanotoxicity studies and regulation. This measurement is especially difficult for silv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907804

92. Mechanical properties of one-dimensional nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902063

93. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

94. Metrology For Organic Monolayers On Cobalt Surfaces
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/27/2013
Authors: Sujitra Jeanie Pookpanratana, Leigh Kent Lydecker, Hyuk-Jae Jang, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912903

95. Microscale thermogravimetric analysis for determining nanoparticle purity and surface coverage
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/1/2011
Author: Elisabeth Mansfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907735

96. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904152

97. Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2013
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912337

98. Multiscale Modeling of Quantum Nanostructures Using Integrated Green's Function and Molecular Dynamics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2004
Authors: Vinod K Tewary, David Thomas Read
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851351

99. Nano- and Atom-scale Length Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2010
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Richard A Allen, Michael W Cresswell, Vincent A Hackley
Abstract: Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconducto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906609

100. Nanofluidic Entropophoresis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Samuel M Stavis, Elizabeth A Strychalski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913873



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