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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 91 to 100 of 147 records.
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91.
PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used
...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260
92.
PREPARATION OF NANOSCALE TiO2 DISPERSIONS IN BIOLOGICAL TEST MEDIA FOR TOXICOLOGICAL ASSESSMENT
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/31/2011
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909844
93.
Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910
94.
Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637
95.
Precise AFM Cantilever Spring Constant Calibration Using a Reference Cantilever Array
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/1/2007
Authors: Richard Swift Gates, M G Reitsma
Abstract: A new method of calibrating the stiffness of atomic force microscope (AFM) cantilevers is demonstrated using a unique array of uniform microfabricated reference cantilevers. A series of force-distance curves were obtained using a commercial AFM test
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http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854219
96.
Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680
97.
Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683
98.
Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684
99.
Preparation of a Nanoscale TiO2 Aqueous Dispersion for Toxicological or Environmental Testing
Series: Special Publication (NIST SP)
Report Number: 1200-3
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910682
100.
Probing the Nanoscale
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/23/2010
Author: Robert Francis Cook
Abstract: Nanoscale probes can now measure all manner of nanomechanical properties, opening up opportunities for new science and new devices.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905145