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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 91 to 100 of 162 records.
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91. Parameter optimization for through-focus scanning optical microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/23/2016
Authors: Ravikiran Attota, Hyeong G. Kang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920557

92. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

93. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

94. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

95. Photodetectors: High-Gain and Low-Driving-Voltage Photodetectors Based on Organolead Triiodide Perovskites (Adv. Mater. 11/2015)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/12/2015
Authors: Riu Dong, Yanjun Fang, Jungseok Chae, Jun Dai, Zhengguo Xiao, Qingfeng Dong, Yongbo Yuan, Andrea Centrone, Xiaocheng Zeng, Jinsong Huang
Abstract: Methylammonium lead triiodide (CH3NH3PbI3) perovskite is an emerging low-cost, solution processable material which attracts great interest for enabling the fabrication of high performance optoelectronic devices such as solar cells, room temperature l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917115

96. Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/18/2015
Authors: Matthew David Brubaker, Shannon M.M. Duff, Todd E Harvey, Paul T Blanchard, Alexana Roshko, Aric Warner Sanders, Norman A Sanford, Kristine A Bertness
Abstract: We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917880

97. Preparation of Multi-Walled Carbon Nanotube Dispersions in a Polyetheramine Epoxy for Eco- Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-9
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/30/2015
Authors: Chelsea Simone Davis, Jeremiah W Woodcock, Jeffrey W Gilman
Abstract: Carbon nanotubes (CNT) are a widely studied nanomaterial due to their unique electrical, thermal, and mechanical properties which can be transferred to commercially-relevant products. As a result, several industries have made significant effo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917859

98. Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680

99. Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683

100. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684



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