Take a sneak peek at the new NIST.gov and let us know what you think!
(Please note: some content may not be complete on the beta site.).

View the beta site
NIST logo

Publications Portal

You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: title

Displaying records 91 to 100 of 164 records.
Resort by: Date / Title


91. PEGylated Gold Nanorod Separation and Characterization by Asymmetric Field Flow Fractionation Based on Aspect Ratio with UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/5/2013
Authors: Thao M. Nguyen, Julien C. Gigault, Vincent A Hackley
Abstract: The development of highly efficient asymmetric-flow field flow fractionation (A4F) methodology for biocompatible PEGylated gold nanorods (GNR) without the need for surfactants in the mobile phase is presented. We report on the potential of A4F for r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914165

92. PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260

93. Parameter optimization for through-focus scanning optical microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/23/2016
Authors: Ravikiran Attota, Hyeong G. Kang
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=920557

94. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583

95. Patterned Defect & CD Metrology by TSOM Beyond the 22 nm Node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/10/2012
Authors: Ravikiran Attota, Abraham Arceo, Benjamin Bunday, Victor Vertanian
Abstract: Through-focus scanning optical microscopy (TSOM) is a novel method [1-8] that allows conventional optical microscopes to collect dimensional information down to the nanometer level by combining two-dimensional optical images captured at several throu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910910

96. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah Stanley Jacobs, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

97. Photodetectors: High-Gain and Low-Driving-Voltage Photodetectors Based on Organolead Triiodide Perovskites (Adv. Mater. 11/2015)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/12/2015
Authors: Riu Dong, Yanjun Fang, Jungseok Chae, Jun Dai, Zhengguo Xiao, Qingfeng Dong, Yongbo Yuan, Andrea Centrone, Xiaocheng Zeng, Jinsong Huang
Abstract: Methylammonium lead triiodide (CH3NH3PbI3) perovskite is an emerging low-cost, solution processable material which attracts great interest for enabling the fabrication of high performance optoelectronic devices such as solar cells, room temperature l ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917115

98. Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/18/2015
Authors: Matthew David Brubaker, Shannon M.M. Duff, Todd E Harvey, Paul T Blanchard, Alexana Roshko, Aric Warner Sanders, Norman A Sanford, Kristine A Bertness
Abstract: We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917880

99. Preparation of Multi-Walled Carbon Nanotube Dispersions in a Polyetheramine Epoxy for Eco- Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-9
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/30/2015
Authors: Chelsea Simone Davis, Jeremiah W Woodcock, Jeffrey W Gilman
Abstract: Carbon nanotubes (CNT) are a widely studied nanomaterial due to their unique electrical, thermal, and mechanical properties which can be transferred to commercially-relevant products. As a result, several industries have made significant effo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917859

100. Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series