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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 91 to 100 of 188 records.
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91. Metrology For Organic Monolayers On Cobalt Surfaces
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/27/2013
Authors: Sujitra Jeanie Pookpanratana, Leigh Kent Lydecker, Hyuk-Jae Jang, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912903

92. Microscale thermogravimetric analysis for determining nanoparticle purity and surface coverage
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/1/2011
Author: Elisabeth Mansfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907735

93. Microstructural Evolution of Pd-doped Nanoscale Zero-valent Iron (nZVI) Particles in Aqueous Media and Implications for Particle Reactivity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2010
Authors: Andrew A Herzing, Weile Yan, Christopher J. Kiely, Wei-xian Zhang
Abstract: Palladized zero-valent iron nanoparticles have been frequently employed to achieve enhanced treatment of halogenated organic compounds. However no detailed study has been published on their structures, especially the distribution of palladium within ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904152

94. Microwave Conductance of Semicontinuous Metallic Films from Coplanar Waveguide Scattering Parameters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/6/2013
Authors: Jan Obrzut, Oleg A Kirillov
Abstract: Conductance of thin semicontinuous metallic films is measured in coplanar waveguide configuration at frequencies of 100 MHz to 20 GHz. The presented model of the microwave network correlates the experimental scattering parameters (S11) and (S21) with ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912337

95. Multiscale Modeling of Quantum Nanostructures Using Integrated Green's Function and Molecular Dynamics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2004
Authors: Vinod K Tewary, David Thomas Read
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851351

96. Nano- and Atom-scale Length Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2010
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Richard A Allen, Michael W Cresswell, Vincent A Hackley
Abstract: Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconducto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906609

97. Nanofluidic Entropophoresis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Samuel M Stavis, Elizabeth A Strychalski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913873

98. Nanomechanical Measurements and Tools
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/23/2010
Author: Robert Francis Cook
Abstract: Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications ranging from biomedical implantable actuators to environmental toxin detectors to infrastructur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904862

99. Nanomechanical standards based on the intrinsic mechanics of molecules and atoms
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2010
Authors: Jon Robert Pratt, Gordon Allan Shaw, Douglas T Smith
Abstract: For more than a decade, instruments based on local probes have allowed us to touch objects at the nanoscale, making it possible for scientists and engineers to probe the electrical, chemical, and physical behaviors of matter at the level of individ ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905416

100. Nanometrology Using Through-Focus Scanning Optical Microscopy Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/21/2011
Authors: Ravikiran Attota, Richard M Silver
Abstract: We present an initial review of a novel through-focus scanning optical microscopy (TSOM) imaging method that produces nanometer dimensional measurement sensitivity using a conventional bright-field optical microscope. In the TSOM method a target is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905395



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