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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 91 to 100 of 216 records.
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91. High-speed, high-purity separation of gold nanoparticle‹DNA origami constructs using centrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Seung H. Ko, Luis Fernando Vargas Lara, Paul N. Patrone, Samuel M Stavis, Francis Starr, Jack F Douglas, James Alexander Liddle
Abstract: DNA origami is a powerful platform for assembling gold nanoparticle constructs, an important class of nanostructure with numerous applications. Such constructs are assembled by the association of complementary DNA oligomers. These association reactio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915009

92. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

93. Imaging of nanoscale charge transport in bulk heterojunction solar cells
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/17/2011
Authors: Behrang H Hamadani, Nadine Emily Gergel-Hackett, Paul M Haney, Nikolai B Zhitenev
Abstract: We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905890

94. Implications of the choice of interatomic potential on planar faults and surface properties in nickel
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/21/2011
Authors: Chandler A Becker, Francesca M Tavazza, Lyle E Levine
Abstract: With the increasing use of molecular simulation to understand deformation mechanisms in transition metals, it is important to assess how well the simulations capture behavior both near equilibrium and under more extreme conditions. In particular, it ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906781

95. In situ measurement of annealing-induced line shape decay in nanoimprinted polymers using scatterometry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/2/2009
Authors: Heather J Patrick, Thomas Avery Germer, Yifu Ding, Hyun W. Ro, Lee J Richter, Christopher L Soles
Abstract: Thermal embossing nanoimprint lithography (NIL) is an area of continuing interest because it allows direct patterning of nanoscale structures into a wide variety of functional polymer materials. Measuring the shape evolution of nanoimprinted lines d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901568

96. In-Situ Measurement of Atomic Force Microscope Tip Wear by Contact Resonance Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2011
Authors: Jason Philip Killgore, Roy Howard Geiss, Donna C. Hurley
Abstract: Contact resonance force microscopy (CR-FM) mapping provides a means of continuously tracking contact stiffness while scanning an AFM tip in contact with a substrate. Because the contact stiffness is a function of contact radius, tip wear leading to ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907208

97. Injection-level-dependent internal quantum efficiency and lasing in low-defect GaN nanowires
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/28/2011
Authors: John B Schlager, Norman A Sanford, Kristine A Bertness, Alexana Roshko
Abstract: Measurements of temperature-dependent and time-resolved photoluminescence (PL) on individual GaN nanowires revealed PL lifetimes and values of internal quantum efficiency (IQE) that increased with excitation fluence. With sufficient injection levels, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906136

98. Intercomparison between optical and x-ray scatterometry measurements of FinFET structures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/8/2013
Authors: Paul Lemaillet, Thomas Avery Germer, Regis J Kline, Daniel Franklin Sunday, Chengqing C. Wang, Wen-Li Wu
Abstract: In this paper, we present a comparison of profile measurements of vertical field effect transistor (FinFET) fin arrays by optical critical dimension (OCD) metrology and critical dimension small angle X-ray scattering (CD-SAXS) metrology. Spectroscopi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913230

99. Intermittent contact resonance atomic force microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/23/2014
Authors: Gheorghe Stan, Richard Swift Gates
Abstract: The intermittent contact resonance atomic force microscopy (ICR-AFM) mode proposed here is a new frequency modulation technique performed in scanning force controlled AFM modes like force volume or peak force tapping. It consists of tracking the chan ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914896

100. MEMS Kinematics by Super-Resolution Fluorescence Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/27/2012
Authors: Craig Dyer McGray, Samuel M Stavis, Joshua Giltinan, Eric Eastman, Samara L. Firebaugh, Jenelle Piepmeier, Jon C Geist, Michael Gaitan
Abstract: Super-resolution fluorescence microscopy is used for the first time to study the nanoscale kinematics of a MEMS device in motion across a surface. A device under test is labeled with fluorescent nanoparticles that form a microscale constellation of n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910908



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