NIST logo

Publications Portal

You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: date

Displaying records 11 to 20 of 130 records.
Resort by: Date / Title


11. Preparation of silver nanoparticle loaded cotton threads to facilitate measurement development for textile applications
Series: Special Publication (NIST SP)
Report Number: 1200-8
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/26/2015
Authors: Justin M Gorham, Karen E Murphy, Jingyu Liu, Dimitri Tselenchuk, Gheorghe Stan, Thao M. Nguyen, Richard D Holbrook, Michael R Winchester, Robert Francis Cook, Robert MacCuspie, Vincent A Hackley
Abstract: FOREWORD This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916567

12. Direct evidence of active and inactive phases of Fe catalyst nanoparticles for carbon nanotube formation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/1/2014
Authors: Stefano Mazzuccoo, Ying Wang, Mihaela M. Tanase, Matthieu C. Picher, Kai Li, Zhijian WU, Stephan Irle, Renu Sharma
Abstract: Iron and carbon interactions play an important role in various industrial processes such as steel manufacturing, liquid fuel the production by Fischer Tropsch process and carbon nanotube synthesis by chemical vapor deposition process. Interestingly, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914905

13. Mechanisms of aging and release from weathered nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/31/2014
Authors: Tinh Nguyen, Wendel Wohlleben, Li Piin Sung
Abstract: Polymer nanocomposites are increasingly used in outdoor structures. However, polymers are susceptible to degradation by solar ultraviolet (UV) radiation, which potentially releases nanofiller during polymer nanocomposites‰ life cycle. Such release ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915587

14. Nanoparticle size determination using optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/27/2014
Authors: Ravikiran Attota, Richard J Kasica, Premsagar Purushotham Kavuri, Hyeong Gon Kang, Lei NMN Chen
Abstract: We present a simple method for size determination of nanoparticles using conventional optical microscopes. The method, called through-focus scanning optical microscopy (TSOM), makes use of the four-dimensional optical information collected at differe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914209

15. Reliability of Low Temperature Grown Multi-Wall Carbon Nanotube Bundles Integrated as Vias in Monolithic Three-Dimensional Integrated Circuits
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/26/2014
Authors: Ann Chiaramonti Chiaramonti Debay, Sten Vollebregt, Aric Warner Sanders, Alexandra E Curtin, R. Ishihara, David Thomas Read
Abstract: In this extended abstract we present our recent results on the reliability testing of multi-wall carbon nanotube vertical interconnects (vias).
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915382

16. Attachment of a Reduction-Oxidative Active Diruthenium Compound to Au and Si Surfaces by ,ClickŠ Chemistry
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/10/2014
Authors: Sujitra Jeanie Pookpanratana, Joseph William Robertson, Curt A Richter, Christina Ann Hacker, Lee J Richter, Julia Savchenko, Steven Cummings, Tong Ren
Abstract: We report the formation of molecular monolayers containing redox-active diruthenium(II,III) compound to gold and silicon surfaces via ,clickŠ chemistry. The use of Cu-catalyzed azide-alkyne cycloaddition enables modular design of molecular surfa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914145

17. Resolving three-dimensional shape of sub-50 nm wide lines with nanometer-scale sensitivity using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/29/2014
Authors: Ravikiran Attota, Ronald G Dixson
Abstract: We experimentally demonstrate that the three-dimensional (3-D) shape variations of nanometer-scale objects can be resolved and measured with sub-nanometer scale sensitivity using conventional optical microscopes by analyzing 3-D optical data using th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908543

18. Dielectric characterization by microwave cavity perturbation corrected for non-uniform fields
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Nathan D Orloff, Jan Obrzut, Christian John Long, Thomas F. Lam, James C Booth, David R Novotny, James Alexander Liddle, Pavel Kabos
Abstract: The non-uniform fields that occur due to the slot in the cavity through which the sample is inserted and those due to the sample geometry itself decrease the accuracy of dielectric characterization by cavity perturbation at microwave frequencies. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915011

19. High-speed, high-purity separation of gold nanoparticle‹DNA origami constructs using centrifugation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/23/2014
Authors: Seung H. Ko, Luis Fernando Vargas Lara, Paul N. Patrone, Samuel M Stavis, Francis Starr, Jack F Douglas, James Alexander Liddle
Abstract: DNA origami is a powerful platform for assembling gold nanoparticle constructs, an important class of nanostructure with numerous applications. Such constructs are assembled by the association of complementary DNA oligomers. These association reactio ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915009

20. Pattern Transfer of Hydrogen Depassivation Lithography Patterns into Silicon with Atomically Traceable Placement and Size Control
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/17/2014
Authors: Josh Ballard, Stephen McDonnell, Don Dick, Maia Bischof, Joseph Fu, D Jaeger, James Owen , w Owen, Justin Alexander, Udi Fuchs, Pradeep Narayanan Namboodiri, Kai Li, John Randall, Robert Wallace, Yves Chabal, Richard Reidy, Richard M Silver
Abstract: Reducing the scale of etched nanostructures below the 10 nm range eventually will require an atomic scale understanding of the masks being used in order to maintain exquisite control over both feature size and feature density. Here, we demonstrate a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915583



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series