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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements Sorted by: date

Displaying records 11 to 20 of 162 records.
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11. Noise analysis for through-focus scanning optical microscopy method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2016
Author: Ravikiran Attota
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919393

12. Steady State Vapor Bubble in Pool Boiling
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2016
Authors: An Zou, Ashish Chanana, Amit Kumar Agrawal, Peter C. Wayner, Jr., Shalabh C. Maroo
Abstract: Boiling, a dynamic and multiscale process, has been studied for over five decades; however, a comprehensive understanding of the process is still lacking. The bubble ebullition cycle, which involves nucleation, growth and departure, happens over ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918948

13. Characterization of nanoparticle suspensions using single particle inductively coupled plasma mass spectrometry
Series: Special Publication (NIST SP)
Report Number: 1200-21
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2016
Authors: Karen E Murphy, Jingyu Liu, Antonio Rafael Montoro Bustos, Monique Erica Johnson, Michael R Winchester
Abstract: This NIST special publication (SP) is one in a series of NIST SPs that address research needs articulated in the National Nanotechnology Initiative (NNI) Environmental, Health, and Safety Research Strategy published in 2011 [1]. This Strategy identif ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919428

14. Polarity-Controlled GaN/AlN Nucleation Layers for Selective-Area Growth of GaN Nanowire Arrays on Si(111) Substrates by Molecular Beam Epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/18/2015
Authors: Matthew David Brubaker, Shannon M.M. Duff, Todd E Harvey, Paul T Blanchard, Alexana Roshko, Aric Warner Sanders, Norman A Sanford, Kristine A Bertness
Abstract: We have demonstrated dramatic improvement in the quality of selective-area GaN nanowire growth by controlling the polarity of the underlying nucleation layers. In particular, we find that N- polarity is beneficial for the growth of large ordered n ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917880

15. Subsurface Imaging of Ungrounded Metal Lines Embedded in Dielectric with the Scanning Microwave Microscope
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/17/2015
Authors: Lin You, Jungjoon Ahn, Yaw S Obeng, Joseph J Kopanski
Abstract: We demonstrate the ability of the scanning microwave microscope (SMM) to measure the subsurface location of ungrounded. 1.2-μm wide metal lines embedded in a dielectric film. The SMM was used to image Al-Si-Cu metal lines in a test chip that ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=916157

16. Radiative damping in wave guide based FMR measured via analysis of perpendicular standing spin waves in sputtered Permalloy films
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/17/2015
Authors: Thomas J Silva, Justin M Shaw, Hans Toya Nembach, Mathias Weiler, Martin Schoen
Abstract: The damping α of the spinwave resonances in 75 nm, 120 nm, and 200 nm -thick Permalloy films is measured via vector-network- analyzer ferromagnetic-resonance (VNA-FMR). Inductive coupling between the sample and the waveguide leads to an addi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=919208

17. Deep-subwavelength Nanometric Image Reconstruction using Fourier Domain Optical Normalization
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/5/2015
Authors: Jing Qin, Richard M Silver, Bryan M Barnes, Hui Zhou, Ronald G Dixson, Mark Alexander Henn
Abstract: Quantitative optical measurements of deep sub-wavelength, three-dimensional, nanometric structures with sensitivity to sub-nanometer details address an ubiquitous measurement challenge. A Fourier domain normalization approach is used in the Fourier ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914423

18. Detecting Carbon in Carbon: Application of Differential Charging to Obtain Information on the Chemical Identity and Spatial Location of Carbon Nanotube Aggregates in Composites by Imaging X-ray Photoelectron Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/24/2015
Authors: Justin M Gorham, William A Osborn, Jeremiah W Woodcock, Keana C K Scott, John Michael Heddleston, Angela R Hight Walker, Jeffrey W Gilman
Abstract: The surface contributions and dispersion properties of multiwalled carbon nanotubes (MWCNT) within a composite are important measurements to perform on nano-enabled products in order to help answer environmental health and safety questions associated ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918341

19. Orthogonal Analysis of Functional Gold Nanoparticles for Biomedical Applications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/11/2015
Authors: De-Hao D. Tsai, Yi-Fu Lu, Frank W DelRio, Tae Joon Cho, Suvajyoti S. Guha, Michael Russel Zachariah, Fan Zhang, Andrew John Allen, Vincent A Hackley
Abstract: We report a comprehensive strategy based on implementation of orthogonal measurement techniques to provide critical and verifiable material characteristics for functionalized gold nanoparticles (AuNPs) used in biomedical applications. Thiolated polye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918793

20. A method to determine the number of nanoparticles in a cluster using conventional optical microscopes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/10/2015
Authors: Hyeong G. Kang, Ravikiran Attota, Premsagar Purushotham Kavuri, Vipin Nagnath Tondare, Andras Vladar
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=918715



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