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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 171 to 180 of 211 records.
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171. Analysis of Au Nanoparticles by Electrospray Differential Mobility Analysis (ES-DMA)
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2010
Author: Rebecca A Zangmeister
Abstract: This document describes a protocol for size analysis of citrate stabilized gold nanoparticles of nominally 10 nm, 30 nm, and 60 nm sizes using electrospray differential mobility analysis (ES-DMA).  Nanoparticles are centrifuged to remove excess ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=832212

172. Nanomechanical Measurements and Tools
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/23/2010
Author: Robert Francis Cook
Abstract: Nanotechnology provides great opportunities for the development of advanced devices with enormous quality-of-life and economic benefits, with applications ranging from biomedical implantable actuators to environmental toxin detectors to infrastructur ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904862

173. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

174. Subsurface Characterization of Carbon Nanotubes in Polymer Composites via Quantitative Electric Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2010
Authors: Minhua Zhao, Xiaohong Gu, Sharon E. Lowther, Cheol Park, Jerry Jean, Tinh T. Nguyen
Abstract: In this study, quantitative Electric Force Microscopy (EFM) characterization of CNTs dispersed in free-standing polymer composite films is pursued. The effect of experimental parameters including humidity conditions, EFM probe geometry, tip-sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904262

175. A Flexible TiO2-Based Memristor
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2010
Authors: Nadine Emily Gergel-Hackett, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907110

176. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/18/2010
Authors: Ward L Johnson, Sudook A Kim, Roy Howard Geiss, Colm Flannery, Paul R Heyliger, Christopher L Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Abstract: Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903959

177. Nanoscale Measurements With the TSOM Optical Method
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/4/2010
Author: Ravikiran Attota
Abstract: A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904673

178. Transmission Electron Diffraction from nanoparticles, nanowires and thin films in an SEM using conventional EBSD equipment
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/1/2010
Authors: Roy Howard Geiss, Robert R Keller, David Thomas Read
Abstract: We describe a new scanning electron microscope (SEM) method for obtaining and analyzing the crystallographic structure and orientation in nanoparticles and ultrathin films using conventional electron backscatter diffraction (EBSD) equipment.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905080

179. Spray Deposited Poly-3-hexylthiophene Thin Film Transistors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/11/2009
Authors: Calvin Chan, Lee J Richter, David Germack, Brad Conrad, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905385

180. Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/5/2009
Authors: Daniel A Fischer, Saloman Turgman-Cohen, P K Kilpatrick, Jan Genzer
Abstract: The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903788



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