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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements
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Displaying records 141 to 150 of 208 records.
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141. High-Frequency Nanofluidics: A Universal Formulation of the Fluid Dynamics of MEMS and NEMS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/23/2010
Authors: Kamil L. Ekinci, V. Yakhot, Sukumar Rajauria, C. Colosqui, D. M. Karabacak
Abstract: A solid body undergoing oscillatory motion in a fluid generates an oscillating flow. Oscillating flows in Newtonian fluids were first treated by G.G. Stokes in 1851. Since then, this problem has attracted much attention, mostly due to its technologic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904957

142. Fractionation and Characterization of Gold Nanoparticles in Aqueous Solution: Asymmetric-Flow Field Flow Fractionation with MALS, DLS and UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/30/2010
Authors: Tae Joon Cho, Vincent A Hackley
Abstract: Asymmetrical-flow field flow fractionation (AFFF) separates constituents based on hydrodynamic size, and is emerging as a powerful tool for obtaining high-resolution information on the size, molecular weight, composition, and stability of nanoscale p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905979

143. Separation and Metrology of Nanoparticles by Nanofluidic Size Exclusion
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/11/2010
Authors: Samuel M Stavis, Jon C Geist, Michael Gaitan
Abstract: A nanofluidic approach to the separation and metrology of nanoparticles is demonstrated. Advantages of this approach include nanometer-scale resolution, nanometer-scale to submicrometer-scale range, mitigation of hydrodynamic and diffusional limitat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904215

144. Carbon nanotube applications to scanning probe microscopy for next generation semiconductor metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2010
Authors: Victor H. Vartanian, Paul McClure, Vladimir Mancevski, Joseph J Kopanski, Phillip D. Rack, Ilona Sitnitsky, Matthew D. Bresin, Vincent LaBella, Kathleen Dunn
Abstract: This paper presents an evaluation of e-beam assisted deposition and welding of conductive carbon nanotube (c-CNT) tips for electrical scanning probe microscope measurements. Variations in CNT tip conductivity and contact resistance during fabrication ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907033

145. Purification Chemical Structure Electrical Property Relationship in Gold Nanoparticle Liquids
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/1/2010
Authors: Robert I. MacCuspie, Andrea M Elsen, Steve J Diamanti, Steve T Patton, Igor Altfeder, J. David Jacobs, Andrey A Voevodin, Richard A Vaia
Abstract: Macroscopic assemblies of nanoparticles are a new class of materials that exhibit unique properties compared to both bulk and isolated nanoparticle states. To more accurately probe the structure-property relationships of these materials, this report ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903692

146. Statistics of Camera-Based Single-Particle Tracking
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/22/2010
Author: Andrew J. Berglund
Abstract: Through analysis of digital images, camera-based single-particle tracking enables quantitative determination of transport properties of nanoparticles and molecules and provides nanoscale information about material properties such as viscosity and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905460

147. Shell and ligand-dependent blinking of CdSe-based core/shell nanocrystals
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/7/2010
Authors: Bonghwan Chon, Sung Jun Lim, Wonjung Kim, Hyeong Gon Kang, Taiha Joo, Jeeseong Hwang, Seung Koo Shin
Abstract: Blinking of zinc blende CdSe-based core/shell nanocrystals is studied as a function of shell materials and surface ligands. CdSe/ZnS, CdSe/ZnSe/ZnS and CdSe/CdS/ZnS core/shell nanocrystals are prepared by colloidal synthesis and six monolayers of lar ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903812

148. Switching in Flexible Titanium Oxide Memristors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/25/2010
Authors: Joseph Leo Tedesco, Nadine Emily Gergel-Hackett, Laurie A. Stephey, Christina Ann Hacker, Curt A Richter
Abstract: In this study, memristors were fabricated on flexible polyethylene terephthalate (PET) substrates with aluminum contacts and a titanium dioxide film formed with a sol-gel of titanium isopropoxide and ethanol. To study the electric field dependence of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906392

149. Advanced Nanoscale Elastic Property Measurement by Contact-Resonance Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: In atomic force microscopy (AFM)-based techniques, material information (topography, mechanical, electrical, magnetic, etc.) is retrieved from the nanoscale interaction between the AFM tip and the material probed. As the size of the apex of the AFM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905459

150. Quartz Crystal Microbalances for Microscale Thermogravimetric Analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/20/2010
Authors: Elisabeth Mansfield, Aparna Kar, Stephanie A Hooker
Abstract: A new method for analyzing the chemical purity and consistency of microscale samples is described using a quartz crystal microbalance (QCM) sensor platform. The QCM is used to monitor sub-picogram changes in the mass of a deposited thin film as a fu ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905333



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