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Displaying records 91 to 100 of 132 records.
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91. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

92. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Madelaine Herminia Hernandez, Andrew A Herzing, Lee J Richter, Christina Ann Hacker, Joseph J Kopanski, Jan Obrzut, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908437

93. TSOM Method for Semiconductor Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/18/2011
Authors: Ravikiran Attota, Ronald G Dixson, John A Kramar, James Edward Potzick, Andras Vladar, Benjamin D. Bunday, Erik Novak, Andrew C. Rudack
Abstract: Through-focus scanning optical microscopy (TSOM) is a new metrology method that achieves 3D nanoscale measurement resolution using conventional optical microscopes; measurement sensitivities are comparable to what is typical using Scatterometry, SEM ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908177

94. Silicon-based Molecular Electronics in the Post-Hype Era
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/8/2011
Author: Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908431

95. Flexible Memristors: Fabrication and Characterization for Electronics Applications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Jan Obrzut, Joseph J Kopanski, Christina Ann Hacker, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908436

96. Conduction and Loss Mechanisms in Flexible Oxide-Based Memristors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/21/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Andrew A Herzing, Madelaine Herminia Hernandez, Christina Ann Hacker, Jan Obrzut, Lee J Richter, Curt A Richter
Abstract: In order to study the conduction and loss mechanisms behind their operation, flexible sol-gel based memristors were fabricated with differing oxide film thicknesses and device sizes. XPS, TEM, EELS, and VASE measurements indicated the oxide was amor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908435

97. Challenges for Physical Characterization of Silver Nanoparticles Under Pristine and Environmentally Relevant Conditions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/17/2011
Authors: Robert I. MacCuspie, Kim Rogers, Manomita Patra, Zhiyong Suo, Andrew John Allen, Matthew N. Martin, Vincent A Hackley
Abstract: The conditions used to disperse silver nanoparticles (AgNPs) strongly impact their resulting size measurements and agglomeration state, based on the underlying metrology and physical chemistry, respectively. A series of AgNP materials with reported ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907651

98. Electron beam heating effects during ESEM imaging of water condensation on superhydrophobic surfaces
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/1/2011
Authors: Konrad Rykaczewski, John Henry j Scott, Andrei G. Fedorov
Abstract: Nanostructured superhydrophobic surfaces show promise as promoters of dropwise condensation and may lead to significant efficiency improvements in numerous industrial processes. Droplets with diameters below ~10 µm account for the majority of the he ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907573

99. Injection-level-dependent internal quantum efficiency and lasing in low-defect GaN nanowires
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/28/2011
Authors: John B. Schlager, Norman A Sanford, Kristine A Bertness, Alexana Roshko
Abstract: Measurements of temperature-dependent and time-resolved photoluminescence (PL) on individual GaN nanowires revealed PL lifetimes and values of internal quantum efficiency (IQE) that increased with excitation fluence. With sufficient injection levels, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906136

100. Dispersion Stability of Nanoparticles in Ecotoxicological Investigations: A Comparison of Different Techniques
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/26/2011
Authors: Ratna Tantra, Shingheng Jing, Siva Kaliyappan, Nicholas Walker, James Noble, Vincent A Hackley
Abstract: One of the main challenges in nanoecotoxicological investigations is in the selection of the most suitable measurement methods and protocols for nanoparticle characterisation. Several parameters have been identified as being important as they govern ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906180



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