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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 71 to 80 of 122 records.
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71. Measuring silver nanoparticle dissolution in complex biological and environmental matrices using UV-Visible absorbance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/2/2011
Authors: Justin M Zook, Stephen E Long, Danielle Cleveland, Carly Lay Geronimo, Robert I. MacCuspie
Abstract: Distinguishing the toxic effects of nanoparticles (NPs) themselves from the well-studied toxic effects of their ions is a critical but challenging measurement for nanotoxicity studies and regulation. This measurement is especially difficult for silv ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907804

72. O2 A-band line parameters to support atmospheric remote sensing. Part II: The rare isotopologues
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/21/2011
Authors: Joseph Terence Hodges, David A Long, Daniel K Havey, S. S. Yu, M Okumura, Charles E Miller
Abstract: Frequency-stabilized cavity ring-down spectroscopy (FS-CRDS) was employed to measure over 100 transitions in the R-branch of the b1Σg+←X3Σg-(0,0) band for the rare O2 isotopologues. The use of 17O- and 18O-enriched mixtures allowed fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907932

73. Dimensional Analysis of Through Silicon Vias Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/12/2011
Authors: Ravikiran Attota, Andrew Rudack
Abstract: There is a great need for accurate, truly-3D metrology solutions that can be used for analysis of high aspect ratio features such as through-silicon-vias (TSVs). Through-focus scanning optical microscopy (TSOM) is an optical metrology method that pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909226

74. Evaluating the characteristics of multiwall carbon nanotubes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/1/2011
Authors: John H Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
Abstract: During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907346

75. Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/28/2011
Authors: Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John Henry j Scott
Abstract: In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908006

76. Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/28/2011
Authors: De-Hao D. Tsai, Melissa Davila-Morris, Frank W DelRio, Suvajyoti S. Guha, Vincent A Hackley, Michael R Zachariah
Abstract: Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907586

77. Imaging of nanoscale charge transport in bulk heterojunction solar cells
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/17/2011
Authors: Behrang H Hamadani, Nadine Emily Gergel-Hackett, Paul M Haney, Nikolai B Zhitenev
Abstract: We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905890

78. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

79. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

80. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272



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