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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 71 to 80 of 206 records.
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71. Summary Report of Research on TiO2 Nanomaterial
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/3/2012
Author: Vincent A Hackley
Abstract: Report summarizes study whose purpose was to optimize and validate a standardized and reproducible approach for the preparation of TiO2 nanoparticle dispersions in relevant biological and environmental test media, using an industrially relevant powde ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912219

72. Electro-Mechanical Properties of Graphene Drumheads
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Nikolai Nikolayevich Klimov, Suyong S. Jung, Shuze Zhu, Teng Li, C. Alan Wright, Santiago Solares, David B Newell, Nikolai B Zhitenev, Joseph A Stroscio
Abstract: The electro-mechanical properties of a suspended graphene layer are determined by scanning tunneling microscopy (STM) and spectroscopy (STS) measurements and computational simulations of the graphene membrane mechanics and morphology. The graphene ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910689

73. Photo-induced Surface Transformation of Silica Nanocomposites
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/22/2012
Authors: Justin M Gorham, Tinh Nguyen, Coralie Bernard, Deborah L Stanley, Richard D Holbrook
Abstract: The physicochemical, UV-induced surface modifications to silica nanoparticle (SiNP) - epoxy composites have been investigated. The silica nanocomposites (SiNCs) were prepared using a two-part epoxy system with 10 % mass fraction of SiNPs and expose ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910637

74. Preparation of Nanoparticle Dispersions from Powdered Material Using Ultrasonic Disruption
Series: Special Publication (NIST SP)
Report Number: 1200-2
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910680

75. Preparation of Nanoscale TiO2 Dispersions in Biological Test Media for Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-4
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910683

76. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910684

77. Preparation of a Nanoscale TiO2 Aqueous Dispersion for Toxicological or Environmental Testing
Series: Special Publication (NIST SP)
Report Number: 1200-3
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910682

78. Reporting Guidelines for the Preparation of Aqueous Nanoparticle Dispersions from Dry Materials
Series: Special Publication (NIST SP)
Report Number: 1200-1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/19/2012
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910681

79. Nanoparticle Size and Shape Evaluation Using the TSOM Method
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2012
Authors: Bradley N Damazo, Ravikiran (Ravikiran) Attota, Premsagar Purushotham Kavuri, Andras Vladar
Abstract: A novel through-focus scanning optical microscopy (TSOM) method that yields nanoscale information from optical images obtained at multiple focal planes will be used here for nanoparticle dimensional analysis. The TSOM method can distinguish not only ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911138

80. Quantitative Viscoelastic Mapping of Polyolefin Blends with Contact Resonance Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/9/2012
Authors: Dalia Yablon, Anil Gannepalli, Roger Proksch, Jason Philip Killgore, Donna C. Hurley, Andy Tsou
Abstract: The storage modulus (E') and loss modulus (E") of polyolefin blends have been mapped on the nanoscale with contact resonance force microscopy (CR-FM), a dynamic contact mode of atomic force microscopy (AFM). CR-FM maps for a blend of polyethylene, po ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909881



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