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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 31 to 40 of 211 records.
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31. PEGylated Gold Nanorod Separation and Characterization by Asymmetric Field Flow Fractionation Based on Aspect Ratio with UV-Vis Detection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/5/2013
Authors: Thao Minh Nguyen, Julien C. Gigault, Vincent A Hackley
Abstract: The development of highly efficient asymmetric-flow field flow fractionation (A4F) methodology for biocompatible PEGylated gold nanorods (GNR) without the need for surfactants in the mobile phase is presented. We report on the potential of A4F for r ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914165

32. Temperature-Programmed Electrospray-Differential Mobility Analysis for Characterization of Ligated Nanoparticles in Complex Media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/12/2013
Authors: De-Hao D. Tsai, Frank W DelRio, John M Pettibone, Pin Ann Lin, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: In this study, an electrospray-differential mobility analyzer (ES-DMA) was operated with an aerosol flow-mode, temperature-programmed approach to enhance its ability to characterize the particle size distributions (PSDs) of nanoscale particles (NPs) ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913860

33. Through-focus scanning optical microscopy for defect inspection of EUV masks
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/12/2013
Authors: Ravikiran Attota, Vibhu Jindal
Abstract: The TSOM method provides three-dimensional nanoscale metrology using a conventional optical microscope. Substantial improvements in defect detectability using the TSOM method will be presented. The TSOM method shows potential to (i) detect phase defe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914027

34. Electric Field Tuning of the Surface Band Structure of Topological Insulator Sb2Te3 Thin Films
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/30/2013
Authors: Joseph A Stroscio, Jeonghoon Ha, Niv Levy, Young Kuk, Tong Zhang
Abstract: We studied the response of the surface state spectrum of epitaxial Sb2Te3 thin films to applied gate electric fields by low temperature scanning tunneling microscopy. The gate dependence of the shift in the Fermi level and screening effect from bulk ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913706

35. Thermoelectric imaging of structural disorder in epitaxial graphene
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/14/2013
Authors: Sanghee Cho, Stephen Dongmin Kang, Wondong Kim, Eui-Sup Lee, Sung-Jae Woo, Ki-Jeong Kong, Ilyou Kim, Hyeong-Do Kim, Tong Zhang, Joseph A Stroscio, Yong-Hyun Kim, Ho-Ki Lyeo
Abstract: Many structural defects and strain fields develop during the preparation of thin films and nanostructures, with their origins being at the atomic level1,2. Sensitively detecting these subtle features with high sensitivity and resolution, and their in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912752

36. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2013
Authors: Ravikiran Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353

37. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5r1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/3/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913712

38. A standardized approach for the dispersion of titanium dioxide nanoparticles in biological media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: We describe a comprehensive optimization study culminating in a standardized and validated approach for the preparation of titanium dioxide (TiO2) nanoparticle dispersions in relevant biological media (PBS and DMEM-FBS). This study utilizes a candida ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909777

39. ,Real-worldŠ precision, bias, and between-laboratory variation for surface area measurement of a titanium dioxide nanomaterial in powder form
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Vincent A Hackley, Aleksandr B. Stefaniak
Abstract: Accurate characterization of nanomaterial properties is a critical component of any nanotoxicology testing strategy. Data that describes the performance of various laboratories to measure the characteristics of the same nanomaterial is scarce. We c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912937

40. Nanofluidic Entropophoresis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Samuel M Stavis, Elizabeth A Strychalski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913873



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