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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 31 to 40 of 208 records.
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31. Electric Field Tuning of the Surface Band Structure of Topological Insulator Sb2Te3 Thin Films
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/30/2013
Authors: Joseph A Stroscio, Jeonghoon Ha, Niv Levy, Young Kuk, Tong Zhang
Abstract: We studied the response of the surface state spectrum of epitaxial Sb2Te3 thin films to applied gate electric fields by low temperature scanning tunneling microscopy. The gate dependence of the shift in the Fermi level and screening effect from bulk ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913706

32. Thermoelectric imaging of structural disorder in epitaxial graphene
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/14/2013
Authors: Sanghee Cho, Stephen Dongmin Kang, Wondong Kim, Eui-Sup Lee, Sung-Jae Woo, Ki-Jeong Kong, Ilyou Kim, Hyeong-Do Kim, Tong Zhang, Joseph A Stroscio, Yong-Hyun Kim, Ho-Ki Lyeo
Abstract: Many structural defects and strain fields develop during the preparation of thin films and nanostructures, with their origins being at the atomic level1,2. Sensitively detecting these subtle features with high sensitivity and resolution, and their in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912752

33. Critical dimension metrology by through-focus scanning optical microscopy beyond the 22 nm node
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/7/2013
Authors: Ravikiran (Ravikiran) Attota, Benjamin D. Bunday, Victor Vertanian
Abstract: We present results using simulations and experiments to demonstrate metrological applications of the through-focus scanning optical microscopy (TSOM) down to features at and well below the International Technology Roadmap for Semiconductors' 22  ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913353

34. Preparation of Nanoscale TiO2 Dispersions in an Environmental Matrix for Eco-Toxicological Assessment
Series: Special Publication (NIST SP)
Report Number: 1200-5r1
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/3/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: Toxicity and fate assessment are key elements in the evaluation of the environmental, health and safety risks of engineered nanomaterials (ENMs). While significant effort and resources have been devoted to the toxicological evaluation of many ENMs, i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913712

35. A standardized approach for the dispersion of titanium dioxide nanoparticles in biological media
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R Wiesner
Abstract: We describe a comprehensive optimization study culminating in a standardized and validated approach for the preparation of titanium dioxide (TiO2) nanoparticle dispersions in relevant biological media (PBS and DMEM-FBS). This study utilizes a candida ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909777

36. ,Real-worldŠ precision, bias, and between-laboratory variation for surface area measurement of a titanium dioxide nanomaterial in powder form
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/1/2013
Authors: Vincent A Hackley, Aleksandr B. Stefaniak
Abstract: Accurate characterization of nanomaterial properties is a critical component of any nanotoxicology testing strategy. Data that describes the performance of various laboratories to measure the characteristics of the same nanomaterial is scarce. We c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912937

37. Nanofluidic Entropophoresis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Samuel M Stavis, Elizabeth A Strychalski
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913873

38. Size-independent effects on nanoparticle retention behavior in asymmetric flow field-flow fractionation
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/29/2013
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: In this work we highlight the size-independent influence of the material properties of nanoparticles on their retention behavior in asymmetric-flow field-flow fractionation (A4F). The phenomena described here suggest there are limits to the effec ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913433

39. General Analysis of Microwave Network Scattering Parameters for Characterization of Thin Film Material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2013
Author: Jan Obrzut
Abstract: A general solution of the linear passive microwave network is presented, for the characterization of thin film materials at high microwave frequencies. The mathematical formulas that correlate scattering parameters S11 and S21 with the distributed ci ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910675

40. ,Just Add WaterŠ ‹ ,InstantŠ singly-dispersed suspensions of silver nanoparticles on demand.
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/20/2013
Author: Robert I. MacCuspie
Abstract: The intrinsic instability of silver nanoparticles (AgNPs) is a substantial challenge to achieving stable long-term storage for on-demand use of AgNPs. Here, a ,Just Add WaterŠ approach is presented for achieving suspensions of principally singly ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913470



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