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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 21 to 30 of 130 records.
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21. Non-contact Conductance Measurement of Nanosize Objects using Reasonant Cavity
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Jan Obrzut, Nathan D Orloff, Oleg A Kirillov
Abstract: A cavity perturbation method is used to determine conductance of small volume nano-carbon materials. These are the building blocks of nanostructured materials and devices, and therefore their electrical characteristics are important in the materials ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914908

22. Single molecule confocal fluorescence lifetime correlation spectroscopy for accurate nanoparticle size determination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/15/2014
Authors: Bonghwan B. Chon, Kimberly A Briggman, Jeeseong Hwang
Abstract: We report on an experimental procedure in confocal single molecule fluorescence lifetime correlation spectroscopy (FLCS) to determine the range of excitation power and molecule concentration in solution under which the application of an unmodified ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914381

23. 2013 ITRS Metrology Roadmap
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2014
Authors: Alain C. Diebold, Ndubuisi George Orji
Abstract: In 2013 the ITRS Metrology Technical Working Group worked on updating the text and tables of the metrology chapter. New additions include a section on 3D nanometrology, a revised lithography metrology table, and an updated Interconnect section. The d ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915891

24. Establishing an upper bound on contact resistivity of ohmic contacts to n-GaN nanowires
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/1/2014
Authors: Paul Timothy Blanchard, Kristine A Bertness, Todd E Harvey, Norman A Sanford
Abstract: Contact resistivity {rho}^dc^ is an important figure of merit in evaluating and improving the performance of electronic and optoelectronic devices. Due to the small size, unique morphology, and uncertain transport properties of semiconductor nano ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914876

25. Storage Wars: How citrate capped silver nanoparticle suspensions are affected by not-so-trivial decisions
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/21/2014
Authors: Justin M Gorham, Anne B Rohlfing, Katrice A Lippa, Robert I. MacCuspie, Amy Hemmati, Richard D Holbrook
Abstract: A critical but often overlooked component of silver nanoparticle (AgNPs) suspensions involves their behavior following short- and long-term storage. The current study investigates the integrity of citrate-capped AgNP suspensions, nominally 20 nm in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913638

26. Controlled Formation and Characterization of Dithiothreitol-Conjugated Gold Nanoparticle Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/5/2014
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Justin M Gorham, Jiwen Zheng, Jiaojie Tan, Michael Russel Zachariah, Vincent A Hackley
Abstract: We report a systematic study of the controlled formation of discrete-size gold nanoparticle clusters (GNCs) by interaction with the reducing agent dithiothreitol (DTT). Asymmetric-flow field flow fractionation and electrospray differential mobility a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915014

27. Determination of nanoparticle surface coatings and nanoparticle Purity using microscale thermogravimetric analysis analysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/8/2014
Authors: Elisabeth Mansfield, Christopher Michael Poling, Jenifer L. (Jenifer) Blacklock, Katherine M Tyner
Abstract: The use of nanoparticles in some applications (i.e., nanomedical, nanofiltration or nanoelectronic) requires small-scale samples with well-known purities and composition. In addition, when nanoparticles are introduced into complex environments ( ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914528

28. Development of a conceptual framework for evaluation of nanomaterials release from nanocomposites: environmental and toxicological implications
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/2/2014
Authors: Jame Ging, Raul Tejerina-Anton, Girish Ramakrishnan, Mark Nielsen, Kyle Murphy, Justin M Gorham, Tinh Nguyen, Alexander Orlov
Abstract: Despite the fact that nanomaterials are considered potentially hazardous in a freely dispersed form, they are often considered safe when encapsulated into a polymer matrix. However, systematic research to confirm the abovementioned paradigm is lackin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914575

29. Assembly and evaluation of a pyroelectric detector bonded to vertically aligned multiwalled carbon nanotubes over thin silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/20/2013
Authors: John H Lehman, Evangelos Theocharous, Savva Theocharous
Abstract: A novel pyroelectric detector consisting of a vertically aligned nanotube array on thin silicon (VANTA/Si) bonded to a 60 μm thick crystal of LiTaO^d3^ has been fabricated. The performance of the VANTA/Si-coated pyroelectric detector was evaluat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914408

30. Atom probe tomography evaporation behavior of C-axis GaN nanowires: Crystallographic, stoichiometric, and detection efficiency aspects
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2013
Authors: Norman A Sanford, David R Diercks, Brian Gorman, R Kirchofer, Kristine A Bertness, Matthew David Brubaker
Abstract: The field evaporation behavior of c-axis GaN nanowires was explored in two different laser-pulsed atom probe tomography (APT) instruments. Transmission electron microscopy imaging before and after atom probe tomography analysis was used to assist in ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=915760



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