NIST logo

Publications Portal

You searched on:
Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 161 to 170 of 188 records.
Resort by: Date / Title


161. Fabrication with Flip-Chip Lamination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, MRSEC surface physics colloquium, University of Maryland, College Park, 10-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907072

162. Enhanced Spatial Resolution Scanning Kelvin Force Microscopy Using Conductive Carbon Nanotube Tips
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/5/2009
Authors: Joseph J Kopanski, Paul McClure, Vladimir Mancevski
Abstract: The response of a scanning Kelvin force microscope (SKFM) was measured with conventional micromachined silicon tips coated with Au and with advanced tips terminated with a carbon nanotube (CNT). A simple model of the SKFM predicts enhanced spatial re ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903125

163. Frontiers of Characterization and Metrology for Nanoelectronics: 2009
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/5/2009
Authors: David G Seiler, Alain C. Diebold, Robert McDonald, C. Michael Garner, Dan Herr, Rajinder P. Khosla, Erik M Secula
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904357

164. Size Measurement of Nanoparticles using Atomic Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2009
Authors: Jaroslaw Grobelny, Frank W DelRio, Pradeep Narayanan Namboodiri, Doo-In Kim, Vincent A Hackley, Robert Francis Cook
Abstract: In this assay protocol, procedures for dispersing gold nanoparticles on various surfaces such that they are suitable for imaging and height measurement via intermittent contact mode AFM are first described. The procedures for AFM calibration and ope ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854085

165. First approaches to standard protocols and reference materials for the assessment of potential hazards associated with nanomaterials
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/19/2009
Authors: Iseult Lynch, Hans Bouwmeester, Hans Marvin, Alan Casey, Gordon Chambers, Markus Berges, Martin Clift, Teresa Fernandes, Lise Fjellsbo, Lucienne Juillerat, Gert Roebben, Christoph Klein, Qinglan Wu, Vincent A Hackley, Jean-Pierre Kaiser, Wolfgang Kreyling, C. Michael Garner, Peter Hatto, Kenneth Dawson, Michael Riediker
Abstract: This report presents the outcome of the discussions of 60 experts in the field of safety assessment of manufactured NMs from academia, industry, government and non-profit organizations on some of the critical issues pertaining to the development of s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902692

166. Elastic modulus of low-k dielectric thin films measured by load-dependent contact-resonance atomic force microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 9/14/2009
Authors: Gheorghe Stan, Sean King, Robert Francis Cook
Abstract: Correlated force and contact-resonance versus displacement responses have been resolved using load-dependent contact-resonance atomic force microscopy (AFM) to determine the elastic modulus of low-k dielectric thin films. The measurements consisted ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902329

167. Nanoscale Photoresponse in Blended Organic Photovoltaics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/16/2009
Authors: Behrang H Hamadani, Suyong S. Jung, Nikolai B Zhitenev
Abstract: Organic solar cells, which have attracted considerable interest over the last few years as low-cost, simply-processed alternatives for harvesting the solar energy, have interesting nanoscale properties; a thorough understanding of which is currently ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902275

168. ENABLING STANDARDS FOR NANOMATERIAL CHARACTERIZATION
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 8/13/2009
Authors: Vincent A Hackley, Martin Fritts, James F Kelly, Anil K. Patri, Alan F. Rawle
Abstract: A two-day international workshop was convened recently in order to scope out and address the urgent need for standards to accurately characterize the physico-chemical and biological properties of engineered nanomaterials. These standards are needed b ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902370

169. Raman and electron microscopy analysis of carbon nanotubes exposed to high power laser irradiance
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/5/2009
Authors: John H Lehman, Christopher L Cromer, Krishna Ramadurai, Roop Mahajan, Anne Dillon
Abstract: High power laser radiometry requires efficient and damage-resistant detectors. The current study explores the evolving nature of carbon nanotube coatings for such detectors upon their exposure to incrementally increasing laser power levels. Electron ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901094

170. Reference Metrology in a Research Fab: The NIST Clean Calibrations Thrust
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/12/2009
Authors: Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Thomas B Renegar, Xiaoyu A Zheng, Theodore Vincent Vorburger, Albert M. Hilton, Marc J Cangemi, Lei Chen, Michael A. Hernandez, Russell E Hajdaj, Michael R Bishop, Aaron Cordes
Abstract: In 2004, the National Institute of Standards and Technology (NIST) commissioned the Advanced Measurement Laboratory (AML) ‹ a state-of-the-art, five-wing laboratory complex for leading edge NIST research. The NIST NanoFab ‹ a 1765 m2 (19,000 ft2) cl ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902187



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series