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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 161 to 170 of 198 records.
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161. Subsurface Characterization of Carbon Nanotubes in Polymer Composites via Quantitative Electric Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2010
Authors: Minhua Zhao, Xiaohong Gu, Sharon E. Lowther, Cheol Park, Jerry Jean, Tinh Nguyen
Abstract: In this study, quantitative Electric Force Microscopy (EFM) characterization of CNTs dispersed in free-standing polymer composite films is pursued. The effect of experimental parameters including humidity conditions, EFM probe geometry, tip-sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904262

162. A Flexible TiO2-Based Memristor
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/2/2010
Authors: Nadine Emily Gergel-Hackett, Joseph Leo Tedesco, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907110

163. Elastic constants and dimensions of imprinted polymeric nanolines determined from Brillouin light scattering
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/18/2010
Authors: Ward L Johnson, Sudook A Kim, Roy Howard Geiss, Colm Flannery, Paul R Heyliger, Christopher L Soles, Wen-Li Wu, Chengqing C. Wang, Christopher M Stafford, B D. Vogt
Abstract: Elastic constants and cross-sectional dimensions of imprinted nanolines of poly(methyl methacrylate) (PMMA) on silicon are determined nondestructively from finite-element inversion analysis of dispersion curves of hypersonic acoustic modes of these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903959

164. Nanoscale Measurements With the TSOM Optical Method
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/4/2010
Author: Ravikiran (Ravikiran) Attota
Abstract: A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904673

165. Transmission Electron Diffraction from nanoparticles, nanowires and thin films in an SEM using conventional EBSD equipment
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/1/2010
Authors: Roy Howard Geiss, Robert R Keller, David Thomas Read
Abstract: We describe a new scanning electron microscope (SEM) method for obtaining and analyzing the crystallographic structure and orientation in nanoparticles and ultrathin films using conventional electron backscatter diffraction (EBSD) equipment.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905080

166. Spray Deposited Poly-3-hexylthiophene Thin Film Transistors
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/11/2009
Authors: Calvin Chan, Lee J Richter, David Germack, Brad Conrad, Daniel A Fischer, Dean M DeLongchamp, David J Gundlach
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905385

167. Asphaltene Adsorption onto Self-Assembled Monolayers of Alkyltrichlorosilanes of Varying Chain Length
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/5/2009
Authors: Daniel A Fischer, Saloman Turgman-Cohen, P K Kilpatrick, Jan Genzer
Abstract: The adsorption of asphaltenes onto flat silica surfaces modified with self-assembled monolayers (SAMs) of alkyltrichlorosilanes of varying thickness due to a variable number of carbon atoms (NC) has been studied by means of contact angle measurements ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903788

168. Electrical Characterization of Soluble Anthradithiophene Derivatives
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/19/2009
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, John E Anthony, David J Gundlach
Abstract: Organic semiconductors remain an active subject for device physics and material science because of their varied electrical properties and potential for low-cost, high-throughput roll-to-roll processing. Several high-mobility oligomers, such as pen ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905388

169. Fabrication with Flip-Chip Lamination
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/15/2009
Authors: Mariona Coll Bau, Curt A Richter, Christina Ann Hacker
Abstract: Fabrication with Flip-Chip Lamination , Mariona Coll, DR Hines, CA Richter, CA Hacker, Nanotechnology colloquium, Wake Forest University, 11-09.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907071

170. A Benchmark Study on the Thermal Conductivity of Nanofluids
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/13/2009
Authors: Jacopo Buongiorno, David Venerus, Naveen Prabhat, Thomas McKrell, Jessica Townsend, Rebecca Christianson, Yuriy Tolmachev, Pawel Keblinski, Lin-wen Hu, Jorge Alvarado, In Cheol Bang, Sandra Bishnoi, Marco Bonetti, Frank Botz, Anselmo Cecre, Yun Chang, Gang Chen, Haisheng Chen, Sung Jae Chung, Minking Chyu, Sarit Das, Roberto Di Paola, Yulong Ding, F. Dubois, Grzegorz Dzido, Jacob Eapen, Werner Escher, Denis Funfschilling, Quentin Galand, Jinwei Gao, Patricia Gharagozloo, Kenneth Goodson, Jorge Gustova Jin, Haiping Hong, Mark Horton, Carlo Iorio, Andrzej Jarzebski, Yiran Jiang, L.W. Jin, Stephan Kabelac, Aravind Kamath, Mark A Kedzierski, Chongyoup Kim, Ji Hyun Kim, Sukwon Kim, Lim Geok Kieng, K Leong, Indranil Manna, Bruno Michel, Rui Ni, Hrishikesh Patel, John Philip, Dimos Poulikakos, Cecile Reynaud, Raffaele Savino, Pawan Singh, Pengxiang Song, T. Sundararajan, Elena Timofeeva, Todd Tritcak, A.N. Turanov, Stefan Van Vaerenbergh, Dongsheng Wen, Sanjeeva Witharana, Charles Chun Yang, W.-H. Yeh, Xiao-Zheng Zhao, Sheng-Qi Zhou
Abstract: This article reports on the International Nanofluid Property Benchmark Exercise (INPBE) in which the thermal conductivity of identical samples of colloidal dispersions of nanoparticles, or nanofluids , was measured by over 30 organizations worldwi ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902860



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