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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 131 to 140 of 209 records.
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131. Microscale thermogravimetric analysis for determining nanoparticle purity and surface coverage
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/1/2011
Author: Elisabeth Mansfield
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907735

132. Thermogravimetric analysis of NIST's single-wall carbon nanotube reference material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/25/2011
Authors: Elisabeth Mansfield, Stephanie A Hooker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907746

133. PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260

134. An interferometric platform for studying AFM probe deflection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/3/2011
Authors: Jon Robert Pratt, Lee Kumanchik, Tony L. Schmitz
Abstract: This paper describes an interferometric platform for measuring the full-field deflection of atomic force microscope (AFM) probes and generic cantilevers during quasi-static loading. The platform consists of a scanning white light interferometer (SWLI ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904035

135. A 10 mK Scanning Probe Microscopy Facility
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/29/2010
Authors: Young J. Song, Alexander F. Otte, Steven R Blankenship, Alan H. Band, Frank Mori Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A Stroscio
Abstract: We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV) co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906211

136. Ultrasonic Dispersion of Nanoparticles for Environmental, Health and Safety Assessment--Issues and Recommendations
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/30/2010
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R. Wiesner
Abstract: A common approach for the study of the environmental and biological interactions of nanomaterials relies on the ultrasonic disruption of powders to obtain nanoparticle suspensions. Yet, the widespread and inconsistent use of ultrasonic treatment acro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905978

137. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

138. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854

139. The Stability and Surface Coverage of Polymer Stabilized Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/2/2010
Authors: Karl B Sebby, Elisabeth Mansfield
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906334

140. Characterization of a Soluble Anthradithiophene Derivative
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R Parkin, Xinran Zhang, John E Anthony, David J Gundlach
Abstract: The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905704



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