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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 111 to 120 of 188 records.
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111. Thermogravimetric analysis of NIST's single-wall carbon nanotube reference material
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/25/2011
Authors: Elisabeth Mansfield, Stephanie A Hooker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907746

112. PREPARATION OF A NANOSCALE TiO2 AQUEOUS DISPERSION FOR TOXICOLOGICAL OR ENVIRONMENTAL TESTING
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/24/2011
Authors: Julian S. Taurozzi, Vincent A Hackley
Abstract: This work prescribes the preparation of a P25 nanoparticle dispersion in high purity deionized water, as a first step towards the preparation of nanoscale P25 dispersions in relevant biological and environmental matrices. This protocol should be used ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907260

113. An interferometric platform for studying AFM probe deflection
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/3/2011
Authors: Jon Robert Pratt, Lee Kumanchik, Tony L. Schmitz
Abstract: This paper describes an interferometric platform for measuring the full-field deflection of atomic force microscope (AFM) probes and generic cantilevers during quasi-static loading. The platform consists of a scanning white light interferometer (SWLI ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904035

114. A 10 mK Scanning Probe Microscopy Facility
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 12/29/2010
Authors: Young J. Song, Alexander F. Otte, Steven R. Blankenship, Alan H. Band, Frank M. Hess, Young Kuk, Vladimir Shvarts, Zuyu Zhao, Joseph A Stroscio
Abstract: We describe the design, development and performance of a scanning probe microscopy (SPM) facility operating at a base temperature of 10 mK in magnetic fields up to 15 T. The microscope is cooled by a custom designed, fully ultra-high vacuum (UHV) co ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906211

115. Ultrasonic Dispersion of Nanoparticles for Environmental, Health and Safety Assessment--Issues and Recommendations
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 11/30/2010
Authors: Julian S. Taurozzi, Vincent A Hackley, Mark R. Wiesner
Abstract: A common approach for the study of the environmental and biological interactions of nanomaterials relies on the ultrasonic disruption of powders to obtain nanoparticle suspensions. Yet, the widespread and inconsistent use of ultrasonic treatment acro ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905978

116. 3D Nanoscale Characterization of Thin-Film Organic Photovoltaic Device Structures via Spectroscopic Contrast in the TEM
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/21/2010
Authors: Andrew A Herzing, Lee J Richter, Ian M. Anderson
Abstract: The three-dimensional characterization of third generation photovoltaic device structures at the nanometer scale is essential to the development of efficient, reliable, and inexpensive solar cell technologies. Electron tomography is a powerful metho ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905254

117. Contact Resistance of Flexible, Transparent Carbon Nanotube Films with Metals
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/7/2010
Authors: Hua Xu, Lei Chen, Liangbing Hu, Nikolai B Zhitenev
Abstract: We studied the contact properties of different metals to flexible optically-transparent single-walled carbon nanotube (SWCNTs) films. The SWCNT films are deposited on flexible polyethylene terephthalate (PET) substrate and patterned in test structure ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905854

118. The Stability and Surface Coverage of Polymer Stabilized Gold Nanoparticles
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/2/2010
Authors: Karl B Sebby, Elisabeth Mansfield
Abstract: NA
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906334

119. Characterization of a Soluble Anthradithiophene Derivative
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, Sean R Parkin, Xinran Zhang, John E Anthony, David J Gundlach
Abstract: The structural and electrical properties of a new solution processable material, 2,8-diflouro-5,11-tert-butyldimethylsilylethynl anthradithiophene (TBDMS), were measured for single crystal and spun cast thin-film transistors. TBDMS is observed to rea ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905704

120. Nano- and Atom-scale Length Metrology
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 10/1/2010
Authors: Theodore Vincent Vorburger, Ronald G Dixson, Ndubuisi George Orji, Joseph Fu, Richard A Allen, Michael W Cresswell, Vincent A Hackley
Abstract: Measurements of length at the nano-scale have increasing importance in manufacturing, especially in the electronics and biomedical industries. The properties of linewidth and step height are critical to the function and specification of semiconducto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906609



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