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Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 111 to 120 of 211 records.
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111. Evaluating the characteristics of multiwall carbon nanotubes
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/1/2011
Authors: John H Lehman, M. Terrones, Elisabeth Mansfield, Katie Hurst, Vincent Muenier
Abstract: During the past 20 years, multiwall carbon nanotubes (MWCNTs) have become an important industrial material. Hundreds of tons are produced each year. This review is a survey of the scientific literature, motivated by industrial requirements and guidel ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907346

112. Graphene: Materials to devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 7/1/2011
Authors: Jungseok Chae, Jeonghoon Ha, H. Baek, Young Kuk, Suyong S. Jung, Young J. Song, Nikolai B Zhitenev, Joseph A Stroscio, S.J. Woo, Y.-W. Son
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908976

113. Guided three-dimensional catalyst folding during Metal assisted Chemical Etching of Silicon
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/28/2011
Authors: Konrad Rykaczewski, Owen J. Hildreth, Ching P. Wong, Andrei G. Fedorov, John Henry j Scott
Abstract: In order to fabricate truly complex three-dimensional (3D) silicon nanostructures fabrication methods which expand beyond the concept of creation of straight 3D structures by direct extension of two dimensional (2D) patterns need to be developed. In ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908006

114. Quantitative Determination of Competitive Molecular Adsorption on Gold Nanoparticles Using Attenuated Total Reflectance-Fourier Transform Infrared Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/28/2011
Authors: De-Hao D. Tsai, Melissa Davila-Morris, Frank W DelRio, Suvajyoti S. Guha, Vincent A Hackley, Michael R Zachariah
Abstract: Surface-sensitive quantitative studies of competitive molecular adsorption on nanoparticles were conducted using a modified Attenuated attenuated Total total Reflectionreflectance-Fourier Transform transform Infrared infrared (ATR-FTIR) spectroscopy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907586

115. Imaging of nanoscale charge transport in bulk heterojunction solar cells
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/17/2011
Authors: Behrang H Hamadani, Nadine Emily Gergel-Hackett, Paul M Haney, Nikolai B Zhitenev
Abstract: We have studied the local charge transport properties of organic bulk heterojunction solar cells based on the blends of poly(3-hexylthiophene) (P3HT) and phenyl-C61-butyric acid methyl ester (PCBM) with a photoconductive atomic force microscope (PCAF ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905890

116. Hydrodynamic Fractionation of Finite Size Nano Gold Clusters
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/15/2011
Authors: De-Hao D. Tsai, Tae Joon Cho, Frank W DelRio, Julian S. Taurozzi, Michael Russel Zachariah, Vincent A Hackley
Abstract: We demonstrate a high resolution in situ experimental method for performing simultaneous size-classification and characterization of functional nanoscale gold clusters (NGCs) based on asymmetric-flow field flow fractionation (AFFF). Field emission sc ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908232

117. Methodology for imaging of nano-to-microscale water condensation dynamics on complex nanostructures
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/11/2011
Authors: Konrad Rykaczewski, John Henry j Scott
Abstract: By transferring of a small part of a macroscale sample to a novel thermally insulated sample platform we are able to mitigate flooding and electron heating problems typically associated with Environmental Scanning Electron Microscopy imaging of water ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908396

118. CAVITY OPTOMECHANICAL SENSORS
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/5/2011
Authors: Houxun H. Miao, Kartik A Srinivasan, Matthew T. Rakher, Marcelo Ishihara Davanco, Vladimir A Aksyuk
Abstract: We report a novel type of fully integrated optomechanical sensor and demonstrate high sensitivity mechanical displacement measurements on chip. We sense the motion of micro and nano-mechanical devices by near field coupling them to high quality facto ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908272

119. Fabrication and characterization of silicon-based molecular electronic devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/21/2011
Authors: Christina Ann Hacker, Michael A Walsh, Sujitra Jeanie Pookpanratana, Mariona Coll Bau, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908433

120. Flexible Memristors Fabricated through Sol-Gel Hydrolysis
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 5/4/2011
Authors: Joseph Leo Tedesco, Nadine Gergel-Hackett, Laurie Stephey, Madelaine Herminia Hernandez, Andrew A Herzing, Lee J Richter, Christina Ann Hacker, Joseph J Kopanski, Jan Obrzut, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908437



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