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You searched on: Topic Area: Characterization, Nanometrology, and Nanoscale Measurements

Displaying records 111 to 120 of 132 records.
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111. Flip Chip Lamination Approach to Fabricate Ultrasmooth Metal Contacts for Organic-based Electronic Device
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 6/4/2010
Authors: Mariona Coll Bau, Nadine Emily Gergel-Hackett, Oana Jurchescu, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907066

112. Ultrafast Photoinduced Carrier Dynamics of Organic Semiconductors Measured by Time-Resolved Terahertz Spectroscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/28/2010
Authors: Okan Esenturk, Joseph S Melinger, Paul A. Lane, Edwin J Heilweil
Abstract: Intrinsic properties of organic semiconductors are investigated by Time-Resolved Terahertz Spectroscopy (TRTS) to assess their relative mobilities and efficiencies. Our results are well correlated with device measurements, and show the effectiveness ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902516

113. Structural and Electrical Characterization of Flip Chip Laminated omega-functionalized thiols
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907067

114. Challenges and Opportunities of Organic Electronics
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 4/2/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905387

115. Organic Electronics: Challenges and Opportunities
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/31/2010
Author: Calvin Chan
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905389

116. Characterization of Soluble Anthradithiophene Derivatives
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/18/2010
Authors: Brad Conrad, Calvin Chan, Marsha A. Loth, John E Anthony, David J Gundlach
Abstract: We will discuss the growth and electrical measurements of a newly developed, partially fluorinated anthradithiophene (F-ADT) derivative with tert-butyldiphenylsilyl (TBDMS) side groups. Single crystals of the material can be readily grown and device ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905386

117. Flip Chip Lamination Approach to Fabricate Top Metal Contacts on Organic-based Devices
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 3/15/2010
Authors: Mariona Coll Bau, Oana Jurchescu, Nadine Emily Gergel-Hackett, Curt A Richter, Christina Ann Hacker
Abstract: Flip Chip Lamination approach to fabricate top metal contacts on organic-based devices ; M.Coll, O.D. Jurchescu, N. Gergel-Hackett, C.A. Richter, C,A, Hacker, American Physical Society (APS), March 2010, Portland, OR, USA (oral)
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907069

118. Steady-state and transient photoconductivity in c-axis GaN nanowires grown by nitrogen-plasma-assisted molecular beam epitaxy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/12/2010
Authors: Norman A Sanford, Paul Timothy Blanchard, Kristine A Bertness, Lorelle Mansfield, John B. Schlager, Aric Warner Sanders, Alexana Roshko, Beau Burton, Steven George
Abstract: Analysis of steady-state and transient photoconductivity measurements at room temperature performed on c-axis oriented GaN nanowires yielded estimates of free carrier concentration, drift, mobility, surface band bending, and surface capture coefficie ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=33133

119. Subsurface Characterization of Carbon Nanotubes in Polymer Composites via Quantitative Electric Force Microscopy
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 2/3/2010
Authors: Minhua Zhao, Xiaohong Gu, Sharon E. Lowther, Cheol Park, Jerry Jean, Tinh Nguyen
Abstract: In this study, quantitative Electric Force Microscopy (EFM) characterization of CNTs dispersed in free-standing polymer composite films is pursued. The effect of experimental parameters including humidity conditions, EFM probe geometry, tip-sample ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904262

120. Nanoscale Measurements With the TSOM Optical Method
Series: OTHER
Topic: Characterization, Nanometrology, and Nanoscale Measurements
Published: 1/4/2010
Author: Ravikiran Attota
Abstract: A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904673



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