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Displaying records 51 to 60 of 116 records.
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51. Evolution of Modern Approaches to Express Uncertainty in Measurement
Topic: Statistics
Published: 11/27/2007
Authors: Raghu N Kacker, K D Sommer, Bernd Siebert
Abstract: The object of this paper is to discuss evolution of the concept of uncertainty in measurement and methods for its quantification from the classical error analysis to the modern approaches based on the Guide to the Expression of Uncertainty in Measure ...

52. Fast Sequential Importance Sampling fo Estimate the Graph Reliability Polynomial
Topic: Statistics
Published: 11/8/2012
Authors: David G. Harris, Francis Sullivan, Isabel M Beichl
Abstract: The reliability polynomial of a graph measures the number of its connected subgraphs of various sizes. Algortihms based on sequential importance sampling (SIS) have been proposed to estimate a graph's reliahbility polynomial. We develop an improved ...

53. Fiducial Intervals for the Magnitude of a Complex-Valued Quantity
Topic: Statistics
Published: 12/19/2008
Authors: Chih-Ming Wang, Hariharan K Iyer
Abstract: This paper discusses a fiducial approach for constructing uncertainty intervals for the distance between k normal means and the origin. When k=2 this distance is equivalent to the magnitude of a complex-valued quantity. Uncertainty intervals for the ...

54. Fiducial Prediction Intervals
Topic: Statistics
Published: 2/18/2012
Authors: Chih-Ming Wang, Jan Hannig, Hariharan K Iyer
Abstract: This paper presents an approach for constructing prediction intervals for any given distribution. The approach is based on the principle of fiducial inference. We use several examples, including the normal, binomial, gamma, and Weibull distributions, ...

55. Final report of key comparison CCM.P-K3 absolute pressure measurements in gas from 3E-6 Pa to 9E-4 Pa
Topic: Statistics
Published: 3/31/2010
Authors: Douglas A Olson, Patrick J Abbott, Karl Jousten, Fiona J Redgrave, Pardeep Mohan, S S Hong
Abstract: This report describes a CCM key comparison of absolute pressure at five National Metrology Institutes (NMIs) that was carried out from August 1998 to May 2002. The goal of the key comparison was to determine the degree of equivalence at pressures in ...

56. Five Examples of Assessment and Expression of Measurement Uncertainty
Topic: Statistics
Published: 2/12/2013
Author: Antonio M Possolo
Abstract: It is a long accepted tenet of scientific practice that every measurement result ought to include a statement of uncertainty associated with the measured value, and that such uncertainty should be propagated to derivative products. It is also widely ...

57. Gauging the Repeatability of 3D Imaging Systems by Sphere Fitting
Topic: Statistics
Published: 9/30/2009
Authors: Marek Franaszek, Geraldine S Cheok, Kamel S Saidi
Abstract: Multiple scans of the same object acquired with 3D imaging system (e.g., laser scanner) in the same experimental conditions could provide valuable information about the instrument s performance (e.g., stability, existence of bias, measurement error). ...

58. Gradient-based stopping rules for maximum-likelihood quantum-state tomography
Topic: Statistics
Published: 9/18/2012
Authors: Scott C Glancy, Emanuel H Knill, Mark Girard
Abstract: When performing maximum likelihood quantum state tomography, one must find the quantum state that maximizes the likelihood for observed measurements on identically prepared systems, all having that quantum state. This optimization is usually perform ...

59. Hybrid shape descriptor and meta similarity generation for non-rigid and partial 3D model retrieval
Topic: Statistics
Published: 7/26/2013
Author: Afzal A Godil
Abstract: Non-rigid and partial 3D model retrieval are two significant and challenging research directions in the field of 3D model retrieval. Little work has been done in proposing a hybrid shape descriptor that works for both retrieval scenarios, let alone ...

60. Improving optical measurement uncertainty with combined multitool metrology using a Bayesian approach
Topic: Statistics
Published: 8/30/2012
Authors: Nien F Zhang, Richard M Silver, Hui H. Zhou, Bryan M Barnes
Abstract: Recently, there has been significant research investigating new optical technologies for dimensional metrology of features 22 nm in critical dimension and smaller. When modeling optical measurements, a library of curves is assembled through the simul ...

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