NIST logo

Publications Portal

You searched on:
Topic Area: Statistics
Sorted by: title

Displaying records 1 to 10 of 115 records.
Resort by: Date / Title


1. A Bayesian Approach to the Analysis of Split-Plot Product Arrays and Optimization in Robust Parameter Design
Topic: Statistics
Published: 10/4/2012
Author: Adam L Pintar
Abstract: Many robust parameter design (RPD) studies involve a split-plot randomization structure and to obtain valid inferences in the analysis, it is essential to account for the design induced correlation structure. Bayesian methods are appealing for these ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907885

2. A Bayesian Approach to the Evaluation of Comparisons of Individually Value-Assigned Reference Materials
Topic: Statistics
Published: 3/3/2012
Author: Blaza Toman
Abstract: A new data analysis procedure is presented for the evaluation of comparisons of reference materials individually prepared and value-assigned by different organizations to measurements made in a single laboratory under repeatability measurements. Th ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909938

3. A Bayesian Statistical Model for Hybrid Metrology to Improve Measurement Accuracy
Topic: Statistics
Published: 7/31/2011
Authors: Richard M Silver, Nien F Zhang, Bryan M Barnes, Jing Qin, Hui H. Zhou, Ronald G Dixson
Abstract: We present a method to combine measurements from different techniques that reduces uncertainties and can improve measurement throughput. The approach directly integrates the measurement analysis of multiple techniques that can include different conf ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908377

4. A New Analysis of the False-Positive Rate of a Bloom Filter
Topic: Statistics
Published: 10/15/2010
Authors: Ken Christensen, Allen L Roginsky, Miguel Jimeno
Abstract: A Bloom filter is a space-efficient data structure used for probabilistic set membership testing. When testing an object for set membership, a Bloom filter may give a false positive. The analysis of the false positive rate is key to understanding the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903775

5. A New Design for High-Throughput Peel Tests: Statistical Analysis and Example
Topic: Statistics
Published: 12/1/2004
Authors: A Chiche, Weiping Zhang, Christopher M Stafford, Alamgir Karim
Abstract: The peel test is one of the most common techniques to investigate the properties of pressure sensitive adhesives (PSAs). As the demand increases for combinatorial tools to rapidly test material performance, designinig a high-throughput peel test is a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852395

6. A Statistical Model for Cladding Diameter of Optical Fibers
Topic: Statistics
Published: 4/1/2003
Authors: Chih-Ming Wang, Timothy J Drapela
Abstract: The National Institute of Standards and Technology has developed a contact micrometer for accurate measurement of optical-fiber outer diameter. The contact micrometer is used to measure reference fibers which are artifacts used by the telecommunicat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151779

7. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: Special Publication (NIST SP)
Report Number: 800-22
Topic: Statistics
Published: 5/15/2001
Authors: Andrew L Rukhin, Juan Soto, James R Nechvatal, Miles E. Smid, Elaine B Barker, Stefan D Leigh, M Levenson, M Vangel, D L. Banks, Nathanael A Heckert, James F Dray Jr, S C. Vo
Abstract: [Superseded by SP 800-22 Revision 1a (April 2010): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906762] This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generat ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151222

8. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: ITL Bulletin
Topic: Statistics
Published: 12/20/2000
Author: Elaine B Barker
Abstract: Random and pseudorandom numbers are needed for many cryptographic applications. For example, common cryptosystems employ keys that must be generated in a random fashion. Many cryptographic protocols also require random or pseudorandom inputs at var ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=151231

9. A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications
Series: Special Publication (NIST SP)
Report Number: 800-22 Rev 1a
Topic: Statistics
Published: 9/16/2010
Authors: Lawrence E Bassham, Andrew L Rukhin, Juan Soto, James R Nechvatal, Miles E. Smid, Stefan D Leigh, M Levenson, M Vangel, Nathanael A Heckert, D L. Banks
Abstract: This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generators may be used in many cryptographic applications, such as the generation of key material. Generators suitable for use i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906762

10. A chapter ``Statistical Testing of Randomness: New and Old Procedures '' Statistical Engineering Division is a contribution to the book "Randomness: Five Questions"
Topic: Statistics
Published: 1/11/2011
Author: Andrew L Rukhin
Abstract: Several procedures designed to test randomness of binary sequences are reviewed. Necessary modifications to the existing document ``A statistical test suite for the validation of cryptographic random number generators'', Special NIS ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903151



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series