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Topic Area: Semiconductor Materials
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Displaying records 51 to 60 of 76 records.
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51. A Fast, Simple Wafer-level Hall-Mobility Measurement Technique
Topic: Semiconductor Materials
Published: 10/21/2009
Authors: Liangchun Yu, Kin P Cheung, Vinayak Tilak, Greg Dunne, Kevin Matocha, Jason P Campbell, Kuang Sheng
Abstract: Mobility is a good indicator of device reliability. High channel mobility is one of the biggest challenges especially in novel devices such as high-k based MOSFET, III-V devices and SiC power MOSFET etc. Accurate measurement of channel mobility is ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905424

52. Bone Imaging: Bone Mineral Density as a Biomarker for Assessing Bone Health
Topic: Semiconductor Materials
Published: 10/6/2009
Author: Herbert S Bennett
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=905380

53. Silicon Nanowire NVM with High-k Gate Dielectric Stack
Topic: Semiconductor Materials
Published: 9/1/2009
Authors: Xiaoxiao Zhu, D. Gu, Qiliang Li, D. Ioannoua, H. Baumgart, John S Suehle, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904090

54. Steep Subthreshold Slope Nanowire FETs with Gate-Induced Schottky-Barrier Tunneling
Topic: Semiconductor Materials
Published: 6/24/2009
Authors: Qiliang Li, Xiaoxiao Zhu, D. Ioannou, John S Suehle, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904092

55. Optical and Conductivity Properties of Films from Liquid-Phase Exfoliation of Natural Graphite
Topic: Semiconductor Materials
Published: 5/15/2009
Authors: Jan Obrzut, Kalman D Migler
Abstract: We experimentally determine the conductivity and optical transmittance of graphite layers, obtained from the liquid phase exfoliation of natural crystalline graphite. The measured transmittance values range from 0.9 to 0.97, comparable to the theoret ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901494

56. The molecular basis of mesophase ordering in a thiophene-based copolymer
Topic: Semiconductor Materials
Published: 2/18/2009
Authors: Dean M DeLongchamp, Regis J Kline, Youngsuk Jung, Eric K Lin, Daniel A Fischer, David J Gundlach, Andrew Moad, Lee J Richter, Michael F. Toney, Martin Heeney, Iain McCulloch
Abstract: The carrier mobility of poly(2,5-bis(3-alkylthiophen-2-yl) thieno[3,2-b]thiophene) semiconductors can be substantially enhanced after heating through a thermotropic mesophase transition, which causes a significant improvement in thin film structural ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852781

57. Noise in ZnO Nanowire Field Effect Transistors
Topic: Semiconductor Materials
Published: 2/5/2009
Authors: Hao Xiong, Wenyong Wang, John S Suehle, Curt A Richter, W. Hong, T. Lee
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904093

58. Wear-out and Time Dependent Dielectric Breakdown in Silicon Oxides
Topic: Semiconductor Materials
Published: 1/14/2009
Author: John S Suehle
Abstract: This chapter will discuss the various physical mechanisms proposed for defect generation and dielectric breakdown in thin silicon dioxide films. Current understanding of the driving forces for defect generation will be presented as well as statistica ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=32796

59. Raman Spectroscopic Determination of Electron Concentration in n-Type GaSb
Topic: Semiconductor Materials
Published: 11/19/2008
Authors: James E Maslar, Wilbur Scott Hurst, C Wang
Abstract: Phonon-plasmon coupled mode Raman spectra of n-type GaSb were measured at room temperature as a function of electron concentration. These spectra were obtained using an optical system based on 752.55 nm excitation. Utilization of this wavelength pe ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831013

60. Papers Selected from the International Semiconductor Device Research Symposium 2007 ISDRS 2007 Foreword
Topic: Semiconductor Materials
Published: 10/1/2008
Authors: A. Iliadis, Curt A Richter
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904091



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