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Topic Area: Polymers
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Displaying records 541 to 547.
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541. Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 2/24/97
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6183
Topic: Polymers
Published: 6/1/1998
Authors: Eric J. Amis, Barry J. Bauer, F I Groehn, T J. Prosa, Da-Wei Liu, K A Barnes, C L. Jackson, B D Viers, Alamgir Karim, Jack F Douglas
Abstract: Dendrimer, dendrigraft, and hyperbranched solutions, blends, and interpenetrating polymer networks are characterized by small neutron and x-ray scattering, reflectivity, atomic force microscopy, and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851476

542. Physical Aging Behavior in Amorphous Pen Film as Measured by Creep
Topic: Polymers
Published: 5/1/1998
Authors: M L Cerrada, G B. McKenna, J M O'Reilly, J E Greene, J R Gillmor
Abstract: Characterization of the viscoelastic and aging responses of poly [ethylene naphthalate] [PEN] is of increasing interest as this material begins to see greater use in commercial applications. In typical aging experiments, one quenches the glass tran ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851378

543. Preparation and Characterization of Polymer/Dendrimer Blends Progress Report 3/31/98
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6151
Topic: Polymers
Published: 4/1/1998
Authors: Eric J. Amis, Barry J. Bauer, A Topp, T J. Prosa, Da-Wei Liu, C L. Jackson, Alamgir Karim, B D Ermi, K A Barnes, A Nakatani, G Nisato, R Ivkov
Abstract: Dendrimer and dendrigraft solutions, blends, and interpenetrating polymer networks are characterized by small angle neutron and x-ray scattering, reflectivity, and transmission electron microscopy.
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851441

544. High Sensitivity Technique for Measurement of Thin Film Out-of-Plane Expansion
Topic: Polymers
Published: 3/1/1998
Authors: Chad R Snyder, F I. Mopsik
Abstract: We have developed a technique utilizing a capacitance measurement for the accurate determination of the out-of-plane expansion of thin films on the order of 1 micrometer thick. This is important because the coefficient of thermal expansion (CTE) is a ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851423

545. Recertification of SRM 706a, a Polystyrene
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6091
Topic: Polymers
Published: 1/1/1998
Authors: Kathleen M. Flynn, William R. Blair, J R. Maurey
Abstract: The recertification of the polystyrene standard reference material, SRM 706a, is described. The Mw of SRM 706a by light scattering was determined to be 2.85 x 10^u5^ g/mol with a sample standard deviation of 0.019 x 10^u5^ g/mol. A combined expande ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851375

546. Certification of the Relative Molecular Mass and the Intrinsic Viscosity of SRM 2887, a Polyethylene of Narrow Molecular Mass Distribution
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6456
Topic: Polymers
Published: Date unknown
Authors: J R. Maurey, William R. Blair, Carl R. Schultesiz
Abstract: The certification of a polyethylene standard reference material, SRM 2887, is described. The Mw of SRM 2887 by light scattering was determined to be 196.4x10+3 g/mol with a sample standard deviation of 6.7 x10+3 g/mol. A combined expanded uncertaint ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851681

547. Terahertz Mobility Measurements on P3HT Films: Device Comparison, Molecular Weight and Film Processing Effects
Topic: Polymers
Published: Date unknown
Authors: Okan Esenturk, Joseph S Melinger
Abstract: We report the first direct comparison of relative carrier mobilities in semiconducting organic polymer films measured using non-contact optical pump terahertz probe spectroscopy to those reported in electrical device studies. Relative transient sign ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=841108



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