NIST logo

Publications Portal

You searched on: Topic Area: Nanomaterials Sorted by: title

Displaying records 81 to 90 of 158 records.
Resort by: Date / Title


81. Laser Patterning of Diamond. Part II. Surface Nondiamond Carbon Formation and its Removal
Topic: Nanomaterials
Published: 12/30/2009
Authors: Daniel A Fischer, John Smedley, Trvini Rao, Cherno Jaye, Jen Bohon
Abstract: As diamond becomes more prevalent for electronic and research applications, methods of patterning diamond will be required. One such method, laser ablation, has been investigated in a related work.1 We report on the formation of surface non-diamond c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902382

82. Laser Ultrasound: An Inspection Tool of Soft Porous Low-Dielectric Constant Films for Microelectronic Interconnect
Topic: Nanomaterials
Published: 3/1/2003
Authors: Colm Flannery, Donna C. Hurley
Abstract: The demand for miniaturization in the microelectronics industry requires that the RC (Resistance-Capacitance) factor be lowered to reduce interconnection delay, crosstalk and power loss. The most promising way to achieve this is by introducing poros ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851310

83. Laser-assisted atom probe tomography of MBE grown GaN nanowire heterostructures
Topic: Nanomaterials
Published: 2/24/2014
Authors: Norman A Sanford, Paul Timothy Blanchard, Matthew David Brubaker, Kristine A Bertness, John B Schlager, R Kirchofer, David R Diercks, Brian Gorman
Abstract: Laser-assisted atom probe tomography (L-APT) was performed on GaN nanowires (NWs) and axial GaN/InGaN nanowire heterostructures. All samples were grown by MBE on Si(111) substrates. The laser pulse energy (PE) at 355 nm used in L-APT analysis of Ga ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=914658

84. MEASUREMENT OF COMPLEX CONDUCTIVITY IN CARBON NANOTUBE POLYMER COMPOSITES UNDER MECHANICAL SHEAR
Topic: Nanomaterials
Published: 11/14/2008
Authors: Jan Obrzut, Jack F Douglas
Abstract: We measured the complex conductivity of carbon nanotube-polypropylene composites under mechanical shear conditions. In order to determine how flow alters the properties of these complex fluids we constructed a rheo-dielectric test fixture, which allo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854127

85. Magnetic nanostructures for advanced technologies: fabrication, metrology, and challenges
Topic: Nanomaterials
Published: 6/7/2011
Authors: June Waiyin Lau, Justin M Shaw
Abstract: Magnetic nanostructures are an integral part to many state-of-the-art and emerging technologies. However, the complete path from parts (the nanostructures) to the manufacturing of the end products, is not always obvious to students of magnetism. The ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=908067

86. Mapping substrate/film adhesion with contact-resonance-frequency AFM
Topic: Nanomaterials
Published: 7/12/2006
Authors: Donna C. Hurley, Malgorzata Kopycinska-Mueller, Eric Langlois, Tony B. Kos, Nicholas Barbosa
Abstract: We demonstrate contact-resonance-frequency atomic force microscopy (AFM) techniques to nondestructively image variations in adhesion at a substrate/film interface. Contact-resonance-frequency imaging is a dynamic AFM technique to measure the contact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50316

87. Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
Series: Journal of Research (NIST JRES)
Report Number: 118.001
Topic: Nanomaterials
Published: 1/10/2013
Authors: Lili Wang, Steven J Choquette, Adolfas Kastytis Gaigalas
Abstract: A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in water. Absorption measurements were performed with the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909635

88. Measuring the Hydrodynamic Size of Nanoparticles in Aqueous Media Using Batch-Mode Dynamic Light Scattering
Topic: Nanomaterials
Published: 1/1/2011
Authors: Vincent A Hackley, Jeffrey D. Clogston
Abstract: Particle size characterization is of particular importance to nanomedicine as ,nanoŠ is a dimensional definition, and the size similarity of nanoparticles to biological moieties is believed to impart many of their unique medical properties. Here we p ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854055

89. Measuring the Size of Nanoparticles Using Transmission Electron Microscopy (TEM)
Topic: Nanomaterials
Published: 3/1/2010
Authors: John E Bonevich, Wolfgang K. Haller
Abstract: This assay protocol outlines procedures for sample preparation and the determination of mean nanoparticle size (in projection) using transmission electron microscopy (TEM). The projected diameter is the diameter of an equivalent hard uniform sphere s ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854083

90. Mechanical properties of one-dimensional nanostructures
Topic: Nanomaterials
Published: 5/23/2010
Authors: Gheorghe Stan, Robert Francis Cook
Abstract: The elastic mechanical properties of one-dimensional nanostructures are considered, with an emphasis on the use of contact-resonance atomic force microscopy methods to determine elastic moduli. Various methods used to determine elastic moduli of one- ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902063



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series