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Topic Area: Nanomaterials
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Displaying records 121 to 130 of 152 records.
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121. The impact of interfacial adhesion on the strain-to-failure of montmorillonite/epoxy nanocomposites
Topic: Nanomaterials
Published: 2/20/2008
Authors: Jae Hyun Kim, Mickey Richardson, Nandika A. D'Souza, Gale Antrus Holmes
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854059

122. On the nature of asymetry of nucleation centers activity in ultrathin Co films and Co/Pt multilayers
Topic: Nanomaterials
Published: 1/14/2008
Authors: Yu L Iunin, Yury P. Kabanov, Valerian Ivanovich Nikitenko, X M Cheng, Alexander J. Shapiro, C L Chien, Robert D Shull
Abstract: Magnetization reversal in ultrathin Pt(10 nm)/Co(0.6 nm)/Pt(3 nm) magnetic films and Pt(10 nm)/[Co(d)/Pt(1 nm)]_{n}/ Pt(2 nm) (d = 0.4, 0.6, 0.8 nm, n = 2, 4) multilayers with perpendicular anisotropy has been studied using Kerr microscopy. These ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854024

123. On the nature of asymmetry of nucleation enters activity in ultrathin Co films and Co/Pt multilayers
Topic: Nanomaterials
Published: 1/7/2008
Authors: Yury L. Iunin, Yury P. Kabanov, Valerian I. Nikitenko, X.M. Cheng, Alexander J. Shapiro, C L Chien, Robert D Shull
Abstract: Magnetization reversal in ultrathin Pt(10 nm)/Co(0.6 nm)/Pt(3 nm) magnetic films and Pt(10 nm)/[Co(d)/Pt(l nm)]n/ Pt(2 nm) (d = 0.4nm, 0.6nm, 0.8 nm, n = 2, 4) multilayers with perpendicular anisotropy has been studied using Kerr microscopy. These ma ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854430

124. Thermal Cycling of Buried Damascene Copper Interconnect Lines by Joule Heating
Topic: Nanomaterials
Published: 1/1/2008
Authors: David Thomas Read, Roy Howard Geiss
Abstract: We report tests to failure of 300 nm wide damascene copper interconnect lines in silicon oxide dielectric, under high amplitude, low frequency alternating current. The cyclic minimum and maximum resistances were obtained from the measured voltage and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853561

125. Multiscale modeling of point defects in strained silicon
Topic: Nanomaterials
Published: 12/31/2007
Authors: Vinod K Tewary, B. Yang
Abstract: A multiscale Green's function method is described for modeling substitutional point defects and vacancies in strained silicon. The model seamlessly links the length scales from atomistic to macro. The model accounts for the discrete lattice effects, ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50643

126. Relaxation Behavior of Polymer Structures Fabricated by Nanoimprint Lithography
Topic: Nanomaterials
Published: 8/14/2007
Authors: Yifu Ding, Hyun W. Ro, Thomas Avery Germer, Jack F Douglas, Brian C. Okerberg, Alamgir Karim, Christopher L Soles
Abstract: We study the decay of the imprinted polystyrene (PS) patterns under thermal annealing using light diffraction. The first order diffraction intensity from the imprinted gratings was measured as a function of annealing time. Local intensity maximum i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852744

127. Relationship between dispersion metric and properties of PMMA/SWNT nanocomposites
Topic: Nanomaterials
Published: 6/13/2007
Authors: Takashi Kashiwagi, Jeffrey A Fagan, Jack F Douglas, Kazuya Yamamoto, Nathanael A Heckert, Stefan D Leigh, Jan Obrzut, Fangming Du, Minfang Mu, Sheng Lin-Gibson, K Winey, R Haggenmueller
Abstract: Particle spatial dispersion is a crucial characteristic of polymer composite materials and this property is recognized as especially important innanocomposite materials due to the general tendency of nanoparticles to aggregate under processing condit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854038

128. Polymer Viscoelasticity and Residual Stress Effects on Nanoimprint Lithography
Topic: Nanomaterials
Published: 5/24/2007
Authors: Yifu Ding, Hyun W. Ro, Jack F Douglas, Ronald Leland Jones, Daniel R. Hines, Alamgir Karim, Christopher L Soles
Abstract: We examine the influence of viscoelastic effects on the stability of nanoimprinted polymer films. The decay of features for polymers below the critical entanglement molecular mass at elevated temperatures is determined by simple surface tension and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852665

129. Towards Industrial Scale Fabrication of Nanowire-Based Devices
Topic: Nanomaterials
Published: 4/11/2007
Author: Babak Nikoobakht
Abstract: The key requirements for mass fabrication of nanodevices are directed positioning and alignment of nanoparticles (e.g., nanowires) with known registries on a large scale. Here, these issues are addressed in a high throughput and scalable approach fo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=831444

130. Crystallization of Polyethylene Oxide Patterend by Nanoimprint Lithography
Topic: Nanomaterials
Published: 3/28/2007
Authors: Brian C. Okerberg, Christopher L Soles, Jack F Douglas, Hyun W. Ro, Alamgir Karim
Abstract: The crystallization behavior of poly(ethylene oxide) (PEO) films patterned by nanoimprint lithography is studied. The imprinted PEO film consists of parallel lines, approximately 240 nm wide and 320 nm tall, on a 400 nm pitch with a residual laye ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852701



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