NIST logo

Publications Portal

You searched on:
Topic Area: Nanomaterials

Displaying records 21 to 30 of 153 records.
Resort by: Date / Title


21. Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
Series: Journal of Research (NIST JRES)
Report Number: 118.001
Topic: Nanomaterials
Published: 1/10/2013
Authors: Lili Wang, Steven J Choquette, Adolfas Kastytis Gaigalas
Abstract: A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in water. Absorption measurements were performed with the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909635

22. Differentiation and characterization of isotopically modified silver nanoparticles in aqueous media using asymmetric-flow field flow fractionation coupled to optical detection and mass spectrometry
Topic: Nanomaterials
Published: 12/10/2012
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: The principal objective of this work was to develop and demonstrate a new methodology for silver nanoparticle (AgNP) detection and characterization based on asymmetric-flow field flow fractionation (A4F) coupled to multiple detectors and using stable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912174

23. High-energy Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source
Topic: Nanomaterials
Published: 12/1/2012
Authors: Andrew John Allen, Lyle E Levine, Fan Zhang, Gabrielle Gibbs Long, Jan Ilavsky, Pete R. Jemian
Abstract: This paper reports recent tests performed on the Bonse-Hart-type ultra-small angle X-ray scattering (USAXS) instrument at the Advanced Photon Source with higher-order reflection optics , Si (440) instead of Si (220) , and with X-ray energies greate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911966

24. Evaluation of Metal Oxide Nanowire Materials with Temperature-Controlled Microsensor Substrates
Topic: Nanomaterials
Published: 11/30/2012
Authors: Kurt D Benkstein, Baranidharan Raman, David L. Lahr, Stephen Semancik
Abstract: Nanomaterials are becoming increasingly important for next-generation chemical sensing devices. In particular, quasi-one-dimensional materials, such as nanowires, are attracting a great deal of interest. While early examples of nano-wire-based chemic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907591

25. Capillary Wave Dynamics of Thin Polymer films over Submerged Nanostructures
Topic: Nanomaterials
Published: 11/16/2012
Authors: Christopher L Soles, Hyun W. Ro, K. J. Alvine, Oleg Shpyrko, Yenling Dai, Alec Sandy, Suresh Narayanan
Abstract: The surface dynamics of thin molten polystyrene films supported by nanoscale periodic silicon line-space gratings were investigated with X-ray photon correlation spectroscopy. Surface dynamics over these nanostructures exhibit high directional aniso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910869

26. Gold nanorod separation and characterization by asymmetric-flow field flow fractionation with UV-Vis detection
Topic: Nanomaterials
Published: 11/14/2012
Authors: Julien C. Gigault, Tae Joon Cho, Robert I. MacCuspie, Vincent A Hackley
Abstract: The application of asymmetrical-flow field flow fractionation (A4F) for gold nanorod (GNR) fractionation and characterization was comprehensively investigated. We report on two novel aspects of this application. The first addresses the analytical cha ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911860

27. Controlling the size and the activity of Fe particles for synthesis of carbon nanotubes
Topic: Nanomaterials
Published: 11/1/2012
Authors: See-Wee Chee, Renu Sharma
Abstract: The properties of carbon nanotubes (CNTs) are controlled by their structure and morphology. Therefore, their selective synthesis, using catalytic chemical vapor deposition, requires precise control on a number of parameters including the size and act ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909566

28. Giant piezoelectricity in PMN-PT thin films: Beyond PZT
Topic: Nanomaterials
Published: 11/1/2012
Authors: S. H. Baek, M. S. Rzchowski, Vladimir A Aksyuk
Abstract: Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912113

29. Quantifying Dithiothreitol Displacement of Functional Ligands from Gold Nanoparticles
Topic: Nanomaterials
Published: 10/27/2012
Authors: De-Hao D. Tsai, Frank W DelRio, Sherrie R. Elzey, Suvajyoti S. Guha, Michael Russel Zachariah, Vincent A Hackley, Melanie P Shelton
Abstract: Dithiothreitol (DTT)-based displacement is widely utilized for separating ligands from their gold nanoparticle (AuNP) conjugates, a critical step for differentiating and quantifying surface-bound functional ligands and therefore the effective surface ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911354

30. Aggregation/agglomeration state of carbon nanotubes
Topic: Nanomaterials
Published: 10/12/2012
Authors: Vivek M Prabhu, Toshiya Okazaki, Takeshi Eitoku, Masayoshi Tange, Haruhisa Kato
Abstract: Evaluation of aggregation and agglomeration of carbon nanotube (CNT) solution has been one of the key issues for applications. Here we introduce a simple method based on depolarized dynamic light scattering (DDLS) performed at multiple scattering ang ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912177



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series