NIST logo

Publications Portal

You searched on:
Topic Area: Nanomaterials

Displaying records 11 to 20 of 147 records.
Resort by: Date / Title


11. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Topic: Nanomaterials
Published: 6/3/2013
Authors: Mariano A. Real, Eric Lass, Fan-Hung Liu, Tian T. Shen, George R Jones, Johannes A Soons, David B Newell, Albert Davydov, Randolph E Elmquist
Abstract: A well-controlled technique for high-temperature epitaxial growth on 6H-SiC(0001) substrates is shown to allow development of monolayer graphene that exhibits promise for precise metrological applications. Face-to-face (FTF) and face-to-graphite (FTG ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911731

12. ,Real-worldŠ precision, bias, and between-laboratory variation for surface area measurement of a titanium dioxide nanomaterial in powder form
Topic: Nanomaterials
Published: 6/1/2013
Authors: Vincent A Hackley, Aleksandr B. Stefaniak
Abstract: Accurate characterization of nanomaterial properties is a critical component of any nanotoxicology testing strategy. Data that describes the performance of various laboratories to measure the characteristics of the same nanomaterial is scarce. We c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912937

13. Discriminating the states of matter in metallic nanoparticle transformations: What are we missing?
Topic: Nanomaterials
Published: 2/20/2013
Authors: John M Pettibone, Julien C. Gigault, Vincent A Hackley
Abstract: A limiting factor in assessing the risk of current and emerging nanomaterials in biological and environmental systems is the ability to accurately detect and characterize their size, shape and composition in broad distributions and complex media. Asy ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=913009

14. The effect of internal impurities on the mechanical and conductance properties of gold nanowires during elongation
Topic: Nanomaterials
Published: 1/24/2013
Authors: Shmuel Barzilai, Francesca M Tavazza, Lyle E Levine
Abstract: The conductance and mechanical properties of contaminated gold nanowires were studied using first principle calculations. Nanowires containing internal impurities of H2O or O2 were elongated along two different directions. It was found that both imp ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912083

15. Real-Time Size Discrimination and Elemental Analysis of Gold Nanoparticles using ES-DMA coupled to ICP-MS
Topic: Nanomaterials
Published: 1/22/2013
Authors: Sherrie R. Elzey, De-Hao D. Tsai, Lee Lijian Yu, Michael R Winchester, Michael E Kelley, Vincent A Hackley
Abstract: We report the development of a hyphenated instrument with the capacity to quantitatively characterize aqueous suspended gold nanoparticles (AuNPs) based on a combination of gas-phase size separation, particle counting, and elemental analysis. A custo ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912171

16. Measurement of Scattering and Absorption Cross Sections of Microspheres for Wavelengths between 240 nm and 800 nm
Series: Journal of Research (NIST JRES)
Report Number: 118.001
Topic: Nanomaterials
Published: 1/10/2013
Authors: Lili Wang, Steven J Choquette, Adolfas Kastytis Gaigalas
Abstract: A commercial spectrometer with a 150 mm integrating sphere (IS) detector was used to measure the scattering and absorption cross sections of polystyrene monodisperse microspheres suspended in water. Absorption measurements were performed with the ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909635

17. Differentiation and characterization of isotopically modified silver nanoparticles in aqueous media using asymmetric-flow field flow fractionation coupled to optical detection and mass spectrometry
Topic: Nanomaterials
Published: 12/10/2012
Authors: Julien C. Gigault, Vincent A Hackley
Abstract: The principal objective of this work was to develop and demonstrate a new methodology for silver nanoparticle (AgNP) detection and characterization based on asymmetric-flow field flow fractionation (A4F) coupled to multiple detectors and using stable ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912174

18. High-energy Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source
Topic: Nanomaterials
Published: 12/1/2012
Authors: Andrew John Allen, Lyle E Levine, Fan Zhang, Gabrielle Gibbs Long, Jan Ilavsky, Pete R. Jemian
Abstract: This paper reports recent tests performed on the Bonse-Hart-type ultra-small angle X-ray scattering (USAXS) instrument at the Advanced Photon Source with higher-order reflection optics , Si (440) instead of Si (220) , and with X-ray energies greate ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911966

19. Evaluation of Metal Oxide Nanowire Materials with Temperature-Controlled Microsensor Substrates
Topic: Nanomaterials
Published: 11/30/2012
Authors: Kurt D Benkstein, Baranidharan Raman, David L. Lahr, Stephen Semancik
Abstract: Nanomaterials are becoming increasingly important for next-generation chemical sensing devices. In particular, quasi-one-dimensional materials, such as nanowires, are attracting a great deal of interest. While early examples of nano-wire-based chemic ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=907591

20. Capillary Wave Dynamics of Thin Polymer films over Submerged Nanostructures
Topic: Nanomaterials
Published: 11/16/2012
Authors: Christopher L Soles, Hyun Wook Ro, K. J. Alvine, Oleg Shpyrko, Yenling Dai, Alec Sandy, Suresh Narayanan
Abstract: The surface dynamics of thin molten polystyrene films supported by nanoscale periodic silicon line-space gratings were investigated with X-ray photon correlation spectroscopy. Surface dynamics over these nanostructures exhibit high directional aniso ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910869



Search NIST-wide:


(Search abstract and keywords)


Last Name:
First Name:







Special Publications:

Looking for a NIST Special Publication (NIST SP Series)? Place the series number and dash in the report number field (Example: 800-) and begin your search.

  • SP 250-XX: Calibration Services
  • SP 260-XX: Standard Reference Materials
  • SP 300-XX: Precision Measurement and Calibration
  • SP 400-XX: Semiconductor Measurement Technology
  • SP 480-XX: Law Enforcement Technology
  • SP 500-XX: Computer Systems Technology
  • SP 700-XX: Industrial Measurement Series
  • SP 800-XX: Computer Security Series
  • SP 823-XX: Integrated Services Digital Network Series