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Topic Area: Nanomaterials

Displaying records 111 to 120 of 127 records.
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111. Mapping substrate/film adhesion with contact-resonance-frequency AFM
Topic: Nanomaterials
Published: 7/12/2006
Authors: Donna C Hurley, Malgorzata Kopycinska-Mueller, Eric Langlois, Tony B. Kos, Nicholas Barbosa
Abstract: We demonstrate contact-resonance-frequency atomic force microscopy (AFM) techniques to nondestructively image variations in adhesion at a substrate/film interface. Contact-resonance-frequency imaging is a dynamic AFM technique to measure the contact ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50316

112. Effect of Self-Assembled Monolayer Film Order on Nanofriction
Topic: Nanomaterials
Published: 7/6/2006
Authors: S Sambasivan, S Hsieh, Daniel A Fischer, Stephen M. Hsu
Abstract: Friction at the nanoscale has become a significant challenge for microsystems, including MEMS, NEMS and other devices. At nanoscale, lateral loading often causes component breakage and loss of functions in devices, therefore, accurate measurement and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851049

113. Mesoporous nanoparticle TiO2 thin films for conductometric gas sensing on microhotplate plateforms
Topic: Nanomaterials
Published: 1/1/2006
Authors: Kurt D Benkstein, Stephen Semancik
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901925

114. Multiscale Modeling of Germanium Quantum Dots in Silicon
Topic: Nanomaterials
Published: 12/30/2005
Authors: Vinod K Tewary, David Thomas Read
Abstract: A method is described for multiscale modeling of a quantum dot in a semiconductor containing a free surface. The method is based upon the use of the lattice-statics and continuum Green's functions integrated with classical molecular dynamics. It full ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50077

115. Acoustic Modes and Elastic Properties of Polymeric Nanostructures
Topic: Nanomaterials
Published: 10/21/2005
Authors: R Hartschuh, A Kisliuk, V N Novikov, Alexei Sokolov, Paul R Heyliger, Colm Flannery, Ward L Johnson, Christopher L Soles, Wen-Li Wu
Abstract: Fabricating mechanically robust polymer structures with nanoscale dimensions is critical for a wide range of emerging technologies. The rigidity of such structures is expected to change as the feature sizes approach the characteristic dimensions of ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=852462

116. Brillouin light scattering from pumped uniform-precession and low-k magnons in Ni81Fe19
Topic: Nanomaterials
Published: 3/4/2005
Authors: Ward L Johnson, Sudook A Kim, Stephen E Russek, Pavel Kabos
Abstract: A method is presented for performing Brillouin-light-scattering measurements on uniform-precession and low-wave-number (Iow-k) magnons excited by a microwave magnetic field in opaque magnetic specimens. The optical configuration is similar to that e ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50065

117. Multiscale Green's Function Modeling of Defects in a Semi-Infinite Silicon Substrate
Topic: Nanomaterials
Published: 3/3/2005
Authors: B. Yang, Vinod K Tewary
Abstract: We have developed a Green's function (GF) based multiscale modeling of defects in a semi-infinite Si-substrate. Point defects and substrate surface (i.e., extended defect) at two different scales are modeled in a unified manner. Behaviors of the poin ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=50032

118. Development of Multilayer Analyzer Array Detectors for X-ray Fluorescence at the Third Generation Synchrotron Source
Topic: Nanomaterials
Published: 8/5/2004
Authors: Z M Zhang, G Rosenbaum, Q Liu, Daniel A Fischer
Abstract: It is a natural to use multilayer analyzers as energy resolving x-ray fluorescence detection in the lower energy region to use multilayer analyzers. The analyzer array detectors can afford large detection solid angle, superb energy resolution, and ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851001

119. Structure and Magnetic Properties of Electrodeposition Co on n-GaAs (001)
Topic: Nanomaterials
Published: 9/19/2003
Authors: A X Ford, John E Bonevich, Robert D McMichael, Mark D Vaudin, Thomas P Moffat
Abstract: Co thin films have been electrodeposited on n-type (001) GaAs. The structure and texture of the films were investigated using x-ray diffraction (XRD) and transmission electron microscopy (TEM) while the magnetic properties were examined using a vibr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853237

120. Atomic Force Acoustic Microscopy Methods to Determine Thin-Film Elastic Properties
Topic: Nanomaterials
Published: 8/1/2003
Authors: Donna C Hurley, K Shen, N Jennett, J Turner
Abstract: We discuss atomic force acoustic microscopy (AFAM) methods to determine quantitative values for the elasticproperties of thin films. The AFAM approach measures the frequencies of an AFM cantilever's first two flexural resonances while in contact wit ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851331