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You searched on: Topic Area: Ceramics Sorted by: title

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Displaying records 961 to 970 of 1000 records.
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961. The Influence of NH^d3^ Anneal on the Crystallization Kinetics of HfO^d2^ Gate Dielectric Films
Topic: Ceramics
Published: 11/17/2006
Authors: Patrick S Lysaght, Joseph C Woicik, Brendan Foran, Joel Barnett, Gennadi Bersuker, B H Lee
Abstract: HfO2 gate dielectric thin films have been exposed to anneal processing in NH3 and N2 ambient in order to decouple the influence of N incorporation from that of the thermal cycle alone. We report on the effectiveness of NH3 processing to introduce N i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851136

962. The Influence of Surface Roughness on the Deforming Friction Behavior of Al-Mg Alloys
Topic: Ceramics
Published: 2/1/2002
Author: Mark R Stoudt
Abstract: The inhomogeneous morphology of the surface asperities generated during metal forming causes strain localization resulting in tearing during metal forming, and increasing friction between mating die surfaces. Much of the data in the literature do no ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=853142

963. The Local Structural Characterization of the Inactive Clusters in B, BF2 and BF3 Implanted Si Wafers Using X-ray Techniques
Topic: Ceramics
Published: 7/1/2005
Authors: M A. Sahiner, D F Downey, S W Novak, Joseph C Woicik, D A Arena
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854278

964. The Local Structural Characterization of the Inactive Clusters in B, BF^d2^ and BF^d3^ Implanted Si Wafers Using X-Ray Techniques
Topic: Ceramics
Published: Date unknown
Authors: M A. Sahiner, D F Downey, S W Novak, Joseph C Woicik, D A Arena
Abstract: Characterization of the inactive clusters formed by high dose implantation silicon is one of the crucial topics in the semiconductor industry. Analytical techniques, which could provide quantitative information on the detailed description of the com ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850873

965. The Local Structure of Antimony in High Dose Antimony Implants in Silicon by XAFS and SIMS
Topic: Ceramics
Published: 1/1/2003
Authors: M A. Sahiner, S W Novak, Joseph C Woicik, Y. Takamura, P B Griffin, J D Plummer
Abstract: One of the important challenges in semiconductor industry is to sustain high concentration of dopant atoms electronically active in very small areas. In investigating the optimum post implantation treatment methods that will help to attain these con ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850640

966. The NIST WWW High Temperature Superconducting Materials Database (WebHTS Version 2.0)
Topic: Ceramics
Published: 7/1/1999
Authors: E F. Begley, R G Munro
Abstract: The NIST WWW High Temperature Superconducting Materials Database (WebHTS version 2.0) provides evaulated thermal, mechanical, and superconducting property data for oxide superconductors. The range of materials covers the major series of compoundsder ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850308

967. The Nanostructure Problem
Topic: Ceramics
Published: Date unknown
Authors: Simon J Billinge, Igor Levin
Abstract: The powerful methods we have for solving the atomic structure of bulk crystals fail for nanostructured materials and there are currently no broadly applicable, quantitative and robust methods to replace them. The solution of this nanostructure pr ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851016

968. The Nature and Origin of Tribochemistry
Topic: Ceramics
Published: 8/1/2002
Authors: Stephen M. Hsu, J Zhang, Z Yin
Abstract: The origin of tribochemistry is from the rubbing of surfaces together. The precise nature of the chemical reactions and the driving force behind the reactions are not known except for a few simple chemical systems. In boundary lubrication, it is di ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850559

969. The Nucleation of Atomic Layer Deposited HfO2 Films, and Evolution of Their Microstruture, Studied by Grazing Incidence Small Angle X-ray Scattering Using Synchrotron Radiation
Topic: Ceramics
Published: 1/16/2006
Authors: Martin L Green, Andrew John Allen, Xiang Li, Junling Wang, J Ilavsky, A Delabie, R Puurunen, B Brijs
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854304

970. The Orientation of Semifluorinated Alkanes Attached to Polymers at the Surface of Polymer Films
Topic: Ceramics
Published: 3/1/2000
Authors: Jan Genzer, E Sivaniah, E K Kramer, J G Wang, H Kerner, M Xiang, K Char, Christopher K. Ober, B M DeKoven, Robert A Bubeck, M K Chaudhury, S Sambasivan, Daniel A Fischer
Abstract: The surface molecular orientation of a liquid crystalline (LC) layer made up a semi-fluorinated (SF) single side-groups [-CO-(CH^d2^)^dx-1^-(CF^d2^)^dy^F] (single SF groups) attached to polyisoprene homopolymer or the isoprene block of a styrene-isop ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850328



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