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Topic Area: Ceramics
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31. Accommodation of Excess Ti in a (Ba,Sr)TiO^d3^ Thin Film with 53.4% Ti Grown on Pt/SiO^d2^/Si by Metalorganic Chemical-Vapor Deposition
Topic: Ceramics
Published: 8/1/1999
Authors: Igor Levin, Richard D Leapman, Debra L Kaiser, P C van Buskirk, R Bilodeau, R Carl
Abstract: The microstructure and chemistry of a Ti-rich (Ba,Sr)TiO^d3^ film with 53.4 % Ti deposited on Pt/SiO^d2^/Si substrate by MOCVD was studied using high-resolution transmission electron microscopy and elemental mapping in electron energy loss spectrosco ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850273

32. Accommodation of Transformation Strains in Transverse Multiferroic Nanostructures CoFe2O4-PbTiO3
Topic: Ceramics
Published: 8/6/2007
Authors: Julia Slutsker, Jianhua Li, Zhuopeng Tan, Alexander Lazar Roytburd
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854376

33. Accommodation of Transformation Strains in Transverse Multiferroic Nanostructures CoFe^d2^O^d4-^PbTiO^d3^
Topic: Ceramics
Published: 8/16/2007
Authors: Igor Levin, Julia Slutsker, J Li, Z Tan, Alexander Lazar Roytburd
Abstract: Variable-temperature X-ray diffraction was used to investigate the internal strains that arise from a ferroelectric phase transition in self-assembled multiferroic nanostructures CoFe2O4-PbTiO3 on (001) SrTiO3. The constraints from CoFe2O4 suppresse ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851051

34. Accounting for Auger Yield Energy Loss for Improved Determination of Molecular Orientation Using Soft X-Ray Absorption Spectroscopy
Topic: Ceramics
Published: 12/1/2002
Authors: Jan Genzer, E K Kramer, Daniel A Fischer
Abstract: Partial (Auger) yield near edge X-ray absorption fine structure (NEXAFS) is a structural analytical technique that has been primarily used to measure thespatial orientation and chemical bonding of small molecules on solid (i.e., inorganic or semicond ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850588

35. Accuracy and Reproducibility of X-Ray Texture Measurements on Thin Films
Topic: Ceramics
Published: 5/1/2002
Authors: Mark D Vaudin, G R Fox, G - Kowach
Abstract: Rocking curve texture measurements were made on thin films of zinc oxide (ZnO) and platinum (Pt) using a powder x-ray diffractometer, and also, in the case of ZnO, an area detector. The intensity corrections for defocussing and other geometric factor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=851129

36. Accuracy in Powder Diffraction III--Part 1 Preface
Series: Journal of Research (NIST JRES)
Topic: Ceramics
Published: 1/1/2004
Authors: James P Cline, B H. Toby, Jeffrey E Post, P Scardi
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850814

37. Accurate Texture Measurements on Thin Films Using a Powder X-Ray Diffractometer
Topic: Ceramics
Published: 6/1/1999
Author: Mark D Vaudin
Abstract: A fast and accurate method that uses a conventional powder x-ray diffractometer has been developed for measuring crystalline texture. A {Theta} - 2{Theta}scan of a Bragg peak from the textured planes is collected and also a {Theta} scan, or rocking c ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850296

38. Activity-composition relations in the system CaCO3-MgCO3 predicted from static structure energy calculations and Monte Carlo simulations
Topic: Ceramics
Published: 2/15/2007
Authors: V L Vinograd, Benjamin P Burton, John D. Gale, N L Allan, B Winkler
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854305

39. Addition of Alternate Phase Nanoparticle Dispersions to Enhance Flux Pinning of Y-Ba-Cu-O Thin Films
Topic: Ceramics
Published: 6/1/2005
Authors: T J Haugan, Paul N. Barnes, T A Campbell, John Evans, J W Kell, L B Brunke, J P Murphy, MAARTENSE I Varanasi, Winnie K Wong-Ng, Lawrence P. Cook
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=854250

40. Adhesion and Friction Studies of Silicon and Hydrophobic and Low Friction Films and Investigation of Scale Effects
Topic: Ceramics
Published: 7/1/2004
Authors: Bharat Bhushan, H Liu, Stephen M. Hsu
Abstract: Tribological properties are crucial to the reliability of microelectromechanical systems/nanoelectromechanical systems (MEMS/NEMS). In this study, adhesion and friction measurements are made at micro- and nanoscales on single-crystal silicon (common ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=850748



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