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Topic Area: Ceramics

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Displaying records 931 to 940 of 1000 records.
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931. Boundary Lubricated Friction Experiments With Coarse Surface Texture
Topic: Ceramics
Published: Date unknown
Authors: Jorn Larsen-Basse, L K Ives, Stephen M. Hsu
Abstract: Low-speed friction experiments were conducted under boundary lubrication in a pin-on-disk tester. The 304 stainless steel disk had smooth areas alternating with areas of coarse surface texture consisting of indents or macroscopic grooves, 0.3-0.4 mm ...

932. CD ROM Guide for NIST Crystal Data NIST Standard Reference Database 3
Series: NIST Interagency/Internal Report (NISTIR)
Report Number: 6767
Topic: Ceramics
Published: Date unknown
Authors: Vicky Lynn Karen, S L Young, Alan D. Mighell
Abstract: The NIST Crystallographic Data Center collects, evaluates and disseminates data on solid-state materials. NIST Crystal Data is a comprehensive database with chemical, physical and crystallographic information on all classes of well-characterized sub ...

933. Can Plastic Zones Be Deducted From Surface Profile Measurements at Crack Tips of Glass Specimens?
Topic: Ceramics
Published: Date unknown
Authors: Theo Fett, G Rizzi, D Creek, S Wagner, Sheldon Martin Wiederhorn
Abstract: In recently published investigations the question was discussed whether a nonelastic material behaviour at glass tips can be deduced from displacement measurements at the side surfaces of fracture mechanics test specimens. Such measurements carried ...

934. Ceramics Division FY 2003 Programs and Accomplishments
Series: NIST Interagency/Internal Report (NISTIR)
Topic: Ceramics
Published: Date unknown
Author: M B Kaufman
Abstract: A description of the technical activities and highlights of the Ceramics Division organized by projects within the MSEL programs.

935. Characterization of Diamond Powders by Electron Paramagnetic Resonance, X-Ray Photoelectron Spectroscopy and Electron Energy Loss Spectro
Topic: Ceramics
Published: Date unknown
Authors: P S Wang, Stephen M. Hsu, T N Witberg
Abstract: Paramagnetic defects in diamond powders were examined by x-band electron paramagnetic resonance (EPR) for dangling bonds and unpaired electrons at 9.62 GHz. Strong spin centers were detected in all powders near g{nearly equal to} 2.0026 region. In ...

936. Characterization of New 5M and 7M Polytypes of Niobia-Doped Ca^d2^Ta^d2^O^d7^
Topic: Ceramics
Published: Date unknown
Authors: I E Grey, Robert S. Roth, W G Mumme, J Planes, Leonid A Bendersky, C Li, J Chenavas
Abstract: Two new calcium tantalate polytypes have been prepared in the system Ca2Ta2O7-Ca2Nb2O7. Their structures have been determined and refined using single crystal X-ray diffraction data and powder neutron diffraction data, and their dielectric propertie ...

937. Characterization of Solid Oxide Fuel Cell Layers by Computed X-Ray Microtomography and Small-Angle Scattering
Topic: Ceramics
Published: Date unknown
Authors: Andrew John Allen, T A Dobbins, J Ilavsky, F Zhao, A Virkar, J Almer, F DeCarlo

938. Characterization of Spatial Heterogenieties in Detector Grade CdZnTe
Topic: Ceramics
Published: Date unknown
Authors: Martine Duff, Douglas Hunter, Arnold Burger, Michael Groza, V Buliga, J Bradley, G Graham, Z Dai, N Teslich, David R Black, H E. Burdette, A Lanzirotti
Abstract: Synthetic Cd1-xZnxTe or CZT crystals are highly suitable for the room temperature-based spectroscopy of gamma radiation. Structural/morphological heterogeneities within CZT, such as secondary phases that are thought to consist of Te metal, can hav ...

939. Characterization of the Mirror Region With Atomic Force Microscopy
Topic: Ceramics
Published: Date unknown
Authors: Sheldon Martin Wiederhorn, Jose Lopez-Cepero, Jay S Wallace, Jean-Pierre Guin, Theo Fett
Abstract: In this paper we use atomic force microscopy to investigate the roughness of the mirror region in silica glass. We demonstrate a decrease in surface RMS Roughness from about 0.5 nm to about 0.4 nm with increasing stress intensity factor (0.5KIc to ab ...

940. Chemical Analysis of HfO^d2^/ Si (100) Film Systems Exposed to NH^d3^ Thermal Processing
Topic: Ceramics
Published: Date unknown
Authors: Patrick S Lysaght, Joseph C Woicik, Daniel A Fischer, Gennadi Bersuker, Joel Barnett, Brendan Foran, Hsing-Huang Tseng, Raj Jammy
Abstract: Nitrogen incorporation in HfO2/SiO2 films utilized as high-k gate dielectric layers in advanced metal-oxide field-effect transistors (MOSFETs) has been investigated. Thin HfO2 blanket films deposited by atomic layer deposition on either SiO2 or NH3 t ...

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