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Displaying records 61 to 65.
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61. Surface Wrinkling: a Versatile Platform for Measuring Thin Film Properties
Topic: Advanced Materials
Published: 9/2/2010
Authors: Jun Y. Chung, Adam J. Nolte, Christopher M Stafford
Abstract: Surface instabilities in soft matter have captivated the scientific community for decades. Recently, surface wrinkling has received a great deal of attention due to its simplicity and well-established mechanics of formation. Particularly, the use o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=902425

62. Synthesis of Polymer-derived Ceramic Si(B)CN-Carbon Nanotube Composite by Microwave Induced Interfacial Polarization
Topic: Advanced Materials
Published: 10/12/2011
Authors: Romil Bhandavat, William Kuhn, Elisabeth Mansfield, John H Lehman, Gurpreet Singh
Abstract: We demonstrate synthesis of a polymer-derived ceramic (PDC)-multiwall carbon nanotube (MWCNT) composite using microwave irradiation at 2.45 GHz. The process takes about 10 minutes of microwave irradiation for the polymer to ceramic conversion. The su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909564

63. Test Results of the First US ITER TF Conductor in SULTAN
Topic: Advanced Materials
Published: 6/22/2009
Authors: Nicolai N. Martovetsky, Daniel R. Hatfield, John R. Miller, Chen-yu Gung, Joel S. Schultz, Najib Cheggour, Loren Frederick Goodrich, Pierluigi Bruzzone, Boris Stepanov, Rainer Wesche, Bernd Seeber
Abstract: The US Domestic Agency is one of six parties supplying TF cable-in-conduit conductors (CICCs) for ITER. Previous tests have shown that measured performance of the TF CICCs can be much lower than expected from the strand properties at the projected un ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900251

64. Ultra-Small Angle X-ray Scattering Instrument at the Advanced Photon Source, History, Recent Development, and Current Status
Topic: Advanced Materials
Published: 1/1/2013
Authors: Andrew John Allen, Fan Zhang, Lyle E Levine, Gabrielle Gibbs Long, Jan Ilavsky, Pete R. Jemian
Abstract: The history and development over more than 25 years is presented and discussed of an ultra-small-angle X-ray scattering (USAXS) instrument dedicated to serving a broad range of materials research needs. This history is traced from the instrument‰s o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911113

65. Weibull Regression Analysis of Filtered Surface Roughness Data and Strain Prediction in a Metallic Alloy
Topic: Advanced Materials
Published: 7/1/2011
Authors: Joseph Bunton Hubbard, Mark R Stoudt, Antonio M Possolo
Abstract: We fit a two-parameter Weibull regression (WR) model by maximum likelihood estimation (MLE) to filtered surface roughness data. These data were acquired by scanning confocal laser microscopy performed on aluminum alloy AA5754-O surfaces that were su ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=901996



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