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Topic Area: Advanced Materials
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Displaying records 31 to 40 of 79 records.
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31. Giant piezoelectricity in PMN-PT thin films: Beyond PZT
Topic: Advanced Materials
Published: 11/1/2012
Authors: S. H. Baek, M. S. Rzchowski, Vladimir A Aksyuk
Abstract: Micro-electromechanical systems (MEMS) incorporating piezoelectric layers provide active transduction between electrical and mechanical energy, which enables highly sensitive sensors and low-voltage driven actuators surpassing the passive operation o ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=912113

32. Gradient Nanofiber Scaffold Libraries for Screening Cell Response to Poly(e-caprolactone)-Calcium Phosphate Composites
Topic: Advanced Materials
Published: 3/1/2013
Authors: Carl George Simon Jr, Limin Sun, Laurence Chung Lung Chow, William Miles, Christopher K. Tison, Kaushik Chatterjee, Marian F Young, Vinoy Thomas, Murugan Ramalingam
Abstract: A 2-spinnerette approach has been developed for fabricating nanofiber scaffold gradients for use as 1) scaffold libraries for screening the effect of nanofiber properties on cell response and 2) templates for generating graded tissue interfaces. Alt ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906818

33. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Topic: Advanced Materials
Published: 6/1/2012
Authors: Mariano A. Real, Tian T. Shen, George R Jones, Randolph E Elmquist, Johannes A Soons, Albert Davydov
Abstract: Epitaxial growth of graphene layers on 6H-SiC(0001) substrates have been studied in order to improve graphene‰s performance for metrological applications. A face-to-face (FTF) sublimation method at 2000 °C and in Ar background atmosphere is used to i ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=910566

34. Graphene Epitaxial Growth on SiC(0001) for Resistance Standards
Topic: Advanced Materials
Published: 6/3/2013
Authors: Mariano A. Real, Eric Lass, Fan-Hung H. Liu, Tian T. Shen, George R Jones, Johannes A Soons, David B Newell, Albert Davydov, Randolph E Elmquist
Abstract: A well-controlled technique for high-temperature epitaxial growth on 6H-SiC(0001) substrates is shown to allow development of monolayer graphene that exhibits promise for precise metrological applications. Face-to-face (FTF) and face-to-graphite (FTG ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911731

35. Harnessing Wrinkle Delamination Mechanics to Measure and Pattern Polymer Coatings
Topic: Advanced Materials
Published: 3/21/2010
Authors: Adam J. Nolte, Jun Y. Chung, Christopher M Stafford
Abstract: Compressive stresses in stiff polymer coatings can give rise to surface instabilities in which the coating adopts a sinusoidally wrinkled morphology with a dominant wavelength, d, as displayed in Figure 1a. Such instabilities are generally observed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=904141

36. INVESTIGATING THE MECHANISM OF ENZYME-CATALYZED RING-OPENING COPOLYMERIZATIONS
Topic: Advanced Materials
Published: 8/19/2012
Authors: Matthew T. (Matthew) Hunley, Fahriye Nese Sari, Kathryn L Beers
Abstract: As the research interest in degradable polymers has risen, an ever increasing number of manuscripts report the synthesis of copolymers through ring-opening copolymerization techniques. However, the mechanism of copolymerization remains unexplored. ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=911008

37. Impact of molecular mass on the elastic modulus of polystyrene thin films
Topic: Advanced Materials
Published: 7/31/2010
Authors: Jessica M. Torres, Christopher M Stafford, Bryan D. Vogt
Abstract: Euler wrinkling was used to determine the elastic modulus at ambient temperature of polystyrene (PS) films of varying thickness and relative molecular mass (Mn). A range of Mn from 1.2 kg/mol to 990 kg/mol was examined to determine if the molecular ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=903960

38. Inter-Laboratory Comparisons of NbTi Critical Current Measurements
Topic: Advanced Materials
Published: 6/22/2009
Authors: Arno Godeke, D. Turrioni, T. Boutboul, Najib Cheggour, A. K. Ghosh, Loren Frederick Goodrich, M Meinesz, A. den Ouden
Abstract: We report on a multi-institute comparison of critical current data, measured on a modern Large Hadron Collider (LHC) NbTi wire that has shown a standard deviation below 1% in critical current density spread in more than 1500 measurements. Inter-labor ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900166

39. Internal tin Nb3Sn conductors engineered for fusion and particle accelerator applications
Topic: Advanced Materials
Published: 6/22/2009
Authors: Jeffrey Parrell, Y. Zhang, Michael Field, M Meinesz, Yonghua Huang, H Miao, Seungok Hong, Najib Cheggour, Loren Frederick Goodrich
Abstract: The critical current density (Jc) of Nb3Sn strand has been significantly improved over the last several years. For most magnet applications, high Jc internal tin has displaced bronze process strand. The highest Jc values are obtained from distributed ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=900165

40. Low Force AFM Nanomechanics with Higher-Eigenmode Contact Resonance Spectroscopy
Topic: Advanced Materials
Published: 1/11/2012
Authors: Jason Philip Killgore, Donna C. Hurley
Abstract: Atomic force microscopy (AFM) methods for quantitative measurements of elastic modulus on stiff (>10 GPa) materials typically require tip-sample contact forces in the hundreds of nanonewton to few micronewton range. Such large forces can incur sa ...
http://www.nist.gov/manuscript-publication-search.cfm?pub_id=909735



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